John Henry J. Scott, Ph. D.
Affiliations: | 1985-1989 | California Institute of Technology, Pasadena, CA | |
1992-1997 | Physics | Carnegie Mellon University, Pittsburgh, PA | |
1997- | National Institute of Standards and Technology, Gaithersburg, MD, United States |
Area:
electron microscopy, microanalysis, data scienceWebsite:
https://www.nist.gov/people/john-henry-j-scottGoogle:
"John Henry Scott"Mean distance: (not calculated yet)
Parents
Sign in to add mentorSara A. Majetich | grad student | 1992-1996 | Carnegie Mellon (Physics Tree) |
Dale E. Newbury | post-doc | 1997-1999 | NIST |
Children
Sign in to add traineeKonrad Rykaczewski | post-doc | (E-Tree) | |
Martin F. Hohmann-Marriott | post-doc | 2006- | NIST (Chemistry Tree) |
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Publications
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Rykaczewski K, Scott J. (2012) Best practices for quantitative in situ ESEM imaging of microscale water condensation dynamics on superhydrophobic surfaces Microscopy and Microanalysis. 18: 1136-1137 |
Rykaczewski K, Scott J. (2012) In situ Cryo-FIB/SEM imaging of frost formation and ice-substrate interface on superhydrophobic surfaces Microscopy and Microanalysis. 18: 642-643 |
Rykaczewski K, Scott J, Fedorov A. (2011) Electron Beam Heating of Water Droplets During in-situ ESEM Imaging of Condensation on Superhydrophobic Surfaces Microscopy and Microanalysis. 17: 1464-1465 |
Davis J, Scott J, Ritchie N. (2010) Developing an X-ray Imaging Strategy Microscopy and Microanalysis. 16: 908-909 |
Newbury D, Scott J, Ritchie N, et al. (2007) Advances in Energy Dispersive X-ray Spectrometry: The Impact of Silicon Drift Detectors (SDD) on the Characterization of Nanostructures and Nanomaterials Microscopy and Microanalysis. 13 |
Newbury D, Bright D, Scott J, et al. (2007) Rapid X-ray Spectrum Imaging with the Silicon Drift Detector (SDD): Microstructural Characterization with NIST Lispix Microscopy and Microanalysis. 13 |
Scott J, Ritchie N. (2006) Measuring Pixel Classification Accuracy Using Synthetic Spectrum Images Microscopy and Microanalysis. 12: 1394-1395 |