Year |
Citation |
Score |
2020 |
Hsiao H, Shao Y, Yuan R, Zuo J. Imaging Lattice Distortions in High Entropy Alloys at Multiple Length Scales Using Electron Nanodiffraction and 4D-STEM Microscopy and Microanalysis. 1-3. DOI: 10.1017/S1431927620016554 |
0.313 |
|
2020 |
Zuo J, Yuan R, Hsiao H. From Scanning Electron Nanodiffraction to 4D-STEM: How and Why Coherence Matters Microscopy and Microanalysis. 1-2. DOI: 10.1017/S1431927620016517 |
0.314 |
|
2019 |
Yoon A, Zuo J. Environment-Dependent Electron Beam Reduction of Rutile Nanocrystals at High Temperatures Microscopy and Microanalysis. 25: 1680-1681. DOI: 10.1017/S1431927619009139 |
0.314 |
|
2018 |
Kwon J, Meng Y, Wu L, Zhu Y, Zhang Y, Selvamanickam V, Welp U, Kwok W, Zuo J. Extended electronic structure inhomogeneity created by double chain layer defects surrounding columnar tracks in heavy-ion irradiated YBa2Cu3O7−δ Superconductor Science and Technology. 31: 105006. DOI: 10.1088/1361-6668/Aad842 |
0.371 |
|
2018 |
Zuo J, Shao Y. Scanning Convergent Beam Electron Diffraction (CBED), the Essential Questions of Why, What and How? Microscopy and Microanalysis. 24: 172-173. DOI: 10.1017/S1431927618001356 |
0.356 |
|
2018 |
Kim T, Zuo J. Structural determination of single-walled carbon nanotube with an intramolecular junction and its electrical transport property Carbon. 139: 472-476. DOI: 10.1016/J.Carbon.2018.06.075 |
0.558 |
|
2017 |
Guo W, Sneed BT, Meng Y, Cullen DA, Zuo J, Poplawsky JD. Recent Progress of Correlative Transmission Electron Microscopy and Atom Probe Tomography for Materials Characterization Microscopy and Microanalysis. 23: 692-693. DOI: 10.1017/S1431927617004123 |
0.354 |
|
2017 |
Yuan R, Meng Y, Zhang J, Zuo J. Accurate Diffraction Peak Identification for Scanning Electron Nanodiffraction Based on Automated Image Processing and Feature Detection Microscopy and Microanalysis. 23: 180-181. DOI: 10.1017/S1431927617001581 |
0.328 |
|
2017 |
Kwon J, Park J, Park G, Zuo J, Kang S, Oh J, Kim M. Nanoscale physico-chemical investigation of complementary ZnO-Si nanocomposites and their photoconductive behavior Current Applied Physics. 17: 152-156. DOI: 10.1016/J.Cap.2016.11.013 |
0.345 |
|
2016 |
Shao Y, Zuo J. Fundamental Symmetry of Barium Titanate Single Crystal Determined Using Energy-Filtered Scanning Convergent Beam Electron Diffraction Microscopy and Microanalysis. 22: 516-517. DOI: 10.1017/S1431927616003433 |
0.353 |
|
2016 |
Meng Y, Zuo J. Three-Dimensional Nanostructure Determination Based On Scanning Electron Nanodiffraction Microscopy and Microanalysis. 22: 498-499. DOI: 10.1017/S1431927616003342 |
0.369 |
|
2015 |
Zheng Q, Kim H, Zhang R, Sardela M, Zuo J, Balaji M, Lourdudoss S, Sun YT, Braun PV. Epitaxial growth of three dimensionally structured III-V photonic crystal via hydride vapor phase epitaxy Journal of Applied Physics. 118. DOI: 10.1063/1.4937273 |
0.339 |
|
2015 |
Gao W, Sivaramakrishnan S, Wen J, Zuo J. Direct Observation of Interfacial Au atoms Using STEM Depth Sectioning Microscopy and Microanalysis. 21: 2417-2418. DOI: 10.1017/S1431927615012866 |
0.549 |
|
2015 |
Zuo J, Meng Y, Vivek Deshpande P, Hu Y, Kim K, Xing H, Zhang P, Wang H. TEM Based High Resolution Electron Diffraction Techniques for Three-dimensional Nanostructure Determination Microscopy and Microanalysis. 21: 1095-1096. DOI: 10.1017/S1431927615006261 |
0.355 |
|
2015 |
Kim K, Zuo J. Quantitative symmetry determination and symmetry mapping using convergent beam electron diffraction technique Microscopy and Microanalysis. 21: 821-822. DOI: 10.1017/S1431927615004900 |
0.344 |
|
2014 |
Gao W, Wu J, Zhang X, Yoon A, Mabon J, Swiech W, Wilson W, Yang H, Zuo J. Surface Atomic Diffusion Processes Observed at Milliseconds Time Resolution using Environmental TEM Microscopy and Microanalysis. 20: 1590-1591. DOI: 10.1017/S1431927614009684 |
0.352 |
|
2013 |
Wei H, House S, Wu J, Zhang J, Wang Z, He Y, Gao EJ, Gao Y, Robinson H, Li W, Zuo J, Robertson IM, Lu Y. Enhanced and tunable fluorescent quantum dots within a single crystal of protein Nano Research. 6: 627-634. DOI: 10.1007/S12274-013-0348-0 |
0.513 |
|
2012 |
Kim K, Payne DA, Zuo J. Symmetry of piezoelectric (1−x)Pb(Mg1/3Nb2/3)O3-xPbTiO3(x=0.31) single crystal at different length scales in the morphotropic phase boundary region Physical Review B. 86. DOI: 10.1103/Physrevb.86.184113 |
0.346 |
|
2012 |
Hu H, Zheng M, Eckstein J, Zuo J. Scanning Transmission Electron Microscopy Evidences Of Interstitial And Substitutional Oxygen In MBE Grown Fe1+xTe Thin Films And Emergence Of Superconductivity Microscopy and Microanalysis. 18: 1456-1457. DOI: 10.1017/S1431927612009130 |
0.321 |
|
2010 |
Kim T, Kim G, Choi WI, Kwon Y, Zuo J. Electrical transport in small bundles of single-walled carbon nanotubes: Intertube interaction and effects of tube deformation Applied Physics Letters. 96: 173107. DOI: 10.1063/1.3402768 |
0.514 |
|
2009 |
Hu H, Zuo J. Atomic-Resolution Imaging of Crystals Using Charge Flipping and Precession Electron Diffraction Microscopy and Microanalysis. 15: 740-741. DOI: 10.1017/S1431927609093702 |
0.375 |
|
2009 |
Zhang J, Zuo J. Quantitative Analysis Carbon-Carbon Bonds in a Multiwall Carbon Nanotube using Electron Diffraction Microscopy and Microanalysis. 15: 764-765. DOI: 10.1017/S1431927609093404 |
0.551 |
|
2009 |
Zhang J, Zuo J. Structure and diameter-dependent bond lengths of a multi-walled carbon nanotube revealed by electron diffraction Carbon. 47: 3515-3528. DOI: 10.1016/J.Carbon.2009.08.024 |
0.572 |
|
2009 |
Wei X, Chen Q, Xu S, Peng L, Zuo J. Tuning Nanotubes: Beam to String Transition of Vibrating Carbon Nanotubes Under Axial Tension (Adv. Funct. Mater. 11/2009) Advanced Functional Materials. 19: NA-NA. DOI: 10.1002/Adfm.200990044 |
0.31 |
|
2009 |
Wei X, Chen Q, Xu S, Peng L, Zuo J. Beam to String Transition of Vibrating Carbon Nanotubes Under Axial Tension Advanced Functional Materials. 19: 1753-1758. DOI: 10.1002/Adfm.200900105 |
0.313 |
|
2008 |
Jacob D, Zuo J, Lefebvre A, Cordier Y. Composition analysis of semiconductor quantum wells by energy filtered convergent-beam electron diffraction. Ultramicroscopy. 108: 358-366. PMID 17630214 DOI: 10.1016/J.Ultramic.2007.06.001 |
0.315 |
|
2008 |
Park H, Pounds T, Zuo J. Development of Time Resolved Reflection High-Energy Electron Diffraction System to Study Ultrafast Phases Transition at Surfaces Microscopy and Microanalysis. 14: 502-503. DOI: 10.1017/S1431927608084663 |
0.335 |
|
2008 |
Zuo J, Huang W, Shah A, Kröeger R. Modeling Electron Diffraction and Imaging in Microscopes with Aberration Correctors for Quantitative Materials Structural Analysis Microscopy and Microanalysis. 14: 920-921. DOI: 10.1017/S1431927608082469 |
0.366 |
|
2007 |
Xiao J, Liu B, Huang Y, Zuo J, Hwang KC, Yu MF. Collapse and stability of single-?and multi-wall carbon nanotubes Nanotechnology. 18: 395703. PMID 21730428 DOI: 10.1088/0957-4484/18/39/395703 |
0.328 |
|
2007 |
Huang WJ, Jiang B, Sun RS, Zuo J. Towards sub-Å atomic resolution electron diffraction imaging of metallic nanoclusters: A simulation study of experimental parameters and reconstruction algorithms Ultramicroscopy. 107: 1159-1170. PMID 17383097 DOI: 10.1016/J.Ultramic.2007.01.017 |
0.345 |
|
2007 |
Zuo J, Kim T, Celik-Aktas A, Tao J. Quantitative structural analysis of individual nanotubes by electron diffraction Zeitschrift FüR Kristallographie - Crystalline Materials. 222. DOI: 10.1524/Zkri.2007.222.11.625 |
0.538 |
|
2007 |
Celik-Aktas A, Stubbins J, Zuo J. Electron Beam Machining of Nanometer-Sized Tips from Multiwalled Boron Nitride Nanotubes Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607078506 |
0.346 |
|
2006 |
Kim T, Zuo J. Structure and Electrical Transport of Single-Walled Carbon Nanotubes with Intramolecular Junction and Defects Microscopy and Microanalysis. 12: 490-491. DOI: 10.1017/S1431927606062830 |
0.543 |
|
2006 |
Huang W, Jiang B, Zuo J. Atomic Resolution Electron Diffraction Imaging of Metallic Nanoclusters Microscopy and Microanalysis. 12: 576-577. DOI: 10.1017/S1431927606062180 |
0.363 |
|
2005 |
Balakrishnan K, Datar A, Oitker R, Chen H, Zuo J, Zang L. Nanobelt self-assembly from an organic n-type semiconductor: propoxyethyl-PTCDI. Journal of the American Chemical Society. 127: 10496-7. PMID 16045330 DOI: 10.1021/Ja052940V |
0.309 |
|
2003 |
Bording JK, Li BQ, Shi YF, Zuo J. Size- and shape-dependent energetics of nanocrystal interfaces: experiment and simulation. Physical Review Letters. 90: 226104-226104. PMID 12857325 DOI: 10.1103/Physrevlett.90.226104 |
0.301 |
|
2002 |
Jiang B, Zuo J, Chen Q, Spence JCH. Orbital ordering in LaMnO3: estimates of structure factors and comparison of measurement methods. Acta Crystallographica Section A. 58: 4-11. PMID 11752757 DOI: 10.1107/S0108767301013800 |
0.347 |
|
2002 |
Zuo J, Twesten R, Li B, Tao J, Shi Y, Bording J, Chen H, Petrov I. Progress towards Quantitative Electron Nanodiffraction Microscopy and Microanalysis. 8: 658-659. DOI: 10.1017/S1431927602106295 |
0.344 |
|
1999 |
Weierstall U, Zuo J, Kjo̵rsvik T, Spence J. Convergent-beam RHEED in a dedicated UHV diffraction camera and applications to Si reconstructed surfaces Surface Science. 442: 239-250. DOI: 10.1016/S0039-6028(99)00922-X |
0.336 |
|
1998 |
Zuo J. Quantitative Convergent Beam Electron Diffraction Materials Transactions. 39: 938-946. DOI: 10.1007/1-4020-3920-4_10 |
0.393 |
|
1997 |
Ren G, Zuo J, Peng L. Accurate measurements of crystal structure factors using a FEG electron microscope Micron. 28: 459-467. DOI: 10.1016/S0968-4328(97)00034-6 |
0.358 |
|
1996 |
Spence JCH, Zuo J, Weierstall U, Zhang X. The scanning-tunneling atom probe. Point reflection microscopy Acta Crystallographica Section a Foundations of Crystallography. 52: C33-C33. DOI: 10.1107/S0108767396097681 |
0.318 |
|
1996 |
Zuo J, McCartney M, Spence J. Performance of imaging plates for electron recording Ultramicroscopy. 66: 35-47. DOI: 10.1016/S0304-3991(96)00076-9 |
0.315 |
|
1995 |
Peng L, Zuo J. Direct retrieval of crystal structure factors in THEED Ultramicroscopy. 57: 1-9. DOI: 10.1016/0304-3991(94)00193-Q |
0.369 |
|
1992 |
Spence JCH, Zuo J, Qian W. Comment on "Atomic resolution in lensless low-energy electron holography" Physical Review Letters. 68: 3256-3256. PMID 10045653 DOI: 10.1103/Physrevlett.68.3256 |
0.346 |
|
1989 |
Spence J, Zuo J, Lynch J. On the Holz contribution to stem lattice images formed using high-angle dark-field detectors Ultramicroscopy. 31: 233-239. DOI: 10.1016/0304-3991(89)90218-0 |
0.353 |
|
1988 |
Zuo J, Spence JCH, O'Keeffe M. Bonding in GaAs Physical Review Letters. 61: 353-356. PMID 10039309 DOI: 10.1103/Physrevlett.61.353 |
0.315 |
|
Show low-probability matches. |