Israel Koren

Affiliations: 
Electrical & Computer Engineering University of Massachusetts, Amherst, Amherst, MA 
Area:
Environmental Engineering
Website:
https://www.computer.org/csdl/journal/tc/2006/09/t1073/13rRUNvyasx#:~:text=formal%20languages%20theory.-,Israel%20Koren,-(S%2772%2DM
Google:
"Israel Koren"
Bio:

https://ieeexplore.ieee.org/iel5/92/32193/01498831.pdf Israel Koren (M’75–SM’87–F’91) received the B.Sc., M.Sc., and D.Sc. degrees from the Technion—Israel Institute of Technology, Haifa, Israel, in 1967, 1970, and 1975, respectively, all in electrical engineering.

Cross-listing: Envirotree

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Publications

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Xu S, Koren I, Krishna CM. (2020) Enhancing dependability and energy efficiency of cyber-physical systems by dynamic actuator derating Sustainable Computing: Informatics and Systems. 28: 100411
Ravi N, Krishna CM, Koren I. (2019) Enhancing Vehicular Anonymity in ITS: A New Scheme for Mix Zones and Their Placement Ieee Transactions On Vehicular Technology. 68: 10372-10381
Xu Y, Koren I, Krishna CM. (2017) AdaFT: A Framework for Adaptive Fault Tolerance for Cyber-Physical Systems Acm Transactions in Embedded Computing Systems. 16: 79
Chhablani M, Koren I, Krishna CM. (2016) Online inertia-based temperature estimation for reliability enhancement Journal of Low Power Electronics. 12: 159-171
Srinivasan S, Kurella N, Koren I, et al. (2016) Exploring heterogeneity within a core for improved power efficiency Ieee Transactions On Parallel and Distributed Systems. 27: 1057-1069
Rodrigues R, Koren I, Kundu S. (2015) Does the sharing of execution units improve performance/power of multicores? Acm Transactions On Embedded Computing Systems. 14
Chapman GH, Thomas R, Koren Z, et al. (2015) Enhanced correction methods for high density hot pixel defects in digital imagers Proceedings of Spie - the International Society For Optical Engineering. 9403
Chapman GH, Thomas R, Koren Z, et al. (2014) Correcting high-density hot pixel defects in digital imagers Proceedings of Spie - the International Society For Optical Engineering. 9022
Wimer S, Koren I. (2014) Design flow for flip-flop grouping in data-driven clock gating Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 22: 771-778
Barenghi A, Hocquet C, Bol D, et al. (2014) A combined design-time/test-time study of the vulnerability of sub-threshold devices to low voltage fault attacks Ieee Transactions On Emerging Topics in Computing. 2: 107-118
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