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Gheorghe Stan, Ph.D. - Publications

Affiliations: 
2005 Colorado State University, Fort Collins, CO 
Area:
Condensed Matter Physics
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32 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2022 Stan G, Ciobanu CV, King SW. Resolving the Subsurface Structure and Elastic Modulus of Layered Films via Contact Resonance Atomic Force Microscopy. Acs Applied Materials & Interfaces. PMID 36455132 DOI: 10.1021/acsami.2c17962  0.331
2022 Stan G, Mays E, Yoo HJ, King SW. The effect of edge compliance on the contact between a spherical indenter and a high-aspect-ratio rectangular fin. Experimental Mechanics. 58. PMID 35529526 DOI: 10.1007/s11340-018-0421-4  0.313
2020 Stan G. High-speed digitization of the amplitude and frequency in open-loop sideband frequency-modulation Kelvin probe force microscopy. Nanotechnology. PMID 32516761 DOI: 10.1088/1361-6528/Ab9Af0  0.352
2020 Stan G, Ciobanu CV, Likith SRJ, Rani A, Zhang S, Hacker CA, Krylyuk S, V Davydov A. Doping of MoTe2 via surface charge-transfer in air. Acs Applied Materials & Interfaces. PMID 32192325 DOI: 10.1021/Acsami.0C04339  0.321
2019 Stan G. The effect of edge compliance on the adhesive contact between a spherical indenter and a quarter-space. International Journal of Solids and Structures. 158. PMID 33642611 DOI: 10.1016/J.Ijsolstr.2018.09.006  0.348
2019 Stan G, Mays E, Yoo HJ, King SW. Correction to: The Effect of Edge Compliance on the Contact between a Spherical Indenter and a High-Aspect-Ratio Rectangular Fin Experimental Mechanics. 1-11. DOI: 10.1007/S11340-019-00483-6  0.326
2017 Stan G, Gates RS, Hu Q, Kjoller K, Prater C, Jit Singh K, Mays E, King SW. Relationships between chemical structure, mechanical properties and materials processing in nanopatterned organosilicate fins. Beilstein Journal of Nanotechnology. 8: 863-871. PMID 28503397 DOI: 10.3762/Bjnano.8.88  0.359
2016 Stan G, Mays E, Yoo HJ, King SW. Nanoscale tomographic reconstruction of the subsurface mechanical properties of low-k high-aspect ratio patterns. Nanotechnology. 27: 485706. PMID 27804920 DOI: 10.1088/0957-4484/27/48/485706  0.416
2016 Stan G, Adams GG. Adhesive contact between a rigid spherical indenter and an elastic multi-layer coated substrate. International Journal of Solids and Structures. 87: 1-10. PMID 27574338 DOI: 10.1016/J.Ijsolstr.2016.02.043  0.301
2016 Friedman LH, Vaudin MD, Stranick SJ, Stan G, Gerbig YB, Osborn W, Cook RF. Assessing strain mapping by electron backscatter diffraction and confocal Raman microscopy using wedge-indented Si. Ultramicroscopy. 163: 75-86. PMID 26939030 DOI: 10.1016/J.Ultramic.2016.02.001  0.344
2016 Ruzmetov D, Zhang K, Stan G, Kalanyan B, Bhimanapati GR, Eichfeld SM, Burke RA, Shah PB, O'Regan TP, Crowne FJ, Birdwell AG, Robinson JA, Davydov AV, Ivanov TG. Vertical 2D/3D Semiconductor Heterostructures Based on Epitaxial Molybdenum Disulfide and Gallium Nitride. Acs Nano. PMID 26866442 DOI: 10.1021/Acsnano.5B08008  0.313
2015 Stan G, Ciobanu CV, Levin I, Yoo HJ, Myers A, Singh K, Jezewski C, Miner B, King SW. Nanoscale Buckling of Ultrathin Low-k Dielectric Lines during Hard-Mask Patterning. Nano Letters. 15: 3845-50. PMID 25950850 DOI: 10.1021/Acs.Nanolett.5B00685  0.349
2014 Stan G, Gates RS. Intermittent contact resonance atomic force microscopy. Nanotechnology. 25: 245702. PMID 24858092 DOI: 10.1088/0957-4484/25/24/245702  0.406
2014 Stan G, Solares SD. Frequency, amplitude, and phase measurements in contact resonance atomic force microscopies. Beilstein Journal of Nanotechnology. 5: 278-88. PMID 24778949 DOI: 10.3762/Bjnano.5.30  0.361
2014 Stan G, Solares SD, Pittenger B, Erina N, Su C. Nanoscale mechanics by tomographic contact resonance atomic force microscopy. Nanoscale. 6: 962-9. PMID 24287978 DOI: 10.1039/C3Nr04981G  0.417
2014 Stan G, Gates RS, Kavuri P, Torres J, Michalak D, Ege C, Bielefeld J, King SW. Mechanical property changes in porous low- k dielectric thin films during processing Applied Physics Letters. 105. DOI: 10.1063/1.4898351  0.345
2013 King SW, Bielefeld J, Xu G, Lanford WA, Matsuda Y, Dauskardt RH, Kim N, Hondongwa D, Olasov L, Daly B, Stan G, Liu M, Dutta D, Gidley D. Influence of network bond percolation on the thermal, mechanical, electrical and optical properties of high and low-k a-SiC:H thin films Journal of Non-Crystalline Solids. 379: 67-79. DOI: 10.1016/J.Jnoncrysol.2013.07.028  0.31
2012 Stan G, King SW, Cook RF. Nanoscale mapping of contact stiffness and damping by contact resonance atomic force microscopy. Nanotechnology. 23: 215703. PMID 22551825 DOI: 10.1088/0957-4484/23/21/215703  0.429
2012 Stan G, Krylyuk S, Davydov AV, Levin I, Cook RF. Ultimate bending strength of Si nanowires. Nano Letters. 12: 2599-604. PMID 22494191 DOI: 10.1021/Nl300957A  0.345
2012 King SW, Antonelli GA, Stan G, Cook RF, Sooryakumar R. Advances in metrology for the determination of young's modulus for low-k dielectric thin films Proceedings of Spie - the International Society For Optical Engineering. 8466. DOI: 10.1117/12.930482  0.36
2012 Williams EH, Davydov AV, Motayed A, Sundaresan SG, Bocchini P, Richter LJ, Stan G, Steffens K, Zangmeister R, Schreifels JA, Rao MV. Immobilization of streptavidin on 4H-SiC for biosensor development Applied Surface Science. 258: 6056-6063. DOI: 10.1016/J.Apsusc.2012.02.137  0.342
2011 Vaudin MD, Stan G, Gerbig YB, Cook RF. High resolution surface morphology measurements using EBSD cross-correlation techniques and AFM. Ultramicroscopy. 111: 1206-1213. PMID 21763237 DOI: 10.1016/J.Ultramic.2011.01.039  0.415
2011 Delrio FW, Rampulla DM, Jaye C, Stan G, Gates RS, Fischer DA, Cook RF. Structure-property relationships for methyl-terminated alkyl self-assembled monolayers Chemical Physics Letters. 512: 243-246. DOI: 10.1016/J.Cplett.2011.07.045  0.335
2009 Stan G, Ciobanu CV, Thayer TP, Wang GT, Creighton JR, Purushotham KP, Bendersky LA, Cook RF. Elastic moduli of faceted aluminum nitride nanotubes measured by contact resonance atomic force microscopy. Nanotechnology. 20: 035706. PMID 19417308 DOI: 10.1088/0957-4484/20/3/035706  0.403
2009 Stan G, Krylyuk S, Davydov AV, Vaudin MD, Bendersky LA, Cook RF. Contact-resonance atomic force microscopy for nanoscale elastic property measurements: Spectroscopy and imaging. Ultramicroscopy. 109: 929-936. PMID 19361926 DOI: 10.1016/J.Ultramic.2009.03.025  0.434
2009 Stan G, King SW, Cook RF. Elastic modulus of low- k dielectric thin films measured by load-dependent contact-resonance atomic force microscopy Journal of Materials Research. 24: 2960-2964. DOI: 10.1557/Jmr.2009.0357  0.384
2008 Stan G, Cook RF. Mapping the elastic properties of granular Au films by contact resonance atomic force microscopy Nanotechnology. 19: 235701. PMID 21825800 DOI: 10.1088/0957-4484/19/23/235701  0.407
2008 Field SB, Stan G. Chaotic dynamics of driven flux drops: a superconducting "dripping faucet". Physical Review Letters. 100: 077001. PMID 18352586 DOI: 10.1103/Physrevlett.100.077001  0.563
2008 Stan G, Krylyuk S, Davydov A, Vaudin MD, Bendersky LA, Cook RF. Surface effects on the elastic modulus of Te nanowires Applied Physics Letters. 92: 241908. DOI: 10.1063/1.2945285  0.417
2007 Stan G, Ciobanu CV, Parthangal PM, Cook RF. Diameter-dependent radial and tangential elastic moduli of ZnO nanowires Nano Letters. 7: 3691-3697. DOI: 10.1021/Nl071986E  0.42
2006 Stan G, Price WJ. Quantitative measurements of indentation moduli by atomic force acoustic microscopy using a dual reference method Review of Scientific Instruments. 77: 103707. DOI: 10.1063/1.2360971  0.388
2004 Stan G, Field SB, Martinis JM. Critical field for complete vortex expulsion from narrow superconducting strips. Physical Review Letters. 92: 097003. PMID 15089502 DOI: 10.1103/Physrevlett.92.097003  0.565
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