Year |
Citation |
Score |
2015 |
Yurtsever A. Nanoscale Probes in Ultrafast Transmission Electron Microscopy Microscopy and Microanalysis. 21: 1413-1414. DOI: 10.1017/S1431927615007849 |
0.413 |
|
2014 |
Yurtsever A, Couillard M, Hyun JK, Muller DA. Thickness measurements using photonic modes in monochromated electron energy-loss spectroscopy. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20: 723-30. PMID 24612729 DOI: 10.1017/S1431927614000245 |
0.547 |
|
2014 |
Yurtsever A. Visualizing the Optically Induced Near-fields of Nanoplasmonics with Ultrafast Transmission Electron Microscopy Microscopy and Microanalysis. 20: 1586-1587. DOI: 10.1017/S1431927614009660 |
0.383 |
|
2012 |
Yurtsever A, van der Veen RM, Zewail AH. Subparticle ultrafast spectrum imaging in 4D electron microscopy. Science (New York, N.Y.). 335: 59-64. PMID 22223801 DOI: 10.1126/science.1213504 |
0.334 |
|
2010 |
Couillard M, Yurtsever A, Muller DA. Interference effects on guided Cherenkov emission in silicon from perpendicular, oblique, and parallel boundaries Physical Review B - Condensed Matter and Materials Physics. 81. DOI: 10.1103/Physrevb.81.195315 |
0.571 |
|
2008 |
Yurtsever A, Couillard M, Muller DA. Formation of guided Cherenkov radiation in silicon-based nanocomposites. Physical Review Letters. 100: 217402. PMID 18518632 DOI: 10.1103/Physrevlett.100.217402 |
0.503 |
|
2008 |
Couillard M, Yurtsever A, Muller DA. Competition between bulk and interface plasmonic modes in valence electron energy-loss spectroscopy of ultrathinSiO2gate stacks Physical Review B. 77. DOI: 10.1103/Physrevb.77.085318 |
0.594 |
|
2007 |
Yurtsever A, Couillard M, Muller D. Surface Guided Modes and Accurate Thickness Measurements by Monochromated Fast Electrons Microscopy and Microanalysis. 13. DOI: 10.1017/S143192760707835X |
0.564 |
|
2007 |
Couillard M, Yurtsever A, Muller D. Competition between Interface and Bulk Modes in Valence EELS of Thin Films Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607073758 |
0.484 |
|
2006 |
Yurtsever A, Weyland M, Muller DA. Three-dimensional imaging of nonspherical silicon nanoparticles embedded in silicon oxide by plasmon tomography Applied Physics Letters. 89: 151920. DOI: 10.1063/1.2360906 |
0.479 |
|
2006 |
Yurtsever A, Weyland M, Muller D. 3-D Imaging of Non-Spherical Silicon Nanoparticles Embedded in Silicon Oxide by Plasmon Tomography Microscopy and Microanalysis. 12: 532-533. DOI: 10.1017/S1431927606068309 |
0.459 |
|
2006 |
Weyland M, Yurtsever A, Ercius P, Muller D. Uncovering Nanoscale Chemical Variations in the Third Dimension; Electron Tomography in the Analytical Mode Microscopy and Microanalysis. 12: 1388-1389. DOI: 10.1017/S1431927606065147 |
0.58 |
|
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