Year |
Citation |
Score |
2019 |
Chien WK, Chung A, Kuo W. Fast Semiconductor Reliability Assessments Using SPRT Ieee Transactions On Reliability. 68: 526-538. DOI: 10.1109/Tr.2018.2869597 |
0.308 |
|
2017 |
Liu B, Yeh R, Xie M, Kuo W. Maintenance Scheduling for Multicomponent Systems with Hidden Failures Ieee Transactions On Reliability. 66: 1280-1292. DOI: 10.1109/Tr.2017.2740562 |
0.326 |
|
2017 |
Liu B, Liang Z, Parlikad AK, Xie M, Kuo W. Condition-based maintenance for systems with aging and cumulative damage based on proportional hazards model Reliability Engineering & System Safety. 168: 200-209. DOI: 10.1016/J.Ress.2017.04.010 |
0.319 |
|
2016 |
Liu B, Xie M, Kuo W. Reliability modeling and preventive maintenance of load-sharing systemswith degrading components Iie Transactions (Institute of Industrial Engineers). 48: 699-709. DOI: 10.1080/0740817X.2015.1125041 |
0.315 |
|
2016 |
Liu B, Zhao X, Yeh R, Kuo W. Imperfect Inspection Policy for Systems with Multiple Correlated Degradation Processes Ifac-Papersonline. 49: 1377-1382. DOI: 10.1016/J.Ifacol.2016.07.758 |
0.314 |
|
2016 |
Liu B, Xie M, Xu Z, Kuo W. An imperfect maintenance policy for mission-oriented systems subject to degradation and external shocks Computers & Industrial Engineering. 102: 21-32. DOI: 10.1016/J.Cie.2016.10.008 |
0.318 |
|
2014 |
Liu B, Xu Z, Xie M, Kuo W. A value-based preventive maintenance policy for multi-component system with continuously degrading components Reliability Engineering & System Safety. 132: 83-89. DOI: 10.1016/J.Ress.2014.06.012 |
0.319 |
|
2012 |
Kuo W, Zhu X. Some Recent Advances on Importance Measures in Reliability Ieee Transactions On Reliability. 61: 344-360. DOI: 10.1109/Tr.2012.2194196 |
0.31 |
|
2011 |
Kim KO, Kuo W. Component and system burn-in for repairable systems Iie Transactions. 43: 773-782. DOI: 10.1080/0740817X.2011.590432 |
0.323 |
|
2011 |
Yao Q, Zhu X, Kuo W. Heuristics for component assignment problems based on the Birnbaum importance Iie Transactions. 43: 633-646. DOI: 10.1080/0740817X.2010.532856 |
0.312 |
|
2004 |
Kim KO, Kuo W, Luo W. A relation model of gate oxide yield and reliability Microelectronics Reliability. 44: 425-434. DOI: 10.1016/J.Microrel.2003.09.009 |
0.348 |
|
2003 |
Kim KO, Kuo W. Percentile Life and Reliability As Performance Measures in Optimal System Design Iie Transactions. 35: 1133-1142. DOI: 10.1080/714044435 |
0.303 |
|
2003 |
Kim KO, Kuo W. A general model of heterogeneous system lifetimes and conditions for system burn-in Naval Research Logistics. 50: 364-380. DOI: 10.1002/Nav.10067 |
0.313 |
|
2001 |
Prasad VR, Kuo W, Kim KO. Maximization of a percentile life of a series system through component redundancy allocation Iie Transactions. 33: 1071-1079. DOI: 10.1023/A:1010918619329 |
0.301 |
|
1997 |
Chien WK, Kuo W. A nonparametric Bayes approach to decide system burn‐in time Naval Research Logistics. 44: 655-671. DOI: 10.1002/(Sici)1520-6750(199710)44:7<655::Aid-Nav4>3.0.Co;2-B |
0.336 |
|
1995 |
Chien WTK, Kuo W. Modeling & Maximizing Burn-in Effectiveness Ieee Transactions On Reliability. 44: 19-25. DOI: 10.1109/24.376515 |
0.347 |
|
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