Eleni Dokou, Ph.D. - Publications
Affiliations: | 2001 | University of Delaware, Newark, DE, United States |
Area:
Heterogeneous catalysisYear | Citation | Score | |||
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2002 | Dokou E, Zhang L, Barteau MA. Comparison of atomic force microscopy imaging methods and roughness determinations for a highly polished quartz surface Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 20: 2183-2186. DOI: 10.1116/1.1513633 | 0.497 | |||
2001 | Dokou E, Barteau MA, Wagner NJ, Lenhoff AM. Effect of Gravity on Colloidal Deposition Studied by Atomic Force Microscopy. Journal of Colloid and Interface Science. 240: 9-16. PMID 11446780 DOI: 10.1006/Jcis.2001.7626 | 0.584 | |||
2000 | Dokou E, Stangland EE, Andres RP, Delgass WN, Barteau MA. Comparison of AFM and HRTEM to determine the metal particle morphology and loading of an Au/TiO2 catalyst Catalysis Letters. 70: 1-7. DOI: 10.1023/A:1019035821026 | 0.565 | |||
2000 | Dokou E, Farneth WE, Barteau MA. Using atomic force microscopy (AFM) to study the surface structure of oxide and metal-decorated oxide particles Studies in Surface Science and Catalysis. 130: 3167-3172. DOI: 10.1016/S0167-2991(00)80509-1 | 0.596 | |||
1999 | Farneth WE, Scott McLean R, Bolt JD, Dokou E, Barteau MA. Tapping mode atomic force microscopy studies of the photoreduction of Ag+ on individual submicrometer TiO2 particles Langmuir. 15: 8569-8573. DOI: 10.1021/La9908844 | 0.623 | |||
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