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Prashant Singh, Ph.D.

Affiliations: 
2011 University of Michigan, Ann Arbor, Ann Arbor, MI 
Area:
Electronics and Electrical Engineering
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"Prashant Singh"
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Parents

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David Blaauw grad student 2011 University of Michigan
 (On-chip NBTI and Gate-Oxide-Degradation Sensing and Dynamic Management in VLSI circuits.)

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Publications

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Singh P, Karl E, Blaauw D, et al. (2012) Compact Degradation Sensors for Monitoring NBTI and Oxide Degradation Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 20: 1645-1655
Singh P, Zhuo C, Blaauw D, et al. (2009) Sensor-driven reliability and wearout management Ieee Design and Test of Computers. 26: 40-48
Singh P, Seo JS, Blaauw D, et al. (2008) Self-timed regenerators for high-speed and low-power on-chip global interconnect Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 16: 673-677
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