Rayan M. Al-Assaad, Ph.D.

Affiliations: 
2006 University of Texas at Dallas, Richardson, TX, United States 
Area:
Optics Physics, Electronics and Electrical Engineering
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Parents

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Dale M. Byrne grad student 2006 UT Dallas
 (Scatterometry for semiconductor sub-micrometer and nanometer critical dimension metrology.)
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Publications

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Al-Assaad RM. (2008) Physical characterization of nanoimprinted polymer nanostructures using visible light angular scatterometry Journal of Micro/Nanolithography, Mems, and Moems. 7: 013008
Al-Assaad RM, Tao L, Hu W. (2007) Visible light angular scatterometry for nanolithography Proceedings of Spie. 6518: 651839
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