Simon R. Schultz

Imperial College, London, London, England, United Kingdom 
theoretical neuroscience, biophysics
"Simon Schultz"
Mean distance: 12.2 (cluster 17)
Cross-listing: Chemistry Tree


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Edmund Rolls grad student 1995-1998 Oxford
J Anthony Movshon post-doc 1999-2003 NYU
Michael Häusser post-doc 2003-2004 UCL
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Márton CD, Schultz SR, Averbeck BB. (2020) Learning to select actions shapes recurrent dynamics in the corticostriatal system. Neural Networks : the Official Journal of the International Neural Network Society. 132: 375-393
Quicke P, Howe CL, Song P, et al. (2020) Subcellular resolution three-dimensional light-field imaging with genetically encoded voltage indicators. Neurophotonics. 7: 035006
Quicke P, Song C, McKimm EJ, et al. (2019) Single-Neuron Level One-Photon Voltage Imaging With Sparsely Targeted Genetically Encoded Voltage Indicators. Frontiers in Cellular Neuroscience. 13: 39
Annecchino LA, Schultz SR. (2018) Progress in automating patch clamp cellular physiology. Brain and Neuroscience Advances. 2: 2398212818776561
Muzzu T, Mitolo S, Gava GP, et al. (2018) Encoding of locomotion kinematics in the mouse cerebellum. Plos One. 13: e0203900
Reynolds S, Abrahamsson T, Sjöström PJ, et al. (2018) CosMIC: A Consistent Metric for Spike Inference from Calcium Imaging. Neural Computation. 1-31
Jarvis S, Nikolic K, Schultz SR. (2018) Neuronal gain modulability is determined by dendritic morphology: A computational optogenetic study. Plos Computational Biology. 14: e1006027
Schuck R, Go MA, Garasto S, et al. (2017) Multiphoton minimal inertia scanning for fast acquisition of neural activity signals. Journal of Neural Engineering
Annecchino LA, Morris AR, Copeland CS, et al. (2017) Robotic Automation of In Vivo Two-Photon Targeted Whole-Cell Patch-Clamp Electrophysiology. Neuron. 95: 1048-1055.e3
Schultz SR, Copeland CS, Foust AJ, et al. (2017) Advances in two photon scanning and scanless microscopy technologies for functional neural circuit imaging. Proceedings of the Ieee. Institute of Electrical and Electronics Engineers. 105: 139-157
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