Gerd Duscher - Publications

Affiliations: 
North Carolina State University, Raleigh, NC 
Area:
Materials Science Engineering, Condensed Matter Physics

146 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2021 Wang K, Zhang L, Nguyen GD, Sang X, Liu C, Yu Y, Ko W, Unocic RR, Puretzky AA, Rouleau CM, Geohegan DB, Fu L, Duscher G, Li AP, Yoon M, et al. Selective Antisite Defect Formation in WS Monolayers via Reactive Growth on Dilute W-Au Alloy Substrates. Advanced Materials (Deerfield Beach, Fla.). e2106674. PMID 34738669 DOI: 10.1002/adma.202106674  0.3
2020 Gu Y, Cai H, Dong J, Yu Y, Hoffman AN, Liu C, Oyedele AD, Lin YC, Ge Z, Puretzky AA, Duscher G, Chisholm MF, Rack PD, Rouleau CM, Gai Z, et al. Two-Dimensional Palladium Diselenide with Strong In-Plane Optical Anisotropy and High Mobility Grown by Chemical Vapor Deposition. Advanced Materials (Deerfield Beach, Fla.). e1906238. PMID 32173918 DOI: 10.1002/Adma.201906238  0.374
2020 Lin YC, Liu C, Yu Y, Zarkadoula E, Yoon M, Puretzky AA, Liang L, Kong X, Gu Y, Strasser A, Meyer HM, Lorenz M, Chisholm MF, Ivanov IN, Rouleau CM, ... Duscher G, et al. Low Energy Implantation into Transition Metal Dichalcogenide Monolayers to Form Janus Structures. Acs Nano. PMID 32150384 DOI: 10.1021/Acsnano.9B10196  0.401
2020 Lin Y, Liu C, Yu Y, Zarkadoula E, Yoon M, Puretzky AA, Liang L, Kong X, Gu Y, Strasser A, Meyer HM, Lorenz M, Chisholm MF, Ivanov IN, Rouleau CM, ... Duscher G, et al. LowEnergy Implantation into Transition-Metal DichalcogenideMonolayers to Form Janus Structures Acs Nano. DOI: 10.1021/Acsnano.9B10196.S004  0.402
2019 Liu P, Tian H, Windl W, Gu G, Duscher G, Wu Y, Zhao M, Guo J, Xu B, Liu L. Direct imaging of the nitrogen-rich edge in monolayer hexagonal boron nitride and its band structure tuning. Nanoscale. PMID 31642456 DOI: 10.1039/C9Nr07147D  0.378
2019 Lee U, Zheleva T, Lelis A, Duscher G, Liu F, Das M, Scofield J. Analytical and Structural Investigations of the Metal-Enhanced Oxidation of Sic-MOS Structures Ecs Transactions. 13: 99-109. DOI: 10.1149/1.2913085  0.588
2019 Liu C, Wu Y, Hu Z, Busche JA, Beutler EK, Montoni NP, Moore TM, Magel GA, Camden JP, Masiello DJ, Duscher G, Rack PD. Continuous Wave Resonant Photon Stimulated Electron Energy-Gain and Electron Energy-Loss Spectroscopy of Individual Plasmonic Nanoparticles Acs Photonics. 6: 2499-2508. DOI: 10.1021/Acsphotonics.9B00830  0.32
2018 Tian M, Dyck O, Ge J, Duscher G. Measuring the areal density of nanomaterials by electron energy-loss spectroscopy. Ultramicroscopy. 196: 154-160. PMID 30391804 DOI: 10.1016/J.Ultramic.2018.10.009  0.336
2018 Somnath S, Smith CR, Kalinin SV, Chi M, Borisevich A, Cross N, Duscher G, Jesse S. Feature extraction via similarity search: application to atom finding and denoising in electron and scanning probe microscopy imaging. Advanced Structural and Chemical Imaging. 4: 3. PMID 29568723 DOI: 10.1186/S40679-018-0052-Y  0.331
2018 Agarwal S, Duscher G, Zhao Y, Crespillo M, Katoh Y, Weber W. Multiscale characterization of irradiation behaviour of ion-irradiated SiC/SiC composites Acta Materialia. 161: 207-220. DOI: 10.1016/J.Actamat.2018.09.012  0.362
2017 Mohammadi F, Schmitzer H, Kunert G, Hommel D, Ge J, Duscher G, Langbein W, Wagner HP. Emission dynamics of hybrid plasmonic gold/organic GaN nanorods. Nanotechnology. PMID 29064371 DOI: 10.1088/1361-6528/Aa95A3  0.343
2017 Mahjouri-Samani M, Tian M, Puretzky AA, Chi M, Wang K, Duscher G, Rouleau CM, Eres G, Yoon M, Lasseter JC, Xiao K, Geohegan DB. Non-Equilibrium Synthesis of TiO2 Nanoparticle "Building Blocks" for Crystal Growth by Sequential Attachment in Pulsed Laser Deposition. Nano Letters. PMID 28692299 DOI: 10.1021/Acs.Nanolett.7B01047  0.308
2017 Tian M, Mahjouri-Samani M, Wang K, Puretzky AA, Geohegan DB, Tennyson WD, Cross N, Rouleau CM, Zawodzinski TA, Duscher G, Eres G. Black anatase formation by annealing of amorphous nanoparticles and the role of the Ti2O3 shell in self-organized crystallization by particle attachment. Acs Applied Materials & Interfaces. PMID 28586205 DOI: 10.1021/Acsami.7B02764  0.327
2017 Wang K, Cross N, Boulesbaa A, Pudasaini PR, Tian M, Mahjouri-Samani M, Oxley MP, Rouleau CM, Puretzky AA, Rack PD, Xiao K, Yoon M, Eres G, Duscher G, Geohegan DB. Correlating the optical properties of WS2 monolayers grown by CVD with isoelectronic Mo doping level (Conference Presentation) Proceedings of Spie. 10093: 1009305. DOI: 10.1117/12.2256543  0.392
2017 Mahjouri-Samani M, Rouleau CM, Puretzky AA, Eres G, Xiao K, Duscher G, Yoon M, Geohegan DB. New approaches for synthesis and processing of 2D materials (Conference Presentation) Proceedings of Spie. 10093: 1009303. DOI: 10.1117/12.2253430  0.365
2017 Oxley MP, Cross NG, Duscher G, Allen LJ, Chisholm MF. Quantification of Low Voltage Images of 2-dimensional Materials in Aberration Corrected Scanning Transmission Electron Microscopy. Microscopy and Microanalysis. 23: 464-465. DOI: 10.1017/S1431927617003002  0.316
2017 Liu P, Deng B, Liang Z, Duscher G, Guo J. High efficiency core-loss EELS analyzing from the viewpoint of chemometrics Materials Characterization. 129: 313-318. DOI: 10.1016/J.Matchar.2017.05.020  0.394
2017 Mohsin A, Cross NG, Liu L, Liu P, Duscher G, Gu G. Experimentally determined edge orientation of triangular crystals of hexagonal boron nitride Physica Status Solidi (B). 254: 1700069. DOI: 10.1002/Pssb.201700069  0.31
2017 Stanford MG, Pudasaini PR, Gallmeier ET, Cross N, Liang L, Oyedele A, Duscher G, Mahjouri‐Samani M, Wang K, Xiao K, Geohegan DB, Belianinov A, Sumpter BG, Rack PD. High Conduction Hopping Behavior Induced in Transition Metal Dichalcogenides by Percolating Defect Networks: Toward Atomically Thin Circuits Advanced Functional Materials. 27: 1702829. DOI: 10.1002/Adfm.201702829  0.394
2016 Yang B, Dyck O, Ming W, Du MH, Das S, Rouleau CM, Duscher G, Geohegan DB, Xiao K. Observation of Nanoscale Morphological and Structural Degradation in Perovskite Solar Cells by in Situ TEM. Acs Applied Materials & Interfaces. 8: 32333-32340. PMID 27933837 DOI: 10.1021/Acsami.6B11341  0.327
2016 Kaveh M, Gao Q, Jagadish C, Ge J, Duscher G, Wagner HP. Controlling the exciton emission of gold coated GaAs-AlGaAs core-shell nanowires with an organic spacer layer. Nanotechnology. 27: 485204. PMID 27811405 DOI: 10.1088/0957-4484/27/48/485204  0.34
2016 Mahjouri-Samani M, Liang L, Oyedele AD, Kim YS, Tian M, Cross N, Wang K, Lin MW, Boulesbaa A, Rouleau CM, Puretzky AA, Xiao K, Yoon M, Eres G, Duscher G, et al. Tailoring Vacancies Far Beyond Intrinsic Levels Changes the Carrier Type in Monolayer MoSe2-x Crystals. Nano Letters. PMID 27416103 DOI: 10.1021/Acs.Nanolett.6B02263  0.36
2016 Wang K, Huang B, Tian M, Ceballos F, Lin MW, Mahjouri-Samani M, Boulesbaa A, Puretzky AA, Rouleau CM, Yoon M, Zhao H, Xiao K, Duscher G, Geohegan DB. Interlayer Coupling in Twisted WSe2/WS2 Bilayer Heterostructures Revealed by Optical Spectroscopy. Acs Nano. PMID 27309275 DOI: 10.1021/Acsnano.6B01486  0.348
2016 Stanford MG, Pudasaini PR, Belianinov A, Cross N, Noh JH, Koehler MR, Mandrus DG, Duscher G, Rondinone AJ, Ivanov IN, Ward TZ, Rack PD. Focused helium-ion beam irradiation effects on electrical transport properties of few-layer WSe2: enabling nanoscale direct write homo-junctions. Scientific Reports. 6: 27276. PMID 27263472 DOI: 10.1038/Srep27276  0.345
2016 Chen C, Zhang Y, Wang Y, Crespillo M, Fontana C, Graham J, Duscher G, Shannon S, Weber W. Dose dependence of helium bubble formation in nano-engineered SiC at 700 °C Journal of Nuclear Materials. 472: 153-160. DOI: 10.1016/J.Jnucmat.2016.01.029  0.323
2016 Li X, Puretzky AA, Sang X, KC S, Tian M, Ceballos F, Mahjouri-Samani M, Wang K, Unocic RR, Zhao H, Duscher G, Cooper VR, Rouleau CM, Geohegan DB, Xiao K. Suppression of Defects and Deep Levels Using Isoelectronic Tungsten Substitution in Monolayer MoSe2 Advanced Functional Materials. 27: 1603850. DOI: 10.1002/Adfm.201603850  0.374
2015 Malasi A, Taz H, Farah A, Patel M, Lawrie B, Pooser R, Baddorf A, Duscher G, Kalyanaraman R. Novel Iron-based ternary amorphous oxide semiconductor with very high transparency, electronic conductivity, and mobility. Scientific Reports. 5: 18157. PMID 26670421 DOI: 10.1038/Srep18157  0.343
2015 Yang B, Dyck O, Poplawsky J, Keum J, Das S, Puretzky A, Aytug T, Joshi PC, Rouleau CM, Duscher G, Geohegan DB, Xiao K. Controllable Growth of Perovskite Films by Room-Temperature Air Exposure for Efficient Planar Heterojunction Photovoltaic Cells. Angewandte Chemie (International Ed. in English). PMID 26486584 DOI: 10.1002/Anie.201505882  0.332
2015 Tian M, Mahjouri-Samani M, Eres G, Sachan R, Yoon M, Chisholm MF, Wang K, Puretzky AA, Rouleau CM, Geohegan DB, Duscher G. Structure and Formation Mechanism of Black TiO2 Nanoparticles. Acs Nano. PMID 26393371 DOI: 10.1021/Acsnano.5B04712  0.364
2015 Das S, Keum JK, Browning JF, Gu G, Yang B, Dyck O, Do C, Chen W, Chen J, Ivanov IN, Hong K, Rondinone AJ, Joshi PC, Geohegan DB, Duscher G, et al. Correlating high power conversion efficiency of PTB7:PC71BM inverted organic solar cells with nanoscale structures. Nanoscale. PMID 26220775 DOI: 10.1039/C5Nr03332B  0.33
2015 Yang B, Dyck O, Poplawsky J, Keum J, Puretzky A, Das S, Ivanov I, Rouleau C, Duscher G, Geohegan D, Xiao K. Perovskite Solar Cells with Near 100% Internal Quantum Efficiency Based on Large Single Crystalline Grains and Vertical Bulk Heterojunctions. Journal of the American Chemical Society. 137: 9210-3. PMID 26156790 DOI: 10.1021/Jacs.5B03144  0.33
2015 Dyck O, Hu S, Das S, Keum J, Xiao K, Khomami B, Duscher G. Quantitative phase fraction detection in organic photovoltaic materials through EELS imaging Polymers. 7: 2446-2460. DOI: 10.3390/Polym7111523  0.315
2015 Li G, Cherqui C, Bigelow NW, Duscher G, Straney PJ, Millstone JE, Masiello DJ, Camden JP. Nanoscopic imaging of energy transfer from single plasmonic particles to semiconductor substrates via STEM/EELS Microscopy and Microanalysis. 21: 1909-1910. DOI: 10.1017/S1431927615010326  0.311
2015 Cross N, Liu L, Mohsin A, Gu G, Duscher G. Peculiar Plasmon Peak Position in Electron Energy Loss Spectrum of Hexagonal Boron Nitride/Graphene Double Layer Microscopy and Microanalysis. 21: 985-986. DOI: 10.1017/S1431927615005723  0.301
2015 Li G, Abbott JKC, Brasfield JD, Liu P, Dale A, Duscher G, Rack PD, Feigerle CS. Structure characterization and strain relief analysis in CVD growth of boron phosphide on silicon carbide Applied Surface Science. 327: 7-12. DOI: 10.1016/J.Apsusc.2014.11.037  0.348
2015 Malasi A, Ge J, Carr C, Garcia H, Duscher G, Kalyanaraman R. Two-Dimensionally Ordered Plasmonic and Magnetic Nanostructures on Transferable Electron-Transparent Substrates Particle & Particle Systems Characterization. 32: 970-978. DOI: 10.1002/Ppsc.201500048  0.312
2014 Liu L, Siegel DA, Chen W, Liu P, Guo J, Duscher G, Zhao C, Wang H, Wang W, Bai X, McCarty KF, Zhang Z, Gu G. Unusual role of epilayer-substrate interactions in determining orientational relations in van der Waals epitaxy. Proceedings of the National Academy of Sciences of the United States of America. 111: 16670-5. PMID 25385622 DOI: 10.1073/Pnas.1405613111  0.305
2014 Mahjouri-Samani M, Tian M, Wang K, Boulesbaa A, Rouleau CM, Puretzky AA, McGuire MA, Srijanto BR, Xiao K, Eres G, Duscher G, Geohegan DB. Digital transfer growth of patterned 2D metal chalcogenides by confined nanoparticle evaporation. Acs Nano. 8: 11567-75. PMID 25343499 DOI: 10.1021/Nn5048124  0.325
2014 Wang C, Duscher G, Paddison SJ. Electron energy loss spectroscopy of polytetrafluoroethylene: experiment and first principles calculations. Microscopy (Oxford, England). 63: 73-83. PMID 24296695 DOI: 10.1093/Jmicro/Dft046  0.313
2014 Rouleau CM, Tian M, Puretzky AA, Mahjouri-Samani M, Duscher G, Geohegan DB. Catalytic nanoparticles for carbon nanotube growth synthesized by through thin film femtosecond laser ablation Proceedings of Spie - the International Society For Optical Engineering. 8969. DOI: 10.1117/12.2045951  0.312
2014 Liu P, Li G, Duscher G, Sharma YK, Ahyi AC, Isaacs-Smith T, Williams JR, Dhar S. Roughness of the SiC/SiO2 vicinal interface and atomic structure of the transition layers Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 32. DOI: 10.1116/1.4897377  0.444
2014 Gonzalez CM, Timilsina R, Li G, Duscher G, Rack PD, Slingenbergh W, Van Dorp WF, De Hosson JTM, Klein KL, Wu HM, Stern LA. Focused helium and neon ion beam induced etching for advanced extreme ultraviolet lithography mask repair Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 32. DOI: 10.1116/1.4868027  0.355
2014 Hu S, Dyck O, Chen H, Hsiao YC, Hu B, Duscher G, Dadmun M, Khomami B. The impact of selective solvents on the evolution of structure and function in solvent annealed organic photovoltaics Rsc Advances. 4: 27931-27938. DOI: 10.1039/C4Ra02257B  0.353
2014 Gu Y, Wang C, Liu F, Chen J, Dyck OE, Duscher G, Russell TP. Guided crystallization of P3HT in ternary blend solar cell based on P3HT:PCPDTBT:PCBM Energy and Environmental Science. 7: 3782-3790. DOI: 10.1039/C4Ee02004A  0.329
2014 Liu P, Guo J, Liu L, Windl W, Gu G, Duscher G. Direct Observation of Defects in Hexagonal Boron Nitride Monolayers Microscopy and Microanalysis. 20: 1738-1739. DOI: 10.1017/S1431927614010423  0.335
2014 Dyck O, Hu S, Khomami B, Duscher G. Electron energy-loss spectroscopic imaging for phase detection in organic photovoltaics Microscopy and Microanalysis. 20: 538-539. DOI: 10.1017/S1431927614004413  0.329
2014 Liu F, Yang G, Duscher G. Chemical composition study of high-k La-silicate gate stacks at sub-nanometer scale Physica Status Solidi (a). 211: 2537-2540. DOI: 10.1002/Pssa.201431143  0.701
2014 Sachan R, Malasi A, Yadavali S, Griffey B, Dunlap J, Duscher G, Kalyanaraman R. Laser-Induced Self-Assembled Nanostructures on Electron-Transparent Substrates Particle & Particle Systems Characterization. 32: 476-482. DOI: 10.1002/Ppsc.201400183  0.351
2014 Mahjouri-Samani M, Gresback R, Tian M, Wang K, Puretzky AA, Rouleau CM, Eres G, Ivanov IN, Xiao K, McGuire MA, Duscher G, Geohegan DB. Pulsed laser deposition of photoresponsive two-dimensional gase nanosheet networks Advanced Functional Materials. 24: 6365-6371. DOI: 10.1002/Adfm.201401440  0.308
2013 Chandrakumar KR, Readle JD, Rouleau C, Puretzky A, Geohegan DB, More K, Krishnan V, Tian M, Duscher G, Sumpter B, Irle S, Morokuma K. High-temperature transformation of Fe-decorated single-wall carbon nanohorns to nanooysters: a combined experimental and theoretical study. Nanoscale. 5: 1849-57. PMID 23223914 DOI: 10.1039/C2Nr31788E  0.305
2013 Sachan R, Gonzalez C, Dyck O, Wu Y, Garcia H, Pennycook SJ, Rack PD, Duscher G, Kalyanaraman R. Enhanced absorption in ultrathin Si by NiSi2nanoparticles Nanomaterials and Energy. 2: 11-19. DOI: 10.1680/Nme.12.00020  0.381
2013 Yang Z, Chisholm MF, Duscher G, Ma X, Pennycook SJ. Direct observation of dislocation dissociation and Suzuki segregation in a Mg–Zn–Y alloy by aberration-corrected scanning transmission electron microscopy Acta Materialia. 61: 350-359. DOI: 10.1016/J.Actamat.2012.09.067  0.339
2012 Chisholm MF, Duscher G, Windl W. Oxidation resistance of reactive atoms in graphene. Nano Letters. 12: 4651-5. PMID 22906097 DOI: 10.1021/Nl301952E  0.34
2012 Guo J, Morris JR, Ihm Y, Contescu CI, Gallego NC, Duscher G, Pennycook SJ, Chisholm MF. Topological defects: origin of nanopores and enhanced adsorption performance in nanoporous carbon. Small (Weinheim An Der Bergstrasse, Germany). 8: 3283-8. PMID 22893594 DOI: 10.1002/Smll.201200894  0.343
2012 Sachan R, Gonzalez C, Dyck O, Rack P, Duscher G, Kalyanaraman R, Garcia H. Absorption enhancement by Ni-silicide nanostructures embedded in ultra-thin Si films Microscopy and Microanalysis. 18: 1862-1863. DOI: 10.1017/S1431927612011166  0.36
2012 Guo J, Morris J, Contescu C, Gallego N, Pennycook S, Chisholm M, Ihm Y, Duscher G. Atomic-scale imaging of graphene-based nanoporous carbon Microscopy and Microanalysis. 18: 1528-1529. DOI: 10.1017/S143192761200949X  0.313
2012 Sina Y, McHargue CJ, Duscher G, Zhang Y. The effect of zirconium implantation on the structure of sapphire Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 286: 190-195. DOI: 10.1016/J.Nimb.2011.12.026  0.405
2011 Duscher G, Chisholm M, Puretzky A, Rouleau C, Geohegan D. Atomic Structure of Single Walled Carbon Nanohorns Microscopy and Microanalysis. 17: 1510-1511. DOI: 10.1017/S1431927611008427  0.329
2011 Chisholm M, Duscher G, Windl W. Aberration-Corrected STEM Imaging and Spectroscopy of Single-Layered Materials Microscopy and Microanalysis. 17: 1260-1261. DOI: 10.1017/S1431927611007173  0.323
2010 Shen X, Oxley MP, Puzyrev Y, Tuttle BR, Duscher G, Pantelides ST. Excess carbon in silicon carbide Journal of Applied Physics. 108. DOI: 10.1063/1.3517142  0.396
2009 Dang H, Gudipati R, Liu Y, Li Y, Liu Y, Peterson HL, Chisholm MF, Biggerstaff T, Duscher G, Wang S. Carbon Clusters as Possible Defects in the SiC–SiO2 Interface Journal of Computational and Theoretical Nanoscience. 6: 1305-1310. DOI: 10.1166/Jctn.2009.1179  0.69
2009 Biggerstaff TL, Reynolds CL, Zheleva T, Lelis A, Habersat D, Haney S, Ryu SH, Agarwal A, Duscher G. Relationship between 4H-SiC/SiO2 transition layer thickness and mobility Applied Physics Letters. 95. DOI: 10.1063/1.3144272  0.423
2008 Pei L, Duscher G, Steen C, Pichler P, Ryssel H, Napolitani E, De Salvador D, Piro AM, Terrasi A, Severac F, Cristiano F, Ravichandran K, Gupta N, Windl W. Detailed arsenic concentration profiles at Si/SiO2 interfaces Journal of Applied Physics. 104: 043507. DOI: 10.1063/1.2967713  0.775
2008 Steen C, Martinez-Limia A, Pichler P, Ryssel H, Paul S, Lerch W, Pei L, Duscher G, Severac F, Cristiano F, Windl W. Distribution and segregation of arsenic at theSiO2/Si interface Journal of Applied Physics. 104: 023518. DOI: 10.1063/1.2956700  0.779
2008 Zheleva T, Lelis A, Duscher G, Liu F, Levin I, Das M. Transition layers at the SiO2∕SiC interface Applied Physics Letters. 93: 022108. DOI: 10.1063/1.2949081  0.697
2008 Liu F, Collazo R, Mita S, Duscher G, Pennycook S. Erratum: “The mechanism for polarity inversion of GaN via a thin AlN layer: Direct experimental evidence” [Appl. Phys. Lett. 91, 203115 (2007)] Applied Physics Letters. 92: 029901. DOI: 10.1063/1.2836941  0.611
2008 Liu F, Collazo R, Mita S, Sitar Z, Pennycook SJ, Duscher G. Direct observation of inversion domain boundaries of GaN on c-sapphire at sub-ångstrom resolution Advanced Materials. 20: 2162-2165. DOI: 10.1002/Adma.200702522  0.656
2008 Liu F, Collazo R, Mita S, Sitar Z, Duscher G. Three-dimensional geometry of nanometer-scale AIN pits: A new template for quantum dots? Advanced Materials. 20: 134-137. DOI: 10.1002/Adma.200701288  0.64
2007 Steen C, Pichler P, Ryssel H, Pei L, Duscher G, Werner M, van den Berg JA, Windl W. Characterization of the Segregation of Arsenic at the Interface SiO2/Si Mrs Proceedings. 994. DOI: 10.1557/Proc-0994-F08-02  0.785
2007 Zhao W, Duscher G, Zikry MA, Rozgonyi G. Reliable local strain characterization on Si/SiGe structures in biaxial tension Materials Research Society Symposium Proceedings. 958: 151-157. DOI: 10.1557/Proc-0958-L04-08  0.308
2007 Liu F, Collazo R, Mita S, Sitar Z, Duscher G, Pennycook SJ. The mechanism for polarity inversion of GaN via a thin AlN layer: Direct experimental evidence Applied Physics Letters. 91. DOI: 10.1063/1.2815748  0.647
2007 Liu F, Duscher G. Thermal annealing effect on the interface structure of high-κ LaScO3 on silicon Applied Physics Letters. 91: 152906. DOI: 10.1063/1.2799177  0.636
2007 Liu F, Duscher G. Chemical composition changes across the interface of amorphous LaScO3 on Si (001) Applied Physics Letters. 91: 152901. DOI: 10.1063/1.2798246  0.703
2007 Zhao W, Duscher G, Rozgonyi G, Zikry MA, Chopra S, Ozturk MC. Quantitative nanoscale local strain profiling in embedded SiGe metal-oxide-semiconductor structures Applied Physics Letters. 90. DOI: 10.1063/1.2738188  0.304
2006 Pantelides ST, Wang S, Franceschetti A, Buczko R, Ventra MD, Rashkeev SN, Tsetseris L, Evans MH, Batyrev IG, Feldman LC, Dhar S, McDonald K, Weller RA, Schrimpf RD, Fleetwood DM, ... ... Duscher G, et al. Si/SiO2 and SiC/SiO2 Interfaces for MOSFETs – Challenges and Advances Materials Science Forum. 935-948. DOI: 10.4028/Www.Scientific.Net/Msf.527-529.935  0.433
2006 Yarmolenko S, Neralla S, Kumar D, Sankar J, Liu F, Duscher G. Role of Fe and Ni nanoparticles on mechanical properties of alumina thin films deposited by laser ablation Materials Research Society Symposium Proceedings. 890: 189-194. DOI: 10.1557/Proc-0890-Y08-38  0.637
2006 Wang C, Shutthanandan V, Zhang Y, Thevuthasan S, Thomas L, Weber W, Duscher G. Atomic level imaging of Au nanocluster dispersed in TiO2 and SrTiO3 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions With Materials and Atoms. 242: 380-382. DOI: 10.1016/J.Nimb.2005.08.144  0.381
2005 Shao R, Chisholm MF, Duscher G, Bonnell DA. Low-temperature resistance anomaly at SrTiO3 grain boundaries: evidence for an interface-induced phase transition. Physical Review Letters. 95: 197601. PMID 16384023 DOI: 10.1103/Physrevlett.95.197601  0.344
2005 Yarmolenko S, Neralla S, Kumar D, Sankar J, Liu F, Duscher G. Role of Fe and Ni Nanoparticles on Mechanical Properties of Alumina Thin Films deposited by Laser Ablation Mrs Proceedings. 890. DOI: 10.1557/PROC-0890-Y08-38  0.606
2005 Wang C, Pan X, Gu H, Duscher G, Hoffmann MJ, Cannon RM, Ruhle M. Transient Growth Bands in Silicon Nitride Cooled in Rare-Earth-Based Glass Journal of the American Ceramic Society. 80: 1397-1404. DOI: 10.1111/J.1151-2916.1997.Tb02997.X  0.359
2005 Wang CM, Zhang Y, Shutthanandan V, Baer DR, Weber WJ, Thomas LE, Thevuthasan S, Duscher G. Self-assembling of nanocavities inTiO2dispersed with Au nanoclusters Physical Review B. 72. DOI: 10.1103/Physrevb.72.245421  0.35
2004 Duscher G, Chisholm MF, Alber U, Rühle M. Bismuth-induced embrittlement of copper grain boundaries. Nature Materials. 3: 621-6. PMID 15322533 DOI: 10.1038/Nmat1191  0.328
2004 Stoddard NG, Duscher G, Windl W, Rozgonyi GA. Simulation and Electron Energy-Loss Spectroscopy of Electron Beam Induced Point Defect Agglomerations in Silicon Mrs Proceedings. 810. DOI: 10.1557/Proc-810-C3.9  0.416
2004 Windl W, Liang T, Lopatin S, Duscher G. Investigation of Nanostructured Germanium/Silicon Dioxide Interfaces Journal of Computational and Theoretical Nanoscience. 1: 286-295. DOI: 10.1166/Jctn.2004.030  0.698
2004 Browning ND, Buban JP, Moltaji HO, Duscher G. Investigating the Structure-Property Relationships at Grain Boundaries in MgO Using Bond-Valence Pair Potentials and Multiple Scattering Analysis Journal of the American Ceramic Society. 82: 366-372. DOI: 10.1111/J.1551-2916.1999.Tb20071.X  0.353
2004 Wang CM, Shutthanandan V, Zhang Y, Thevuthasan S, Duscher G. Direct observation of substitutional Au atoms inSrTiO3 Physical Review B. 70. DOI: 10.1103/Physrevb.70.172201  0.39
2004 Wang CM, Shutthanandan V, Zhang Y, Thomas LE, Baer DR, Thevuthasan S, Duscher G. Precipitation of Au nanoclusters in SrTiO3 by ion implantation Journal of Applied Physics. 95: 5060-5068. DOI: 10.1063/1.1691187  0.366
2004 Kvit A, Karoui A, Duscher G, Rozgonyi GA. "Umbrella"-like precipitates in nitrogen-doped Czochralski silicon wafers Applied Physics Letters. 84: 1889-1891. DOI: 10.1063/1.1669069  0.369
2004 Lopatin S, Duscher G. Electrically Active Dislocations at the Si/GaAs Interface Microscopy and Microanalysis. 10: 336-337. DOI: 10.1017/S1431927604882783  0.378
2004 Windl W, Liang T, Lopatin S, Duscher G. Modeling and characterization of atomically sharp “perfect” Ge/SiO2 interfaces Materials Science and Engineering B-Advanced Functional Solid-State Materials. 114: 156-161. DOI: 10.1016/J.Mseb.2004.07.041  0.701
2003 Pennycook SJ, Lupini AR, Kadavanich A, McBride JR, Rosenthal SJ, Puetter RC, Yahil A, Krivanek OL, Dellby N, Nellist PDL, Duscher G, Wang LG, Pantelides ST. Aberration-corrected scanning transmission electron microscopy: The potential for nano- and interface science Zeitschrift Fuer Metallkunde/Materials Research and Advanced Techniques. 94: 350-357. DOI: 10.3139/146.030350  0.422
2003 Stoddard N, Karoui A, Duscher G, Kvit A, Rozgonyi G. In Situ Point Defect Generation and Agglomeration during Electron-Beam Irradiation of Nitrogen-Doped Czochralski Silicon Electrochemical and Solid-State Letters. 6. DOI: 10.1149/1.1614471  0.351
2003 Kvit A, Yankov RA, Duscher G, Rozgonyi G, Glasko JM. Formation of nanoscale voids and related metallic impurity gettering in high-energy ion-implanted and annealed epitaxial silicon Applied Physics Letters. 83: 1367-1369. DOI: 10.1063/1.1601678  0.385
2003 Gupta A, Wang H, Kvit A, Duscher G, Narayan J. Effect of microstructure on diffusion of copper in TiN films Journal of Applied Physics. 93: 5210-5214. DOI: 10.1063/1.1566472  0.345
2003 Windl W, Liang T, Lopatin S, Duscher G. Atomistic Modeling of the Detailed Structure of Si/SiO2 Interfaces Using AIDATEM (Ab-initio Interface Defect detection by Analytic Transmission Electron Microscopy) Microscopy and Microanalysis. 9: 826-827. DOI: 10.1017/S1431927603444139  0.425
2003 Lopatin S, Duscher G, Windl W. Atomic Resolution Z-contrast Imaging and EELS: Application for Ge/SiO2 Interface Microscopy and Microanalysis. 9: 818-819. DOI: 10.1017/S1431927603444097  0.684
2003 Rozgonyi GA, Karoui A, Kvit A, Duscher G. Nano-scale analysis of precipitates in nitrogen-doped Czochralski silicon Microelectronic Engineering. 66: 305-313. DOI: 10.1016/S0167-9317(02)00923-1  0.416
2002 Lopatin S, Duscher G, Pennycook SJ, Chisholm MF. Z-contrast Imaging and EELS of Dislocation Cores at the Si/GaAs Interface Mrs Proceedings. 744. DOI: 10.1557/Proc-744-M1.6  0.725
2002 Kvit A, Duscher G, Jin C, Narayan J. The Local Electronic structure at Grain Boundaries and Hetero- Interfaces in ZnO Thin Films Grown by Laser Deposition. Mrs Proceedings. 727. DOI: 10.1557/PROC-727-R8.8  0.301
2002 Kumar D, Pennycook SJ, Lupini A, Duscher G, Tiwari A, Narayan J. Synthesis and atomic-level characterization of Ni nanoparticles in Al2O3 matrix Applied Physics Letters. 81: 4204-4206. DOI: 10.1063/1.1525052  0.375
2002 Lopatin S, Pennycook SJ, Narayan J, Duscher G. Z-contrast imaging of dislocation cores at the GaAs/Si interface Applied Physics Letters. 81: 2728-2730. DOI: 10.1063/1.1511808  0.701
2002 Lopatin S, Narayan J, Duscher G. Z-Contrast Imaging of Dislocation Cores at the Si/GaAs Interface Microscopy and Microanalysis. 8: 1604-1605. DOI: 10.1017/S1431927602104600  0.683
2001 Kim M, Duscher G, Browning ND, Sohlberg K, Pantelides ST, Pennycook SJ. Nonstoichiometry and the electrical activity of grain boundaries in SrTiO3. Physical Review Letters. 86: 4056-9. PMID 11328094 DOI: 10.1103/Physrevlett.86.4056  0.326
2001 Duscher G, Buczko R, Pennycook SJ, Pantelides ST. Core-hole effects on energy-loss near-edge structure Ultramicroscopy. 86: 355-362. PMID 11281155 DOI: 10.1016/S0304-3991(00)00126-1  0.361
2001 Agassi D, Pennycook SJ, Christenb DK, Duscher G, Franceschetti A, Pantelides ST. Critical Currents at Grain Boundaries in High Temperature Superconductors Mrs Proceedings. 689. DOI: 10.1557/Proc-689-E8.1  0.35
2001 Smith J, French RH, Duscher G, Bonnell D. Consequence of Nanometer-Scale Property Variations to Macroscopic Properties of CrOCN Thin Films Journal of the American Ceramic Society. 84: 2873-2881. DOI: 10.1111/J.1151-2916.2001.Tb01108.X  0.342
2001 Wagner T, Marien J, Duscher G. Cu, Nb and V on (110) TiO2 (rutile): Epitaxy and chemical reactions Thin Solid Films. 398: 419-426. DOI: 10.1016/S0040-6090(01)01351-7  0.352
2000 Pantelides ST, Duscher G, Ventra MD, Buczko R, McDonald K, Huang MB, Weller RA, Baumvol IJR, Stedile FC, Radtke C, Pennycook SJ, Chung GY, Tin CC, Williams JR, Won JH, et al. Atomic-Scale Engineering of the SiC-SiO2 Interface Materials Science Forum. 338: 1133-1136. DOI: 10.4028/Www.Scientific.Net/Msf.338-342.1133  0.456
2000 Pennycook SJ, Kim M, Duscher G, Browning ND, Sohlberg K, Pantelides ST. The Origin of Electrical Activity at Grain Boundaries in Perovskites and Related Materials Mrs Proceedings. 654. DOI: 10.1557/Proc-654-Aa1.3.1  0.34
2000 Pantelides ST, Buczko R, Ventra MD, Wang S, Kim S, PennycooK SJ, Duscher G, Feldman LC, Mcdonald K, Chanana RK, Weller RA, Williams JR, Chung GY, Tin CC, Isaacs-Smith T. Bonding, Defects, And Defect Dynamics In The Sic-SiO2 System Mrs Proceedings. 640. DOI: 10.1557/Proc-640-H3.3  0.449
2000 Buczko R, Duscher G, Pennycook SJ, Pantelides ST. Excitonic effects in core-excitation spectra of semiconductors Physical Review Letters. 85: 2168-2171. DOI: 10.1103/Physrevlett.85.2168  0.315
2000 Chisholm MF, Duscher G, Pang L, Kumar KS. Fe16Al14B2 phase in Fe–Al alloys Philosophical Magazine A. 80: 2737-2745. DOI: 10.1080/01418610008216502  0.339
2000 Gao H, Duscher G, Kim M, Pennycook SJ, Kumar D, Cho KG, Singh RK. Cathodoluminescent properties at nanometer resolution through Z-contrast scanning transmission electron microscopy Applied Physics Letters. 77: 594-596. DOI: 10.1063/1.127055  0.37
2000 Duscher G, Buban J, Browning N, Chisholm M, Pennycook S. Interface Science. 8: 199-208. DOI: 10.1023/A:1008750706797  0.365
2000 Gao H, Duscher G, Kim M, Kumar D, Singh RK, Pennycook SJ. Nanometer-Scale Cathodoluminescent Properties Through Z-Contrast Scanning Transmission Electron Microscopy Microscopy and Microanalysis. 6: 130-131. DOI: 10.1017/S1431927600033146  0.31
2000 Marien J, Wagner T, Duscher G, Koch A, Rühle M. Nb on (110) TiO2 (rutile): Growth, structure, and chemical composition of the interface Surface Science. 446: 219-228. DOI: 10.1016/S0039-6028(99)01172-3  0.421
1999 Buban JP, Moltaji HO, Duscher G, Browning ND. Correlating Atomic Scale Experimental Observations to Develop Three-Dimensional Structural Models for Grain Boundaries in Oxides. Microscopy and Microanalysis. 5: 48-57. PMID 10227826 DOI: 10.1017/S1431927699000045  0.379
1999 Duscher G, Buzcko R, Pennycook SJ, Pantelides ST, Müllejans H, Rühle M. Microscopic and Theoretical Investigations of the Si-SiO2 Interface Mrs Proceedings. 592. DOI: 10.1557/Proc-592-15  0.462
1999 Gao H, Duscher G, Fan X, Pennycook S, Kumar D, Cho K, Holloway P, Singh R. Relationship Between Structure and Luminescent Properties of Epitaxial Grown Y2O3:Eu Thin Films on LaAlO3 Substrates Mrs Proceedings. 589. DOI: 10.1557/Proc-589-203  0.322
1999 Pennycook SJ, Yan Y, Norman A, Zhang Y, Al-Jassim M, Mascarenhas A, Ahrenkiel SP, Chisholm MF, Duscher G, Pantelides ST. Atomic-Resolution Z-Contrast Imaging and its Application to Compositional Ordering and Segregation Mrs Proceedings. 583. DOI: 10.1557/Proc-583-235  0.378
1999 Wagner T, Duscher G, Kirchheim R. Decomposition of the ZrO2 electrolyte in contact with Ni: Structure and chemical composition of the Ni–electrolyte interface Journal of Materials Research. 14: 3340-3345. DOI: 10.1557/Jmr.1999.0452  0.336
1999 Lowndes DH, Rouleau CM, Thundat T, Duscher G, Kenik E, Pennycook S. Silicon and zinc telluride nanoparticles synthesized by low energy density pulsed laser ablation into ambient gases Journal of Materials Research. 14: 359-370. DOI: 10.1557/Jmr.1999.0053  0.337
1999 Browning ND, Buban JP, Moltaji HO, Pennycook SJ, Duscher G, Johnson KD, Rodrigues RP, Dravid VP. The influence of atomic structure on the formation of electrical barriers at grain boundaries in SrTiO3 Applied Physics Letters. 74: 2638-2640. DOI: 10.1063/1.123922  0.342
1999 Pennycook SJ, Duscher G, Buczko R, Pantelides ST. The Si/SiO2 Interface: Atomic Structures, Composition, Strain And Energetics Microscopy and Microanalysis. 5: 122-123. DOI: 10.1017/S1431927600013933  0.396
1999 Browning N, Buban J, Prouteau C, Duscher G, Pennycook S. Investigating the atomic scale structure and chemistry of grain boundaries in high- T c superconductors Micron. 30: 425-436. DOI: 10.1016/S0968-4328(99)00044-X  0.386
1999 Pennycook SJ, Chisholm MF, Yan Y, Duscher G, Pantelides ST. A combined experimental and theoretical approach to grain boundary structure and segregation Physica B-Condensed Matter. 273: 453-457. DOI: 10.1016/S0921-4526(99)00521-9  0.394
1998 Prouteau C, Duscher G, Browning ND, Pennycook SJ, Verebelyi D, Christen DK, Chisholm MF, Norton DP. Investigation of the local superconducting properties at grain boundaries in high-Tc superconductors Microscopy and Microanalysis. 4: 690-691. DOI: 10.2172/650390  0.325
1998 Geohegan DB, Puretzky AA, Meldrum A, Duscher G, Pennycook SJ. In Situ Diagnostics of Nanomaterial Synthesis by Laser Ablation: Time-resolved Photoluminescence Spectra and Imaging of Gas-Suspended Nanoparticles Deposited for Thin Films Mrs Proceedings. 536. DOI: 10.1557/Proc-536-359  0.34
1998 Geohegan DB, Puretzky AA, Duscher G, Pennycook SJ. Time-Resolved Imaging and Photoluminescence of Gas-Suspended Nanoparticles Synthesized by Laser Ablation: Dynamics, Transport, Collection, and Ex Situ Analysis Mrs Proceedings. 526. DOI: 10.1557/Proc-526-47  0.35
1998 Yan Y, Chisholm MF, Duscher G, Maiti A, Pennycook SJ, Pantelides ST. Impurity-Induced Structural Transformation of a MgO Grain Boundary Physical Review Letters. 81: 3675-3678. DOI: 10.1103/Physrevlett.81.3675  0.353
1998 Yan Y, Chisholm MF, Duscher G, Pennycook SJ. Atomic structure of a Ca-doped [001] tilt grain boundary in MgO Journal of Electron Microscopy. 47: 115-120. DOI: 10.1093/Oxfordjournals.Jmicro.A023567  0.31
1998 Duscher G, Pennycook SJ, Browning ND, Rupangudi R, Takoudis C, Gao H, Singh R. Structure, composition, and strain profiling of Si/SiO{sub 2} interfaces Characterization and Metrology For Ulsi Technology. 449: 191-195. DOI: 10.1063/1.56793  0.446
1998 Geohegan DB, Puretzky AA, Duscher G, Pennycook SJ. Photoluminescence from gas-suspended SiOx nanoparticles synthesized by laser ablation Applied Physics Letters. 73: 438-440. DOI: 10.1063/1.121892  0.343
1998 Geohegan DB, Puretzky AA, Duscher G, Pennycook SJ. Time-resolved imaging of gas phase nanoparticle synthesis by laser ablation Applied Physics Letters. 72: 2987-2989. DOI: 10.1063/1.121516  0.324
1998 Stemmer S, Duscher G, James EM, Ceh M, Browning ND. Atomic Scale Structure-Property Relationships of Defects and Interfaces in Ceramics Microscopy and Microanalysis. 4: 556-557. DOI: 10.1017/S143192760002290X  0.372
1998 French R, Müllejans H, Jones D, Duscher G, Cannon R, Rühle M. Dispersion forces and Hamaker constants for intergranular films in silicon nitride from spatially resolved-valence electron energy loss spectrum imaging Acta Materialia. 46: 2271-2287. DOI: 10.1016/S1359-6454(98)80008-6  0.341
1998 Prouteau C, Duscher G, Browning N, Pennycook S. Investigation of the local superconducting properties in Ag-sheathed BSCCO tapes by STEM Physica C: Superconductivity. 298: 1-9. DOI: 10.1016/S0921-4534(98)00012-4  0.32
1998 Lowndes DH, Rouleau CM, Thundat T, Duscher G, Kenik EA, Pennycook SJ. Silicon and zinc telluride nanoparticles synthesized by pulsed laser ablation: size distributions and nanoscale structure Applied Surface Science. 127: 355-361. DOI: 10.1016/S0169-4332(97)00655-7  0.354
1998 Duscher G, Duscher G, Browning ND, Pennycook SJ. Atomic Column Resolved Electron Energy-Loss Spectroscopy Physica Status Solidi (a). 166: 327-342. DOI: 10.1002/(Sici)1521-396X(199803)166:1<327::Aid-Pssa327>3.0.Co;2-R  0.429
1997 Yan Y, Chisholm MF, Pennycook SJ, Duscher G, Maiti A, Pantelides ST. First-principles simulations and Z-contrast imaging of impurities at tilt grain boundaries in MgO Mrs Proceedings. 492: 181. DOI: 10.2172/564235  0.327
1997 Stemmer S, Duscher G, Scheu C, Heuer AH, Rühle M. The reaction between a TiNi shape memory thin film and silicon Journal of Materials Research. 12: 1734-1740. DOI: 10.1557/Jmr.1997.0239  0.333
1997 Schroer E, Hopfe S, Werner P, Gösele U, Duscher G, Rühle M, Tan TY. Oxide precipitation at silicon grain boundaries Applied Physics Letters. 70: 327-329. DOI: 10.1063/1.118405  0.323
1997 Browning ND, Buban JP, Prouteau C, Duscher G, Chisholm MF, Pennycook SJ. Determining Atomic Structure-Property Relationships at Grain Boundaries in High-Tc Superconductors Microscopy and Microanalysis. 3: 657-658. DOI: 10.1017/S1431927600010175  0.326
1997 Duscher G, Banhart F, Müllejans H, Pennycook SJ, Rühle M. Atomic Structure of Si-SiO2 Interface Microscopy and Microanalysis. 3: 459-460. DOI: 10.1017/S1431927600009181  0.413
1996 Duscher G, Müllejans H, Werner J, Rühle M. Amorphous SiO2 Precipitates at Silicon Grain Boundaries Materials Science Forum. 713-716. DOI: 10.4028/Www.Scientific.Net/Msf.207-209.713  0.32
1995 French RH, Scheu C, Duscher G, Muellejans H, Hoffmann MJ, Cannon RM. Interfacial electronic structure and full spectral Hamaker constants of Si3N4 intergranular films from VUV and SR-VEEL spectroscopy Materials Research Society Symposium - Proceedings. 357: 243-258. DOI: 10.1557/Proc-357-243  0.336
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