Shamachary Sathish
Affiliations: | Mechanical Engineering | University of Dayton, Dayton, OH, United States |
Area:
Materials Science Engineering, Mechanical EngineeringGoogle:
"Shamachary Sathish"
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Publications
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| Cherry M, Dierken J, Boehnlein T, et al. (2018) Impulse excitation scanning acoustic microscopy for local quantification of Rayleigh surface wave velocity using B-scan analysis. The Review of Scientific Instruments. 89: 013706 |
| Sathish S, Welter JT, Schehl N, et al. (2014) Noncontact acousto-thermal evaluation of evolving fatigue damage in polycrystalline Ti-6Al-4V Journal of Applied Physics. 115 |
| Sathish S, Welter JT, Jata KV, et al. (2012) Development of nondestructive non-contact acousto-thermal evaluation technique for damage detection in materials. The Review of Scientific Instruments. 83: 095103 |
| Welter JT, Sathish S, Dierken JM, et al. (2012) Broadband aperiodic air coupled ultrasonic lens Applied Physics Letters. 100 |
| Welter JT, Sathish S, Christensen DE, et al. (2011) Focusing of longitudinal ultrasonic waves in air with an aperiodic flat lens. The Journal of the Acoustical Society of America. 130: 2789-96 |
| Nalladega V, Sathish S, Murray T, et al. (2011) Experimental investigation of interaction of very low frequency electromagnetic waves with metallic nanostructure Journal of Applied Physics. 109 |
| Nalladega V, Sathish S, Abburi S, et al. (2011) Characterization of fatigue fracture in Ni-20 pct Cr alloys using white light interference microscopy and scanning probe microscopy Metallurgical and Materials Transactions a: Physical Metallurgy and Materials Science. 42: 1073-1088 |
| Nalladega V, Sathish S, Murray T, et al. (2010) Experimental investigation of low frequency electromagnetic wave interaction with metallic nanoparticles Studies in Applied Electromagnetics and Mechanics. 33: 87-94 |
| Nalladega V, Sathish S, Gigliotti M, et al. (2010) Characterization of magnetoelastic properties at nanoscale using atomic force microscopy Studies in Applied Electromagnetics and Mechanics. 33: 215-222 |
| Nalladega V, Sathish S, Jata K, et al. (2009) High resolution eddy current atomic force microscopy: Development, theoretical modeling and application Studies in Applied Electromagnetics and Mechanics. 32: 115-122 |