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Jie Diao, Ph.D. - Publications

Affiliations: 
2004 Georgia Institute of Technology, Atlanta, GA 
Area:
Chemical Engineering, Optics Physics
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4 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2005 Diao J, Hess DW. Refractive index measurements of films with biaxial symmetry. 2. Determination of film thickness and refractive indices using polarized transmission spectra in the transparent wavelength range. The Journal of Physical Chemistry. B. 109: 12819-25. PMID 16852589 DOI: 10.1021/Jp0462761  0.559
2005 Diao J, Hess DW. Refractive index measurements of films with biaxial symmetry. 1. Determination of complex refractive indices using polarized reflectance/transmittance ratio. The Journal of Physical Chemistry. B. 109: 12800-18. PMID 16852588 DOI: 10.1021/Jp046277T  0.54
2005 Diao J, Hess DW. Through-plane uniformity of optical anisotropy in spin-coated biphenyl dianhydride-p-phenylenediamine films Thin Solid Films. 483: 226-231. DOI: 10.1016/J.Tsf.2004.11.246  0.546
2004 Diao J, Hess DW. Use of angle-resolved XPS to determine depth profiles based on Fick's second law of diffusion: Description of method and simulation study Journal of Electron Spectroscopy and Related Phenomena. 135: 87-104. DOI: 10.1016/J.Elspec.2003.12.008  0.468
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