Jacob A. Abraham
Affiliations: | 1975-1988 | University of Illinois, Urbana-Champaign, Urbana-Champaign, IL | |
1988- | Electrical and Computer Engineering | University of Texas at Austin, Austin, Texas, U.S.A. |
Area:
Electronics and Electrical EngineeringWebsite:
https://www.ece.utexas.edu/people/faculty/jacob-abrahamGoogle:
"Jacob A. Abraham"Bio:
https://www.proquest.com/openview/6c3bc54c0eba3d7e737586e59b2a2b1f/1.pdf
Parents
Sign in to add mentorEdward J. Mccluskey | grad student | 1974 | Stanford (Computer Science Tree) | |
(Reliability Analysis of Digital Systems Protected by Massive Redundancy.) |
Children
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Publications
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Kim B, Abraham JA. (2020) Built-in Harmonic Prediction Scheme for Embedded Segmented-Data-Converters Ieee Access. 8: 7851-7860 |
Kim B, Abraham JA. (2019) Spectral Leakage-Driven Loopback Scheme for Prediction of Mixed-Signal Circuit Specifications Ieee Transactions On Industrial Electronics. 66: 586-594 |
Banerjee S, Samynathan B, Abraham J, et al. (2019) Real-Time Error Detection in Nonlinear Control Systems Using Machine Learning Assisted State-Space Encoding Ieee Transactions On Dependable and Secure Computing. 1-1 |
Cheng E, Mirkhani S, Szafaryn LG, et al. (2018) Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience) Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 37: 1839-1852 |
Fang J, Thirunakkarasu S, Yu X, et al. (2017) A 5-GS/s 10-b 76-mW Time-Interleaved SAR ADC in 28 nm CMOS Ieee Transactions On Circuits and Systems. 64: 1673-1683 |
Zahir Z, Banerjee G, Zeidan MA, et al. (2017) A multi-band low noise amplifier with strong immunity to interferers Analog Integrated Circuits and Signal Processing. 93: 13-27 |
Jang EJ, Chung J, Abraham JA. (2015) Delay defect diagnosis methodology using path delay measurements Ieice Transactions On Electronics. 991-994 |
Raja I, Banerjee G, Zeidan MA, et al. (2015) A 0.1-3.5-GHz Duty-Cycle Measurement and Correction Technique in 130-nm CMOS Ieee Transactions On Very Large Scale Integration (Vlsi) Systems |
Lee HC, Abraham JA. (2015) Digital Calibration for 8-bit Delay Line ADC Using Harmonic Distortion Correction Journal of Electronic Testing: Theory and Applications (Jetta). 31: 127-138 |
Mirkhani S, Abraham JA. (2014) Fast evaluation of test vector sets using a simulation-based statistical metric Proceedings of the Ieee Vlsi Test Symposium |