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S. Y. Tong - Publications

Affiliations: 
Physics University of Wisconsin, Milwaukee 
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Year Citation  Score
2019 Chen Y, Tong SY, Kim JS, Kesmodel LL, Rodach T, Bohnen KP, Ho KM. Characterization of surface phonons on Cu(001) and Ag(001): First-principles phonon calculations with experimental and theoretical studies of high-resolution electron-energy-loss spectra. Physical Review. B, Condensed Matter. 44: 11394-11401. PMID 9999263 DOI: 10.1103/Physrevb.44.11394  0.357
2019 Chen Y, Wu ZQ, Xu ML, Tong SY, Ho K, Wang X. Characterization of surface and resonance phonons for the Ni(001)-c(2 x 2) system. Physical Review. B, Condensed Matter. 37: 9978-9984. PMID 9944422 DOI: 10.1103/Physrevb.37.9978  0.33
2016 Xu H, Dong L, Shi X, Liu Y, Hove MAV, Lin N, Tong SY. Observation and Analysis of Ordered and Disordered Structures on the ZnO(0001) Polar Surface Journal of Physical Chemistry C. 120: 26915-26921. DOI: 10.1021/Acs.Jpcc.6B09217  0.36
2013 Ng AMC, Dong L, Ho WK, Djurišić AB, Xie MH, Wu HS, Lin N, Tong SY. Recovery of clean ordered (1 1 1) surface of etched silicon Applied Surface Science. 282: 156-160. DOI: 10.1016/J.Apsusc.2013.05.092  0.325
2008 Gavaza GM, Yu ZX, Hove MAV, Tong SY. Theory of low-energy electron diffraction for nanomaterials?subclusters, automated searches Journal of Physics: Condensed Matter. 20: 304202. DOI: 10.1088/0953-8984/20/30/304202  0.339
2007 Gavaza GM, Yu ZX, Tsang L, Chan CH, Tong SY, Van Hove MA. Theory of low-energy electron diffraction for detailed structural determination of nanomaterials: Finite-size and disordered structures Physical Review B. 75. DOI: 10.1103/Physrevb.75.235403  0.313
2007 Wu H, Wang J, So R, Tong SY. Multi-slice finite difference method for full potential calculation of low energy electron diffraction spectra Journal of Physics: Condensed Matter. 19: 386203. DOI: 10.1088/0953-8984/19/38/386203  0.311
2007 Yu ZX, Hove MAV, Tong SY, Wisbey D, Losovyj YB, Wu N, Manno M, Wang L, Leighton C, Mei WN, Dowben PA. The structure of the CoS2 (100)-(1 ? 1) surface Journal of Physics: Condensed Matter. 19: 249001. DOI: 10.1088/0953-8984/19/24/249001  0.324
2006 Shi BM, Xie MH, Wu HS, Wang N, Tong SY. Transition between wurtzite and zinc-blende GaN: An effect of deposition condition of molecular-beam epitaxy Applied Physics Letters. 89: 151921. DOI: 10.1063/1.2360916  0.302
2005 Zhang RQ, Lifshitz Y, Ma DDD, Zhao YL, Frauenheim T, Lee ST, Tong SY. Structures and energetics of hydrogen-terminated silicon nanowire surfaces. Journal of Chemical Physics. 123: 144703-144703. PMID 16238412 DOI: 10.1063/1.2047555  0.346
2005 Liu Y, Xie MH, Cao YG, Wu HS, Tong SY. A study of InxGa1−xN growth by reflection high-energy electron diffraction Journal of Applied Physics. 97: 23502. DOI: 10.1063/1.1840101  0.349
2004 Xie MH, Zheng LX, Dai XQ, Wu HS, Tong SY. A model for GaN `ghost' islands Surface Science. 558: 195-200. DOI: 10.1016/J.Susc.2004.04.003  0.331
2002 Xie MH, Cheung SH, Zheng LX, Tong SY, Zhang BS, Yang H. GROWTH AND STRUCTURAL PROPERTIES OF GaN FILMS ON FLAT AND VICINAL SiC(0001) SUBSTRATES International Journal of Modern Physics B. 16: 165-172. DOI: 10.1142/S0217979202009603  0.305
2002 Tong SY, Wu H. Direct inversion of low-energy electron diffraction (LEED) IV spectra: the surface Patterson function* Journal of Physics: Condensed Matter. 14: 1231-1236. DOI: 10.1088/0953-8984/14/6/310  0.37
2001 Altman MS, Chung WF, He ZQ, Poon HC, Tong SY. Quantum size effect in low energy electron diffraction of thin films Applied Surface Science. 169: 82-87. DOI: 10.1016/S0169-4332(00)00644-9  0.348
2001 Zheng LX, Xie MH, Xu SJ, Cheung SH, Tong SY. Current-induced migration of surface adatoms during GaN growth by molecular beam epitaxy Journal of Crystal Growth. 227: 376-380. DOI: 10.1016/S0022-0248(01)00727-8  0.303
2000 Xie MH, Seutter SM, Zheng LX, Cheung SH, Ng YF, Wu H, Tong SY. Surface Morphology of GaN: Flat versus Vicinal Surfaces Mrs Internet Journal of Nitride Semiconductor Research. 5: 174-180. DOI: 10.1557/S1092578300004245  0.313
2000 Tong SY. Why is the positron an ideal particle for studying surface structure Surface Science. 457. DOI: 10.1016/S0039-6028(00)00469-6  0.384
1999 Xie MH, Seutter SM, Zheng LX, Cheung SH, Ng YF, Wu H, Tong SY. Surface morphology of GaN: Flat versus vicinal surfaces Mrs Proceedings. 595. DOI: 10.1557/Proc-595-F99W3.29  0.36
1999 Tong SY. Inversion of low-energy electron diffraction data with no pre-knowledge factor beyond optical holography Advances in Physics. 48: 135-165. DOI: 10.1080/000187399243473  0.393
1999 Tong SY. Advances in direct and diffraction methods for surface structural determination Surface Science. 433: 32-39. DOI: 10.1016/S0039-6028(99)00082-5  0.346
1998 Poon HC, Tong SY, Chung WF, Altman MS. Low Energy Electron Diffraction Analysis of Ultrathin Ag Films on W(110) Surface Review and Letters. 5: 1143-1149. DOI: 10.1142/S0218625X9800147X  0.339
1998 Tong SY, Mok CW, Wu H, Xin LZ. Role of scattering-factor anisotropy in electron, positron, and photon holography Physical Review B. 58: 10815-10822. DOI: 10.1103/Physrevb.58.10815  0.325
1997 Tong SY, Chu TP, Wu H, Huang H. Low-Energy Electron Holograms: Properties And Method Of Inversion Surface Review and Letters. 4: 459-467. DOI: 10.1142/S0218625X97000444  0.32
1996 Giergiel J, Pang AW, Hopster H, Guo X, Tong SY, Weller D. Erratum: Surface structure of epitaxial Gd(0001) films on W(110) studied by quantitative LEED analysis Physical Review. B, Condensed Matter. 54: 17223. PMID 9985859 DOI: 10.1103/Physrevb.54.17223  0.307
1995 Giergiel J, Pang AW, Hopster H, Guo X, Tong SY, Weller D. Surface structure of epitaxial Gd(0001) films on W(110) studied by quantitative LEED analysis. Physical Review. B, Condensed Matter. 51: 10201-10204. PMID 9977704 DOI: 10.1103/Physrevb.51.10201  0.324
1995 Tobin JG, Waddill GD, Li H, Tong SY. Photoelectron diffraction imaging of a surface alloy Surface Science. 334: 263-275. DOI: 10.1016/0039-6028(95)00437-8  0.36
1994 Tong SY, Li H, Huang H. Surface Crystallography by Inverting Diffraction Spectra Surface Review and Letters. 1: 303-318. DOI: 10.1142/S0218625X9400031X  0.358
1994 Zhao TC, Tong SY, Ignatiev A. Determination Of Linear-Chain Multiple Bound State Resonances In Reflection High-Energy Electron Diffraction Surface Review and Letters. 1: 261-271. DOI: 10.1142/S0218625X94000266  0.352
1994 Tong SY, Chen Y, Bohnen KP, Rodach T, Ho KM. The Structure And Lattice Dynamics Of Unreconstructed Fcc (001) And (111) Metal Surfaces Surface Review and Letters. 1: 97-107. DOI: 10.1142/S0218625X94000126  0.365
1994 Tong SY. Electron-diffraction for surface studies - the first 30 years Surface Science. 299: 358-374. DOI: 10.1016/0039-6028(94)90667-X  0.361
1994 Over H, Gierer M, Bludau H, Ertl G, Tong SY. Fingerprinting technique in low-energy electron diffraction Surface Science. 314: 243-268. DOI: 10.1016/0039-6028(94)90010-8  0.579
1993 Tobin JG, Waddill GD, Li H, Tong SY. Imaging of a surface alloy with energy-dependent photoelectron holography. Physical Review Letters. 70: 4150-4153. PMID 10054059 DOI: 10.1103/Physrevlett.70.4150  0.36
1993 Over H, Huang H, Tong SY, Fan WC, Ignatiev A. Low-energy electron diffraction as a direct identification technique: Atomic structures of Ag- and Li-induced Si(111)-( sqrt 3 x sqrt 3 )R30 degrees. Physical Review. B, Condensed Matter. 48: 15353-15357. PMID 10008075 DOI: 10.1103/PHYSREVB.48.15353  0.509
1992 Tong SY, Huang H, Guo XQ. Low-energy electron and low-energy positron holography. Physical Review Letters. 69: 3654-3657. PMID 10046879 DOI: 10.1103/Physrevlett.69.3654  0.369
1992 Tong SY, Li H, Huang H. Principles of energy extension in electron-emission holography. Physical Review B. 46: 4155-4171. PMID 10004146 DOI: 10.1103/Physrevb.46.4155  0.344
1992 Wei CM, Tong SY. Direct atomic structure by holographic diffuse LEED Surface Science. 274. DOI: 10.1016/0039-6028(92)90828-T  0.351
1991 Chen Y, Tong SY, Rocca M, Moretto P, Valbusa U, Bohnen KP, Ho KM. High-resolution electron energy-loss spectroscopy analysis of Ag(001): discovery of a new surface longitudinal mode using first-principles phonon calculations Surface Science. 250. DOI: 10.1016/0039-6028(91)90702-T  0.382
1990 Erskine JL, Chen Y, Jeong EJ, Tong SY, Yater J. Detection of odd symmetry shear modes at metal surfaces by inelastic electron scattering: Experiment and theory Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 2649-2652. DOI: 10.1116/1.576687  0.367
1989 Bartynski RA, Heskett D, Garrison K, Watson G, Zehner DM, Mei WN, Tong SY, Pan X. The first interlayer spacing of Ta(100) determined by photoelectron diffraction Journal of Vacuum Science & Technology a: Vacuum, Surfaces, and Films. 7: 1931-1936. DOI: 10.1116/1.575988  0.333
1989 Chen Y, Wu ZQ, Tong SY, Black JE. A comparison of green's function and slab methods of calculating surface vibration spectral densities: p(2 × 2)O on Ni(100) as an example Surface Science. 210: 271-281. DOI: 10.1016/0039-6028(89)90116-7  0.314
1988 Tong SY, Huang H, Wei CM, Packard WE, Men FK, Glander G, Webb MB. Low-energy electron diffraction analysis of the Si(111)7 X 7 structure Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 6: 615-624. DOI: 10.1116/1.575179  0.362
1988 Jamison KD, Zhou DN, Cohen PI, Zhao TC, Tong SY. Surface structure analysis using reflection high‐energy electron diffraction Journal of Vacuum Science and Technology. 6: 611-614. DOI: 10.1116/1.575178  0.392
1988 Huang H, Tong SY, Packard WE, Webb MB. Atomic geometry of Si(111) 7×7 by dynamical low-energy electron diffraction Physics Letters A. 130: 166-170. DOI: 10.1016/0375-9601(88)90422-7  0.335
1988 Tong SY, Zhao TC, Poon HC, Jamison KD, Zhou DN, Cohen PI. Multiple scattering analysis of reflection high-energy electron diffraction intensities from GaAs(110) Physics Letters A. 128: 447-450. DOI: 10.1016/0375-9601(88)90128-4  0.405
1988 Zhao TC, Tong SY. Dynamical calculation of RHEED rocking curves for Ag(001) and Pt(111) Ultramicroscopy. 26: 151-159. DOI: 10.1016/0304-3991(88)90387-7  0.306
1986 Poon HC, Snider D, Tong SY. Small-atom approximation in forward- and back-scattering photoelectron spectroscopies Physical Review B. 33: 2198-2206. DOI: 10.1103/Physrevb.33.2198  0.315
1986 Mills DL, Tong SY. Theoretical aspects of electron energy loss spectroscopy Philosophical Transactions of the Royal Society A. 318: 179-198. DOI: 10.1098/Rsta.1986.0070  0.352
1985 Nagano S, Tong SY. Multiple-scattering theory of low-energy electron diffraction for a nonspherical scattering potential. Physical Review B. 32: 6562-6570. PMID 9936761 DOI: 10.1103/Physrevb.32.6562  0.322
1985 Xu ML, Hall BM, Tong SY, Rocca M, Ibach H, Lehwald S, Black JE. Energy dependence of inelastic electron scattering cross section by surface vibrations: Experimental measurement and theoretical interpretation Physical Review Letters. 54: 1171-1174. DOI: 10.1103/Physrevlett.54.1171  0.342
1985 Puga MW, Xu G, Tong SY. The surface geometry of GaAs(110) Surface Science. 164. DOI: 10.1016/0167-2584(85)90561-4  0.364
1984 Tong SY, Mei WN, Xu G. The geometric structures of the GaAs(111) and (110) surfaces Journal of Vacuum Science & Technology B. 2: 393-398. DOI: 10.1116/1.582831  0.368
1984 Poon HC, Tong SY. Focusing and diffraction effects in angle-resolved x-ray photoelectron spectroscopy Physical Review B. 30: 6211-6213. DOI: 10.1103/Physrevb.30.6211  0.323
1984 Tong SY. Exploring surface structure Physics Today. 37: 50-59. DOI: 10.1063/1.2916351  0.321
1983 Hall BM, Tong SY, Mills DL. Large-angle electron-energy-loss spectroscopy with the inclusion of a surface image potential Physical Review Letters. 50: 1277-1280. DOI: 10.1103/Physrevlett.50.1277  0.363
1981 Hall BM, Tong SY. IMAGE POTENTIAL BARRIER FOR LARGE ANGLE INELASTIC ELECTRON SCATTERING FROM SURFACES Journal of Vacuum Science &Amp; Technology. 20: 578-579. DOI: 10.1116/1.571392  0.359
1981 Tong SY, Li CH. Diffraction effects in angle-resolved photoemission spectroscopy Critical Reviews in Solid State and Materials Sciences. 10: 209-231. DOI: 10.1080/10408438108243634  0.376
1979 Mrstik BJ, Tong SY, Hove MAV. Atomic structure of clean and arsenic-covered GaAs(110) surfaces Journal of Vacuum Science and Technology. 16: 1258-1261. DOI: 10.1116/1.570137  0.351
1978 Tong SY, Maldonado AL. The structure of Si(OOl) 2 × 1 surface - Studied by low energy electron diffraction Surface Science. 78: 459-466. DOI: 10.1016/0039-6028(78)90091-2  0.387
1977 Hove MAV, Tong SY, Elconin MH. Surface structure refinements of 2HMoS2, 2HNbSe2 and W(100)p(2 × 1)O via new reliability factors for surface crystallography Surface Science. 64: 85-95. DOI: 10.1016/0039-6028(77)90259-X  0.304
1977 Mrstik BJ, Kaplan R, Reinecke TL, Hove MV, Tong SY. Determination of the surface structure of layered compounds by low-energy electron diffraction Il Nuovo Cimento B. 38: 387-395. DOI: 10.1007/Bf02723509  0.36
1976 Hove MAV, Tong SY. Surface structures of W(110) and W(100) faces by the dynamical LEED approach Surface Science. 54: 91-100. DOI: 10.1016/0039-6028(76)90090-X  0.322
1976 Tong SY, Hove MAV. Layer iteration calculation of angle-resolved ultraviolet photoemission: c(2 × 2) oxygen overlayer on Ni(001) Solid State Communications. 19: 543-546. DOI: 10.1016/0038-1098(76)90062-4  0.339
1975 Tong SY. Theory of low-energy electron diffraction Progress in Surface Science. 7: 1-48. DOI: 10.1016/0079-6816(75)90010-6  0.313
1975 Tong SY. Layer iteration calculation of low-energy electron-diffraction by Beeby's multiple scattering method Solid State Communications. 16: 91-94. DOI: 10.1016/0038-1098(75)90797-8  0.331
1975 Mrstik BJ, Tong SY, Kaplan R, Ganguly AK. Accurate interpretation of LEED intensity spectra of a layered transition-metal dichalcogenide compound Solid State Communications. 17: 755-758. DOI: 10.1016/0038-1098(75)90402-0  0.333
1974 Ignatiev A, Rhodin TN, Tong SY. Low energy electron diffraction study of the krypton (111) surface Surface Science. 42: 37-49. DOI: 10.1016/0039-6028(74)90004-1  0.396
1973 Tong SY, Rhodin TN, Ignatiev A. Layer-dependent surface mean-square vibration amplitudes by low-energy-electron diffraction Physical Review B. 8: 906-913. DOI: 10.1103/Physrevb.8.906  0.353
1973 Tong SY, Rhodin TN, Tait RH. Application of the t-matrix perturbation method to the analysis of low-energy-electron-diffraction spectra for aluminum Physical Review B. 8: 430-440. DOI: 10.1103/Physrevb.8.430  0.312
1973 Tong SY, Rhodin TN, Tait RH. t-matrix approach in low-energy-electron diffraction Physical Review B. 8: 421-430. DOI: 10.1103/Physrevb.8.421  0.314
1973 Tong SY, Rhodin TN, Tait RH. t-Matrix formalism of low-energy electron-diffraction for clean and overlayer systems Surface Science. 34: 457-464. DOI: 10.1016/0039-6028(73)90130-1  0.304
1972 Ignatjevs A, Rhodin TN, Tong SY, Lundqvist BI, Pendry JB. LEED Thermal Scattering Studies of Xe (111) Surfaces Journal of Vacuum Science and Technology. 9: 720-720. DOI: 10.1116/1.1317761  0.305
1972 Tait RH, Tong SY, Rhodin TN. New perturbative approach to the application of low-energy electron diffraction-the t-matrix formalism Physical Review Letters. 28: 553-556. DOI: 10.1103/Physrevlett.28.553  0.303
1971 Tong SY, Rhodin TN. Interpretation of low-energy electron-diffraction spectra for a free-electron metal in terms of multiple scattering involving strong inelastic damping Physical Review Letters. 26: 711-715. DOI: 10.1103/Physrevlett.26.711  0.339
1971 Ignatjevs A, Rhodin TN, Tong SY, Lundqvist BI, Pendry JB. LEED spectra study of temperature effects in crystalline xenon surfaces Solid State Communications. 9: 1851-1855. DOI: 10.1016/0038-1098(71)90105-0  0.337
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