Zhigang Xiao, Ph.D. - Publications

Affiliations: 
2004 University of Cincinnati, Cincinnati, OH 
Area:
Electronics and Electrical Engineering, Materials Science Engineering, Chemical Engineering

19 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2020 Xiao Z, Williams L, Kisslinger K, Sadowski JT, Camino F. Fabrication of field-effect transistors with transfer-free nanostructured carbon as the semiconducting channel material. Nanotechnology. 31: 485203. PMID 32931465 DOI: 10.1088/1361-6528/Abb04A  0.342
2018 Xiao Z, Kisslinger K, Dimasi E, Kimbrough J. The fabrication of nanoscale Bi2Te3/Sb2Te3 multilayer thin film-based thermoelectric power chips Microelectronic Engineering. 197: 8-14. DOI: 10.1016/J.Mee.2018.05.001  0.395
2017 Budak S, Xiao Z, Cole J, Price D, Davis T, Strong T, Alim MA. Thermoelectric and optical properties of advanced thermoelectric devices from Ni/Bi2Te3/Ni and Ni/Sb2Te3/Ni thin films Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 35: 51401. DOI: 10.1116/1.5001046  0.36
2016 Budak S, Xiao Z, Johnson B, Cole J, Drabo M, Tramble A, Casselberry C. Highly-efficient advanced thermoelectric devices from different multilayer thin films American Journal of Engineering and Applied Sciences. 9: 356-363. DOI: 10.3844/Ajeassp.2016.356.363  0.394
2016 Xiao Z, Elike J, Reynolds A, Moten R, Zhao X. The fabrication of carbon nanotube electronic circuits with dielectrophoresis Microelectronic Engineering. 164: 123-127. DOI: 10.1016/J.Mee.2016.07.013  0.329
2015 Xiao Z, Zhu X. On-Chip Sensing of Thermoelectric Thin Film's Merit. Sensors (Basel, Switzerland). 15: 17232-40. PMID 26193272 DOI: 10.3390/S150717232  0.381
2015 Xiao Z, Kisslinger K. Electron-beam-evaporated thin films of hafnium dioxide for fabricating electronic devices Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 33: 42001. DOI: 10.1116/1.4922627  0.362
2015 Fu G, Zuo L, Lian J, Wang Y, Chen J, Longtin J, Xiao Z. Ion beam irradiation effect on thermoelectric properties of Bi2Te3 and Sb2Te3 thin films Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 358: 229-235. DOI: 10.1016/J.Nimb.2015.06.039  0.314
2013 Jiang L, Vangari M, Pryor T, Xiao Z, Korivi NS. Miniature supercapacitors based on nanocomposite thin films Microelectronic Engineering. 111: 52-57. DOI: 10.1016/J.Mee.2013.01.030  0.322
2012 Hines M, Lenhardt J, Lu M, Jiang L, Xiao Z. Cooling effect of nanoscale Bi 2Te 3/Sb 2Te 3 multilayered thermoelectric thin films Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 30. DOI: 10.1116/1.4725483  0.378
2010 Xiao Z, Camino FE. An Effective Switching-Off Mechanism for High-Performance Carbon Nanotube Field-Effect Transistors Journal of Nanoelectronics and Optoelectronics. 5: 26-29. DOI: 10.1166/Jno.2010.1058  0.301
2010 Xiao Z, Sharma H, Zhu MY, Pearson T. Dielectrophoresis-assisted deposition and alignment of single-walled carbon nanotubes for electronic-device fabrication Journal of Vacuum Science & Technology a: Vacuum, Surfaces, and Films. 28: 750-754. DOI: 10.1116/1.3378151  0.366
2010 Xiao Z, Hedgemen K, Harris M, DiMasi E. Fabrication of Bi2Te3/Sb2Te3 and Bi2Te3/Bi2Te2Se multilayered thin film-based integrated cooling devices Journal of Vacuum Science and Technology. 28: 679-683. DOI: 10.1116/1.3292600  0.393
2010 Zheng B, Song M, Chhay B, Xiao Z, Zimmerman RL, Sharma A, Kishimoto N, Ila D. Spectroscopic analysis of dipole interaction of metallic nanoparticles in dielectric multilayer dielectric thin film Vacuum. 84: 1302-1305. DOI: 10.1016/J.Vacuum.2010.02.007  0.321
2009 Xiao Z, Camino FE. The fabrication of carbon nanotube field-effect transistors with semiconductors as the source and drain contact materials Nanotechnology. 20: 135205. PMID 19420491 DOI: 10.1088/0957-4484/20/13/135205  0.341
2009 Zheng B, Xiao Z, Chhay B, Zimmerman RL, Edwards ME, ILA D. Thermoelectric properties of MeV Si ion bombarded Bi2Te3/Sb2Te3 superlattice deposited by magnetron sputtering Surface and Coatings Technology. 203: 2682-2686. DOI: 10.1016/J.Surfcoat.2009.02.094  0.375
2007 Zheng B, Xiao Z, Chhay B, Zimmerman R, Ila D. Improvement on thermoelectric properties of multilayered Si1−xGex/Si by ion beam bombardment Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms. 266: 73-78. DOI: 10.1016/J.Nimb.2007.10.041  0.375
2006 Xiao Z, Zimmerman RL, Holland LR, Zheng B, Muntele CI, Ila D. Nanoscale BixTe3/Sb2Te3 multilayer thin film materials for reduced thermal conductivity Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms. 242: 201-204. DOI: 10.1016/J.Nimb.2005.08.109  0.378
2005 Xiao Z, Zimmerman RL, Holland LR, Zheng B, Muntele CI, Ila D. MeV Si ion bombardments of thermoelectric BixTe3/Sb2Te3 multilayer thin films for reducing thermal conductivity Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms. 241: 568-572. DOI: 10.1016/J.Nimb.2005.07.105  0.371
Show low-probability matches.