John Henry J. Scott, Ph. D.

Affiliations: 
1985-1989 California Institute of Technology, Pasadena, CA 
 1992-1997 Physics Carnegie Mellon University, Pittsburgh, PA 
 1997- National Institute of Standards and Technology, Gaithersburg, MD, United States 
Area:
electron microscopy, microanalysis, data science
Website:
https://www.nist.gov/people/john-henry-j-scott
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"John Henry Scott"
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Parents

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Sara A. Majetich grad student 1992-1996 Carnegie Mellon (Physics Tree)
Dale E. Newbury post-doc 1997-1999 NIST

Children

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Konrad Rykaczewski post-doc (E-Tree)
Martin F. Hohmann-Marriott post-doc 2006- NIST (Chemistry Tree)
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Publications

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Rykaczewski K, Scott J. (2012) Best practices for quantitative in situ ESEM imaging of microscale water condensation dynamics on superhydrophobic surfaces Microscopy and Microanalysis. 18: 1136-1137
Rykaczewski K, Scott J. (2012) In situ Cryo-FIB/SEM imaging of frost formation and ice-substrate interface on superhydrophobic surfaces Microscopy and Microanalysis. 18: 642-643
Rykaczewski K, Scott J, Fedorov A. (2011) Electron Beam Heating of Water Droplets During in-situ ESEM Imaging of Condensation on Superhydrophobic Surfaces Microscopy and Microanalysis. 17: 1464-1465
Davis J, Scott J, Ritchie N. (2010) Developing an X-ray Imaging Strategy Microscopy and Microanalysis. 16: 908-909
Newbury D, Scott J, Ritchie N, et al. (2007) Advances in Energy Dispersive X-ray Spectrometry: The Impact of Silicon Drift Detectors (SDD) on the Characterization of Nanostructures and Nanomaterials Microscopy and Microanalysis. 13
Newbury D, Bright D, Scott J, et al. (2007) Rapid X-ray Spectrum Imaging with the Silicon Drift Detector (SDD): Microstructural Characterization with NIST Lispix Microscopy and Microanalysis. 13
Scott J, Ritchie N. (2006) Measuring Pixel Classification Accuracy Using Synthetic Spectrum Images Microscopy and Microanalysis. 12: 1394-1395
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