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Han Li, Ph.D - Publications

Affiliations: 
2005-2010 SEAS Harvard University, Cambridge, MA, United States 
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27 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2023 Zhang Y, Yang Q, Liu Y, Hu A, Zhang D, Li H, Yu J, Huang J, Lu Y, Zhang L, Xue Q, Li Y, Jin L, Wen Q, Zhang H. Structural and magnetic properties of Y(GaAlFe)O liquid-phase epitaxy films with low ferromagnetic resonance losses. Acta Crystallographica Section B, Structural Science, Crystal Engineering and Materials. PMID 36920874 DOI: 10.1107/S2052520623000483  0.301
2020 Cuddalorepatta GK, Li H, Pantuso D, Vlassak JJ. Measurement of the stress-strain behavior of freestanding ultra-thin films Materialia. 9: 100502. DOI: 10.1016/J.Mtla.2019.100502  0.588
2019 Nordell BJ, Nguyen TD, Caruso AN, Lanford WA, Henry P, Li H, Ross LL, King SW, Paquette MM. Topological Constraint Theory Analysis of Rigidity Transition in Highly Coordinate Amorphous Hydrogenated Boron Carbide Frontiers in Materials. 6. DOI: 10.3389/Fmats.2019.00264  0.309
2019 Cuddalorepatta GK, Sim G, Li H, Pantuso D, Vlassak JJ. Residual stress–driven test technique for freestanding ultrathin films: Elastic behavior and residual strain Journal of Materials Research. 34: 3474-3482. DOI: 10.1557/Jmr.2019.278  0.664
2015 Klepper KB, Miikkulainen V, Nilsen O, Fjellvåg H, Liu M, Dutta D, Gidley D, Lanford W, Ross L, Li H, King SW. Atomic Layer Deposited Hybrid Organic-Inorganic Aluminates as Potential Low-k Dielectric Materials Mrs Proceedings. 1791: 15-20. DOI: 10.1557/Opl.2015.519  0.361
2015 Li H, Iqbal A, Brooks JD. Modulating crack propagation in a multilayer stack with a super-layer Journal of Materials Research. 30: 3065-3070. DOI: 10.1557/Jmr.2015.252  0.334
2015 Miikkulainen V, Nilsen O, Li H, King SW, Laitinen M, Sajavaara T, Fjellvåg H. Atomic layer deposited lithium aluminum oxide: (In)dependency of film properties from pulsing sequence Journal of Vacuum Science and Technology. 33. DOI: 10.1116/1.4890006  0.38
2015 Nordell BJ, Karki S, Nguyen TD, Rulis P, Caruso AN, Purohit SS, Li H, King SW, Dutta D, Gidley D, Lanford WA, Paquette MM. The influence of hydrogen on the chemical, mechanical, optical/electronic, and electrical transport properties of amorphous hydrogenated boron carbide Journal of Applied Physics. 118. DOI: 10.1063/1.4927037  0.339
2015 Li H, Lin K, Ege C. Buffer layer structure for measuring the elastic properties of brittle thin films by nanoindentation with application on nanoporous low-k dielectrics Journal of Applied Physics. 117. DOI: 10.1063/1.4915945  0.405
2014 Koh D, Yum JH, Banerjee SK, Hudnall TW, Bielawski C, Lanford WA, French BL, French M, Henry P, Li H, Kuhn M, King SW. Investigation of atomic layer deposited Beryllium oxide material properties for high-k dielectric applications Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 32. DOI: 10.1116/1.4867436  0.352
2014 Trueba M, Gonzalez D, Martínez-Esnaola JM, Hernandez MT, Pantuso D, Li H, Ocaña I, Elizalde MR. Fracture characterization of brittle thin-films by membrane testing Thin Solid Films. 564: 314-320. DOI: 10.1016/J.Tsf.2014.05.014  0.377
2014 Trueba M, Gonzalez D, Elizalde MR, Martínez-Esnaola JM, Hernandez MT, Li H, Pantuso D, Ocaña I. Assessment of mechanical properties of metallic thin-films through micro-beam testing Thin Solid Films. 571: 296-301. DOI: 10.1016/J.Tsf.2014.02.094  0.384
2014 King SW, Ross L, Li H, Xu G, Bielefeld J, Atkins RE, Henneghan PD, Davis K, Johnson DC, Lanford WA. Influence of hydrogen content and network connectivity on the coefficient of thermal expansion and thermal stability for a-SiC:H thin films Journal of Non-Crystalline Solids. 389: 78-85. DOI: 10.1016/J.Jnoncrysol.2014.02.007  0.335
2014 Trueba M, Gonzalez D, Martínez-Esnaola JM, Hernandez MT, Pantuso D, Li H, Elizalde MR, Ocaña I. Fracture characterization of thin-films by dual tip indentation Acta Materialia. 71: 44-55. DOI: 10.1016/J.Actamat.2014.03.011  0.393
2013 King SW, Mays E, Ege C, Hellgren N, Xu J, Li H, Boyanov B. Transmission fourier transform infra-red spectroscopy investigation of structure property relationships in low-k SiOxCy:H Dielectric thin films Materials Research Society Symposium Proceedings. 1520: 13-18. DOI: 10.1557/Opl.2012.1691  0.323
2013 Li H, Kobrinsky MJ, Shariq A, Richards J, Liu J, Kuhn M. Controlled fracture of Cu/ultralow-k interconnects Applied Physics Letters. 103: 231901. DOI: 10.1063/1.4837676  0.303
2011 Knaup JM, Li H, Vlassak JJ, Kaxiras E. Bottom-up modeling of the elastic properties of organosilicate glasses and their relation to composition and network defects Materials Research Society Symposium Proceedings. 1297: 17-22. DOI: 10.1557/Opl.2011.652  0.532
2011 Knaup JM, Li H, Vlassak JJ, Kaxiras E. Influence of CH2 content and network defects on the elastic properties of organosilicate glasses Physical Review B - Condensed Matter and Materials Physics. 83. DOI: 10.1103/Physrevb.83.054204  0.564
2011 Li H, Knaup JM, Kaxiras E, Vlassak JJ. Stiffening of organosilicate glasses by organic cross-linking Acta Materialia. 59: 44-52. DOI: 10.1016/J.Actamat.2010.08.015  0.537
2010 Knaup JM, Li H, Vlassak JJ, Kaxiras E. Elastic properties of dense organosilicate glasses dependent on the C/Si ratio Materials Science Forum. 645: 267-270. DOI: 10.4028/Www.Scientific.Net/Msf.645-648.267  0.543
2010 Li H, Randall NX, Vlassak JJ. New methods of analyzing indentation experiments on very thin films Journal of Materials Research. 25: 728-734. DOI: 10.1557/Jmr.2010.0095  0.621
2010 Karanikas CF, Li H, Vlassak JJ, Watkins JJ. Quantitative interfacial energy measurements of adhesion-promoted thin copper films by supercritical fluid deposition on barrier layers Journal of Engineering Materials and Technology, Transactions of the Asme. 132: 0210141-0210147. DOI: 10.1115/1.4000283  0.562
2009 Li H, Vlassak JJ. Determining the elastic modulus and hardness of an ultra-thin film on a substrate using nanoindentation Journal of Materials Research. 24: 1114-1126. DOI: 10.1557/Jmr.2009.0144  0.618
2009 Li H, Lin Y, Tsui TY, Vlassak JJ. The effect of porogen loading on the stiffness and fracture energy of brittle organosilicates Journal of Materials Research. 24: 107-116. DOI: 10.1557/Jmr.2009.0005  0.639
2009 Li H, Tsui TY, Vlassak JJ. Water diffusion and fracture behavior in nanoporous low- k dielectric film stacks Journal of Applied Physics. 106. DOI: 10.1063/1.3187931  0.585
2005 Li H, Ngan AHW. Indentation size effects on the strain rate sensitivity of nanocrystalline Ni–25at.%Al thin films Scripta Materialia. 52: 827-831. DOI: 10.1016/J.Scriptamat.2005.01.018  0.304
2004 Li H, Ngan AHW. Initial contact behavior of nanograined Ni-25at. % Al film during nanoindentation Mrs Proceedings. 841. DOI: 10.1557/Proc-841-R8.7  0.331
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