| Year |
Citation |
Score |
| 2024 |
Wang X, Zahl P, Wang H, Altman EI, Schwarz UD. How Precisely Can Individual Molecules Be Analyzed? A Case Study on Locally Quantifying Forces and Energies Using Scanning Probe Microscopy. Acs Nano. PMID 38265359 DOI: 10.1021/acsnano.3c11219 |
0.402 |
|
| 2022 |
Schwarz UD. Visualized atom by atom. Nature Materials. 21: 140-142. PMID 34621060 DOI: 10.1038/s41563-021-01115-y |
0.312 |
|
| 2020 |
Chen Z, Datye A, Simon GH, Zhou C, Kube SA, Liu N, Liu J, Schroers J, Schwarz UD. Atomic-Scale Imprinting by Sputter Deposition of Amorphous Metallic Films. Acs Applied Materials & Interfaces. PMID 33191728 DOI: 10.1021/acsami.0c14982 |
0.344 |
|
| 2020 |
Chen Z, Datye A, Ketkaew J, Sohn S, Zhou C, Dagdeviren OE, Schroers J, Schwarz UD. Relaxation and crystallization studied by observing the surface morphology evolution of atomically flat Pt57.5Cu14.7Ni5.3P22.5 upon annealing Scripta Materialia. 182: 32-37. DOI: 10.1016/J.Scriptamat.2020.02.035 |
0.435 |
|
| 2020 |
Datye A, Ketkaew J, Schroers J, Schwarz UD. Effect of the fictive temperature on the modulus, hardness, yield strength, dynamic mechanical and creep response of Zr44Ti11Cu10Ni10Be25 metallic glasses Journal of Alloys and Compounds. 819: 152979. DOI: 10.1016/J.Jallcom.2019.152979 |
0.324 |
|
| 2019 |
Dagdeviren OE, Schwarz UD. Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance. The Review of Scientific Instruments. 90: 033707. PMID 30927822 DOI: 10.1063/1.5089634 |
0.532 |
|
| 2019 |
Zou K, Albright SD, Dagdeviren OE, Morales-Acosta MD, Simon GH, Zhou C, Mandal S, Ismail-Beigi S, Schwarz UD, Altman EI, Walker FJ, Ahn CH. Revealing surface-state transport in ultrathin topological crystalline insulator SnTe films Apl Materials. 7: 051106. DOI: 10.1063/1.5096279 |
0.329 |
|
| 2019 |
Zhou C, Liang X, Hutchings GS, Fishman ZS, Jhang J, Li M, Schwarz UD, Ismail-Beigi S, Altman EI. Structure of a Two-Dimensional Silicate Layer Formed by Reaction with an Alloy Substrate Chemistry of Materials. 31: 851-861. DOI: 10.1021/Acs.Chemmater.8B03988 |
0.353 |
|
| 2018 |
Dagdeviren OE, Mandal S, Zou K, Zhou C, Simon GH, Walker FJ, Ahn CH, Schwarz UD, Ismail-Beigi S, Altman EI. Suppression of the spectral weight of topological surface states on the nanoscale via local symmetry breaking Physical Review Materials. 2. DOI: 10.1103/Physrevmaterials.2.114205 |
0.357 |
|
| 2018 |
Li R, Chen Z, Datye A, Simon GH, Ketkaew J, Kinser E, Liu Z, Zhou C, Dagdeviren OE, Sohn S, Singer JP, Osuji CO, Schroers J, Schwarz UD. Atomic imprinting into metallic glasses Communications Physics. 1. DOI: 10.1038/S42005-018-0076-6 |
0.452 |
|
| 2017 |
Zhu X, Jhang JH, Zhou C, Dagdeviren OE, Chen Z, Schwarz UD, Altman EI. Using ZnO-Cr2O3-ZnO heterostructures to characterize polarization penetration depth through non-polar films. Physical Chemistry Chemical Physics : Pccp. 19: 32492-32504. PMID 29188828 DOI: 10.1039/C7Cp06059A |
0.361 |
|
| 2017 |
Jhang JH, Zhou C, Dagdeviren OE, Hutchings GS, Schwarz UD, Altman EI. Growth of two dimensional silica and aluminosilicate bilayers on Pd(111): from incommensurate to commensurate crystalline. Physical Chemistry Chemical Physics : Pccp. PMID 28516996 DOI: 10.1039/C7Cp02382K |
0.313 |
|
| 2017 |
Dagdeviren OE, Schwarz UD. Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis. Beilstein Journal of Nanotechnology. 8: 657-666. PMID 28462067 DOI: 10.3762/Bjnano.8.70 |
0.452 |
|
| 2017 |
Hutchings GS, Jhang JH, Zhou C, Hynek D, Schwarz UD, Altman EI. Epitaxial NixPd1-x (111) Alloy Substrates with Continuously Tunable Lattice Constants for 2D Materials Growth. Acs Applied Materials & Interfaces. PMID 28281742 DOI: 10.1021/Acsami.7B01369 |
0.342 |
|
| 2017 |
Dagdeviren OE, Zhou C, Zou K, Simon GH, Albright SD, Mandal S, Morales-Acosta MD, Zhu X, Ismail-Beigi S, Walker FJ, Ahn CH, Schwarz UD, Altman EI. Length Scale and Dimensionality of Defects in Epitaxial SnTe Topological Crystalline Insulator Films Advanced Materials Interfaces. 4: 1601011. DOI: 10.1002/Admi.201601011 |
0.463 |
|
| 2016 |
Dagdeviren OE, Götzen J, Altman EI, Schwarz UD. Exploring site-specific chemical interactions at surfaces: a case study on highly ordered pyrolytic graphite. Nanotechnology. 27: 485708. PMID 27811384 DOI: 10.1088/0957-4484/27/48/485708 |
0.573 |
|
| 2016 |
Baykara MZ, Schwarz UD. Noncontact atomic force microscopy III. Beilstein Journal of Nanotechnology. 7: 946-7. PMID 27547611 DOI: 10.3762/bjnano.7.86 |
0.72 |
|
| 2016 |
Schwarz UD, Hölscher H. Exploring and Explaining Friction with the Prandtl-Tomlinson Model. Acs Nano. 10: 38-41. PMID 26765866 DOI: 10.1021/Acsnano.5B08251 |
0.487 |
|
| 2016 |
Dagdeviren OE, Götzen J, Hölscher H, Altman EI, Schwarz UD. Robust high-resolution imaging and quantitative force measurement with tuned-oscillator atomic force microscopy. Nanotechnology. 27: 065703. PMID 26754332 DOI: 10.1088/0957-4484/27/6/065703 |
0.59 |
|
| 2016 |
Dagdeviren OE, Simon GH, Zou K, Walker FJ, Ahn C, Altman EI, Schwarz UD. Surface phase, morphology, and charge distribution transitions on vacuum and ambient annealed SrTi O3 (100) Physical Review B - Condensed Matter and Materials Physics. 93. DOI: 10.1103/Physrevb.93.195303 |
0.451 |
|
| 2016 |
Zou K, Mandal S, Albright SD, Peng R, Pu Y, Kumah D, Lau C, Simon GH, Dagdeviren OE, He X, BoŽović I, Schwarz UD, Altman EI, Feng D, Walker FJ, et al. Role of double Ti O2 layers at the interface of FeSe/ SrTi O3 superconductors Physical Review B - Condensed Matter and Materials Physics. 93. DOI: 10.1103/Physrevb.93.180506 |
0.333 |
|
| 2016 |
Dagdeviren OE, Schwarz UD. Numerical performance analysis of quartz tuning fork-based force sensors Measurement Science and Technology. 28: 015102. DOI: 10.1088/1361-6501/28/1/015102 |
0.311 |
|
| 2016 |
Baykara MZ, Mönig H, Schwendemann TC, Ünverdi Ö, Altman EI, Schwarz UD. Three-dimensional interaction force and tunneling current spectroscopy of point defects on rutile TiO2(110) Applied Physics Letters. 108. DOI: 10.1063/1.4942100 |
0.736 |
|
| 2015 |
Altman EI, Baykara MZ, Schwarz UD. Noncontact Atomic Force Microscopy: An Emerging Tool for Fundamental Catalysis Research. Accounts of Chemical Research. 48: 2640-8. PMID 26301490 DOI: 10.1021/Acs.Accounts.5B00166 |
0.752 |
|
| 2015 |
Schwarz UD. Tribology. Tracking antiwear film formation. Science (New York, N.Y.). 348: 40-1. PMID 25838366 DOI: 10.1126/Science.Aaa3276 |
0.302 |
|
| 2015 |
Baykara MZ, Todorovi? M, Mönig H, Schwendemann TC, Rodrigo L, Altman EI, Pérez R, Schwarz UD. Simultaneous measurement of multiple independent atomic-scale interactions using scanning probe microscopy: Data interpretation and the effect of cross-talk Journal of Physical Chemistry C. 119: 6670-6677. DOI: 10.1021/Acs.Jpcc.5B00594 |
0.731 |
|
| 2015 |
Baykara MZ, Schwarz UD. 3d force field spectroscopy Nanoscience and Technology. 97: 9-28. DOI: 10.1007/978-3-319-15588-3_2 |
0.614 |
|
| 2014 |
Baykara MZ, Schwarz UD. Noncontact atomic force microscopy II. Beilstein Journal of Nanotechnology. 5: 289-90. PMID 24778950 DOI: 10.3762/bjnano.5.31 |
0.697 |
|
| 2014 |
Dietzel D, Schwarz UD, Schirmeisen A. Nanotribological studies using nanoparticle manipulation: Principles and application to structural lubricity Friction. 2: 114-139. DOI: 10.1007/S40544-014-0054-2 |
0.394 |
|
| 2013 |
Dietzel D, Feldmann M, Schwarz UD, Fuchs H, Schirmeisen A. Scaling laws of structural lubricity. Physical Review Letters. 111: 235502. PMID 24476292 DOI: 10.1103/Physrevlett.111.235502 |
0.415 |
|
| 2013 |
Mönig H, Todorovi? M, Baykara MZ, Schwendemann TC, Rodrigo L, Altman EI, Pérez R, Schwarz UD. Understanding scanning tunneling microscopy contrast mechanisms on metal oxides: a case study. Acs Nano. 7: 10233-44. PMID 24111487 DOI: 10.1021/Nn4045358 |
0.654 |
|
| 2013 |
Ritter C, Baykara MZ, Stegemann B, Heyde M, Rademann K, Schroers J, Schwarz UD. Nonuniform friction-area dependency for antimony oxide surfaces sliding on graphite Physical Review B - Condensed Matter and Materials Physics. 88. DOI: 10.1103/Physrevb.88.045422 |
0.701 |
|
| 2013 |
Baykara MZ, Todorovi? M, Mönig H, Schwendemann TC, Ünverdi O, Rodrigo L, Altman EI, Pérez R, Schwarz UD. Atom-specific forces and defect identification on surface-oxidized Cu(100) with combined 3D-AFM and STM measurements Physical Review B - Condensed Matter and Materials Physics. 87. DOI: 10.1103/Physrevb.87.155414 |
0.6 |
|
| 2013 |
Altman EI, Götzen J, Samudrala N, Schwarz UD. Growth and characterization of crystalline silica films on Pd(100) Journal of Physical Chemistry C. 117: 26144-26155. DOI: 10.1021/Jp4101152 |
0.325 |
|
| 2012 |
Glatzel T, Hölscher H, Schimmel T, Baykara MZ, Schwarz UD, Garcia R. Advanced atomic force microscopy techniques. Beilstein Journal of Nanotechnology. 3: 893-4. PMID 23365802 DOI: 10.3762/Bjnano.3.99 |
0.719 |
|
| 2012 |
Baykara MZ, Dagdeviren OE, Schwendemann TC, Mönig H, Altman EI, Schwarz UD. Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction. Beilstein Journal of Nanotechnology. 3: 637-50. PMID 23019560 DOI: 10.3762/Bjnano.3.73 |
0.775 |
|
| 2012 |
Baykara MZ, Schwendemann TC, Albers BJ, Pilet N, Mönig H, Altman EI, Schwarz UD. Exploring atomic-scale lateral forces in the attractive regime: a case study on graphite (0001). Nanotechnology. 23: 405703. PMID 22995789 DOI: 10.1088/0957-4484/23/40/405703 |
0.821 |
|
| 2012 |
Schwarz UD. Noncontact atomic force microscopy. Beilstein Journal of Nanotechnology. 3: 172-3. PMID 22428107 DOI: 10.3762/Bjnano.3.17 |
0.651 |
|
| 2012 |
Bonnell DA, Basov DN, Bode M, Diebold U, Kalinin SV, Madhavan V, Novotny L, Salmeron M, Schwarz UD, Weiss PS. Imaging physical phenomena with local probes: From electrons to photons Reviews of Modern Physics. 84: 1343-1381. DOI: 10.1103/Revmodphys.84.1343 |
0.538 |
|
| 2010 |
Baykara MZ, Schwendemann TC, Altman EI, Schwarz UD. Three-dimensional atomic force microscopy - taking surface imaging to the next level. Advanced Materials (Deerfield Beach, Fla.). 22: 2838-53. PMID 20379997 DOI: 10.1002/Adma.200903909 |
0.759 |
|
| 2010 |
Altman EI, Schwarz UD. Mechanisms, kinetics, and dynamics of oxidation and reactions on oxide surfaces investigated by scanning probe microscopy. Advanced Materials (Deerfield Beach, Fla.). 22: 2854-69. PMID 20379972 DOI: 10.1002/Adma.200903927 |
0.365 |
|
| 2010 |
Kim WJ, Schwarz UD. Potential contributions of noncontact atomic force microscopy for the future Casimir force measurements Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 28: C4A1-C4A7. DOI: 10.1116/1.3294709 |
0.516 |
|
| 2010 |
Dietzel D, Mönninghoff T, Herding C, Feldmann M, Fuchs H, Stegemann B, Ritter C, Schwarz UD, Schirmeisen A. Frictional duality of metallic nanoparticles: Influence of particle morphology, orientation, and air exposure Physical Review B - Condensed Matter and Materials Physics. 82. DOI: 10.1103/Physrevb.82.035401 |
0.376 |
|
| 2010 |
Kumar G, Staffier PA, Blawzdziewicz J, Schwarz UD, Schroers J. Atomically smooth surfaces through thermoplastic forming of metallic glass Applied Physics Letters. 97. DOI: 10.1063/1.3485298 |
0.443 |
|
| 2010 |
Dietzel D, Feldmann M, Herding C, Schwarz UD, Schirmeisen A. Quantifying pathways and friction of nanoparticles during controlled manipulation by contact-mode atomic force microscopy Tribology Letters. 39: 273-281. DOI: 10.1007/S11249-010-9643-Z |
0.456 |
|
| 2010 |
Baykara MZ, Schwendemann TC, Altman EI, Schwarz UD. 3D Atomic Force Microscopy: Three-Dimensional Atomic Force Microscopy - Taking Surface Imaging to the Next Level (Adv. Mater. 26-27/2010) Advanced Materials. 22: n/a-n/a. DOI: 10.1002/Adma.201090089 |
0.762 |
|
| 2009 |
Schirmeisen A, Schwarz UD. Measuring the friction of nanoparticles: a new route towards a better understanding of nanoscale friction. Chemphyschem : a European Journal of Chemical Physics and Physical Chemistry. 10: 2373-82. PMID 19701951 DOI: 10.1002/Cphc.200900378 |
0.493 |
|
| 2009 |
Schwarz UD. Force microscopy: on the charge. Nature Nanotechnology. 4: 477-8. PMID 19662004 DOI: 10.1038/Nnano.2009.215 |
0.519 |
|
| 2009 |
Pérez R, GarcÃa R, Schwarz U. High-resolution noncontact atomic force microscopy. Nanotechnology. 20: 260201. PMID 19531843 DOI: 10.1088/0957-4484/20/26/260201 |
0.617 |
|
| 2009 |
Albers BJ, Schwendemann TC, Baykara MZ, Pilet N, Liebmann M, Altman EI, Schwarz UD. Data acquisition and analysis procedures for high-resolution atomic force microscopy in three dimensions. Nanotechnology. 20: 264002. PMID 19509455 DOI: 10.1088/0957-4484/20/26/264002 |
0.816 |
|
| 2009 |
Albers BJ, Schwendemann TC, Baykara MZ, Pilet N, Liebmann M, Altman EI, Schwarz UD. Three-dimensional imaging of short-range chemical forces with picometre resolution. Nature Nanotechnology. 4: 307-10. PMID 19421216 DOI: 10.1038/Nnano.2009.57 |
0.821 |
|
| 2009 |
Dietzel D, Feldmann M, Fuchs H, Schwarz UD, Schirmeisen A. Transition from static to kinetic friction of metallic nanoparticles Applied Physics Letters. 95. DOI: 10.1063/1.3193551 |
0.488 |
|
| 2009 |
Vaz CAF, Wang HQ, Ahn CH, Henrich VE, Baykara MZ, Schwendemann TC, Pilet N, Albers BJ, Schwarz UD, Zhang LH, Zhu Y, Wang J, Altman EI. Interface and electronic characterization of thin epitaxial Co3 O4 films Surface Science. 603: 291-297. DOI: 10.1016/J.Susc.2008.11.022 |
0.771 |
|
| 2008 |
Hölscher H, Ebeling D, Schwarz UD. Friction at atomic-scale surface steps: experiment and theory. Physical Review Letters. 101: 246105. PMID 19113638 DOI: 10.1103/Physrevlett.101.246105 |
0.548 |
|
| 2008 |
Dietzel D, Ritter C, Mönninghoff T, Fuchs H, Schirmeisen A, Schwarz UD. Frictional duality observed during nanoparticle sliding. Physical Review Letters. 101: 125505. PMID 18851388 DOI: 10.1103/Physrevlett.101.125505 |
0.444 |
|
| 2008 |
Albers BJ, Liebmann M, Schwendemann TC, Baykara MZ, Heyde M, Salmeron M, Altman EI, Schwarz UD. Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy. The Review of Scientific Instruments. 79: 033704. PMID 18377012 DOI: 10.1063/1.2842631 |
0.812 |
|
| 2008 |
Hölscher H, Schirmeisen A, Schwarz UD. Principles of atomic friction: from sticking atoms to superlubric sliding. Philosophical Transactions. Series a, Mathematical, Physical, and Engineering Sciences. 366: 1383-404. PMID 18156127 DOI: 10.1098/Rsta.2007.2164 |
0.571 |
|
| 2008 |
Schwarz UD, Ritter C, Stegemann B, Heyde M, Rademann K, Dietzel D, Schirmeisen A, Fuchs H. Frictional properties of antimony nanoparticles: The influence of contact area, structure, and surface contamination 2007 Proceedings of the Asme/Stle International Joint Tribology Conference, Ijtc 2007. 813-815. DOI: 10.1115/IJTC2007-44159 |
0.346 |
|
| 2008 |
Hölscher H, Ebeling D, Schwarz UD. Friction at atomic-scale surface steps: Experiment and theory Physical Review Letters. 101. DOI: 10.1103/PhysRevLett.101.246105 |
0.322 |
|
| 2008 |
Shimizu TK, Mugarza A, Cerdá JI, Heyde M, Qi Y, Schwarz UD, Ogletree DF, Salmeron M. Surface species formed by the adsorption and dissociation of water molecules on a Ru(0001) surface containing a small coverage of carbon atoms studied by scanning tunneling microscopy Journal of Physical Chemistry C. 112: 7445-7454. DOI: 10.1021/Jp711097J |
0.368 |
|
| 2008 |
Morgenstern M, Schwarz UD, Schwarz A. Low-temperature scanning probe microscopy Nanotribology and Nanomechanics (Second Edition): An Introduction. 179-234. DOI: 10.1007/978-3-540-77608-6_5 |
0.487 |
|
| 2008 |
Schwarz UD. Scanning Force Microscopy Handbook of Microscopy: Applications in Materials Science , Solid-State Physics and Chemistry. 828-844. DOI: 10.1002/9783527620524.ch13 |
0.463 |
|
| 2007 |
Dietzel D, Mönninghoff T, Jansen L, Fuchs H, Ritter C, Schwarz UD, Schirmeisen A. Interfacial friction obtained by lateral manipulation of nanoparticles using atomic force microscopy techniques Journal of Applied Physics. 102. DOI: 10.1063/1.2798628 |
0.498 |
|
| 2007 |
Hölscher H, Schwarz UD. Theory of amplitude modulation atomic force microscopy with and without Q-Control International Journal of Non-Linear Mechanics. 42: 608-625. DOI: 10.1016/J.Ijnonlinmec.2007.01.018 |
0.586 |
|
| 2007 |
Schwarz UD, Hölscher H. Dynamic force microscopy and spectroscopy in vacuum Scanning Probe Microscopy. 2: 506-533. DOI: 10.1007/978-0-387-28668-6_19 |
0.531 |
|
| 2006 |
Ebeling D, Hölscher H, Fuchs H, Anczykowski B, Schwarz UD. Imaging of biomaterials in liquids: a comparison between conventional and Q-controlled amplitude modulation ('tapping mode') atomic force microscopy. Nanotechnology. 17: S221-6. PMID 21727418 DOI: 10.1088/0957-4484/17/7/S20 |
0.406 |
|
| 2006 |
Hölscher H, Schwarz UD. Q-controlled amplitude modulation atomic force microscopy in liquids: An analysis Applied Physics Letters. 89. DOI: 10.1063/1.2336723 |
0.485 |
|
| 2006 |
Hölscher H, Ebeling D, Schwarz UD. Theory of Q -Controlled dynamic force microscopy in air Journal of Applied Physics. 99. DOI: 10.1063/1.2190070 |
0.433 |
|
| 2005 |
Aruliah DA, Müser MH, Schwarz UD. Calculations of the threshold force and threshold power to move adsorbed nanoparticles Physical Review B - Condensed Matter and Materials Physics. 71. DOI: 10.1103/Physrevb.71.085406 |
0.386 |
|
| 2005 |
Ritter C, Heyde M, Stegemann B, Rademann K, Schwarz UD. Contact-area dependence of frictional forces: Moving adsorbed antimony nanoparticles Physical Review B - Condensed Matter and Materials Physics. 71. DOI: 10.1103/Physrevb.71.085405 |
0.443 |
|
| 2005 |
Schwarz U. NC-AFM 2004: Proceedings of the 7th international conference on non-contact atomic force microscopy Nanotechnology. 16: i-ii. DOI: 10.1088/0957-4484/16/3/E01 |
0.607 |
|
| 2005 |
Ashino M, Schwarz A, Hölscher H, Schwarz UD, Wiesendanger R. Interpretation of the atomic scale contrast obtained on graphite and single-walled carbon nanotubes in the dynamic mode of atomic force microscopy Nanotechnology. 16: S134-S137. DOI: 10.1088/0957-4484/16/3/024 |
0.487 |
|
| 2005 |
Morgenstern M, Schwarz A, Schwarz UD. Low temperature scanning probe microscopy Nanotribology and Nanomechanics: An Introduction. 185-242. DOI: 10.1007/3-540-28248-3_5 |
0.492 |
|
| 2005 |
Schwarz UD, Ritter C, Heyde M, Rademann K. Adhesion and friction on the nanometer scale: Energy dissipation during sliding of antimony Islands on graphite and MoS2 Proceedings of the World Tribology Congress Iii - 2005. 441-442. |
0.326 |
|
| 2003 |
Schwarz UD. A generalized analytical model for the elastic deformation of an adhesive contact between a sphere and a flat surface. Journal of Colloid and Interface Science. 261: 99-106. PMID 12725829 DOI: 10.1016/S0021-9797(03)00049-3 |
0.397 |
|
| 2003 |
Müller JH, Schwarz UD, Wepf R, Wiesendanger R. A cryogenic scanning force microscope for the characterization of frozen biological samples Applied Physics a: Materials Science and Processing. 76: 893-898. DOI: 10.1007/S00339-002-1971-X |
0.433 |
|
| 2002 |
Hölscher H, Gotsmann B, Allers W, Schwarz UD, Fuchs H, Wiesendanger R. Comment on "Damping mechanism in dynamic force microscopy". Physical Review Letters. 88: 019601. PMID 11800997 |
0.379 |
|
| 2002 |
Ritter C, Heyde M, Schwarz UD, Rademann K. Controlled translational manipulation of small latex spheres by dynamic force microscopy Langmuir. 18: 7798-7803. DOI: 10.1021/La011318N |
0.508 |
|
| 2002 |
Schwarz A, Schwarz UD, Langkat S, Hölscher H, Allers W, Wiesendanger R. Dynamic force microscopy with atomic resolution at low temperatures Applied Surface Science. 188: 245-251. DOI: 10.1016/S0169-4332(02)00146-0 |
0.584 |
|
| 2001 |
Hölscher H, Gotsmann B, Allers W, Schwarz UD, Fuchs H, Wiesendanger R. Measurement of conservative and dissipative tip-sample interaction forces with a dynamic force microscope using the frequency modulation technique Physical Review B - Condensed Matter and Materials Physics. 64: 754021-754026. DOI: 10.1103/Physrevb.64.075402 |
0.455 |
|
| 2001 |
Richter T, Müller JH, Schwarz UD, Wepf R, Wiesendanger R. Investigation of the swelling of human skin cells in liquid media by tapping mode scanning force microscopy Applied Physics a: Materials Science and Processing. 72: S125-S128. DOI: 10.1007/S003390100750 |
0.357 |
|
| 2001 |
Hölscher H, Allers W, Schwarz UD, Schwarz A, Wiesendanger R. Simulation of NC-AFM images of xenon(111) Applied Physics a: Materials Science and Processing. 72: S35-S38. DOI: 10.1007/S003390100724 |
0.468 |
|
| 2001 |
Hölscher H, Schwarz UD. Friction studied with the scanning force microscope Zeitschrift Fuer Metallkunde/Materials Research and Advanced Techniques. 92: 1040-1045. |
0.456 |
|
| 2000 |
Allers W, Schwarz A, Hölscher H, Schwarz UD, Wiesendanger R. Dynamic scanning force microscopy at low temperatures Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 39: 3701-3706. DOI: 10.1143/Jjap.39.3701 |
0.519 |
|
| 2000 |
Hölscher H, Allers W, Schwarz UD, Schwarz A, Wiesendanger R. Interpretation of "true atomic resolution" images of graphite (0001) in noncontact atomic force microscopy Physical Review B - Condensed Matter and Materials Physics. 62: 6967-6970. DOI: 10.1103/Physrevb.62.6967 |
0.57 |
|
| 2000 |
Schwarz A, Allers W, Schwarz UD, Wiesendanger R. Detection of doping atom distributions and individual dopants in InAs(110) by dynamic-mode scanning force microscopy in ultrahigh vacuum Physical Review B - Condensed Matter and Materials Physics. 62: 13617-13622. DOI: 10.1103/Physrevb.62.13617 |
0.506 |
|
| 2000 |
Schwarz UD, Hölscher H, Wiesendanger R. Atomic resolution in scanning force microscopy: Concepts, requirements, contrast mechanisms, and image interpretation Physical Review B - Condensed Matter and Materials Physics. 62: 13089-13097. DOI: 10.1103/Physrevb.62.13089 |
0.511 |
|
| 2000 |
Schwarz A, Allers W, Schwarz UD, Wiesendanger R. Dynamic-mode scanning force microscopy study of n -InAs(110)- ( 1 × 1 ) at low temperatures Physical Review B. 61: 2837-2845. DOI: 10.1103/Physrevb.61.2837 |
0.557 |
|
| 2000 |
Hölscher H, Schwarz A, Allers W, Schwarz UD, Wiesendanger R. Quantitative analysis of dynamic-force-spectroscopy data on graphite(0001) in the contact and noncontact regimes Physical Review B - Condensed Matter and Materials Physics. 61: 12678-12681. DOI: 10.1103/Physrevb.61.12678 |
0.515 |
|
| 2000 |
Schwarz A, Allers W, Schwarz UD, Wiesendanger R. Dynamic-mode scanning force microscopy study of n-InAs(110)-(1 X 1) at low temperatures Physical Review B - Condensed Matter and Materials Physics. 61: 2837-2845. |
0.472 |
|
| 1999 |
Allers W, Schwarz A, Schwarz UD, Wiesendanger R. Dynamic scanning force microscopy at low temperatures on a noble-gas crystal: Atomic resolution on the xenon(111) surface Europhysics Letters. 48: 276-279. DOI: 10.1209/Epl/I1999-00477-3 |
0.606 |
|
| 1999 |
Hölscher H, Allers W, Schwarz UD, Schwarz A, Wiesendanger R. Determination of Tip-Sample Interaction Potentials by Dynamic Force Spectroscopy Physical Review Letters. 83: 4780-4783. DOI: 10.1103/Physrevlett.83.4780 |
0.46 |
|
| 1999 |
Hölscher H, Raberg W, Schwarz UD, Hasbach A, Wandelt K, Wiesendanger R. Imaging of sub-unit-cell structures in the contact mode of the scanning force microscope Physical Review B - Condensed Matter and Materials Physics. 59: 1661-1664. DOI: 10.1103/Physrevb.59.1661 |
0.443 |
|
| 1999 |
Hölscher H, Schwarz UD, Wiesendanger R. Calculation of the frequency shift in dynamic force microscopy Applied Surface Science. 140: 344-351. DOI: 10.1016/S0169-4332(98)00552-2 |
0.451 |
|
| 1999 |
Schwarz A, Allers W, Schwarz UD, Wiesendanger R. Simultaneous imaging of the In and As sublattice on InAs(110)-(1×1) with dynamic scanning force microscopy Applied Surface Science. 140: 293-297. DOI: 10.1016/S0169-4332(98)00543-1 |
0.613 |
|
| 1999 |
Allers W, Schwarz A, Schwarz UD, Wiesendanger R. Dynamic scanning force microscopy at low temperatures on a van der Waals surface: Graphite (0001) Applied Surface Science. 140: 247-252. DOI: 10.1016/S0169-4332(98)00535-2 |
0.56 |
|
| 1998 |
Hölscher H, Schwarz UD, Zwörner O, Wiesendanger R. Consequences of the stick-slip movement for the scanning force microscopy imaging of graphite Physical Review B - Condensed Matter and Materials Physics. 57: 2477-2481. DOI: 10.1103/Physrevb.57.2477 |
0.558 |
|
| 1998 |
Bluhm H, Schwarz UD, Wiesendanger R. Origin of the ferroelectric domain contrast observed in lateral force microscopy Physical Review B - Condensed Matter and Materials Physics. 57: 161-169. DOI: 10.1103/Physrevb.57.161 |
0.459 |
|
| 1998 |
Allers W, Schwarz A, Schwarz UD, Wiesendanger R. A scanning force microscope with atomic resolution in ultrahigh vacuum and at low temperatures Review of Scientific Instruments. 69: 221-225. DOI: 10.1063/1.1148499 |
0.498 |
|
| 1998 |
Zwörner O, Hölscher H, Schwarz UD, Wiesendanger R. The velocity dependence of frictional forces in point-contact friction Applied Physics a: Materials Science and Processing. 66: S263-S267. DOI: 10.1007/S003390051142 |
0.472 |
|
| 1997 |
Schwarz UD, Köstet P, Wiesendanger R. Preparation of probe tips with well-defined spherical apexes for quantitative scanning force spectroscopy Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 15: 1527-1530. DOI: 10.1116/1.589488 |
0.508 |
|
| 1997 |
Schwarz UD, Zwörner O, Köster P, Wiesendanger R. Quantitative analysis of the frictional properties of solid materials at low loads. II. Mica and germanium sulfide Physical Review B - Condensed Matter and Materials Physics. 56: 6997-7000. DOI: 10.1103/Physrevb.56.6997 |
0.488 |
|
| 1997 |
Schwarz UD, Zwörner O, Köster P, Wiesendanger R. Quantitative analysis of the frictional properties of solid materials at low loads. I. Carbon compounds Physical Review B - Condensed Matter and Materials Physics. 56: 6987-6996. DOI: 10.1103/Physrevb.56.6987 |
0.46 |
|
| 1997 |
Hölscher H, Schwarz UD, Wiesendanger R. Modelling of the scan process in lateral force microscopy Surface Science. 375: 395-402. DOI: 10.1016/S0039-6028(96)01285-X |
0.559 |
|
| 1997 |
Hölscher H, Schwarz UD, Zwörner O, Wiesendanger R. Stick-slip movement of a scanned tip on a graphite surface in scanning force microscopy Zeitschrift Fur Physik B-Condensed Matter. 104: 295-297. DOI: 10.1007/S002570050452 |
0.527 |
|
| 1996 |
Seider M, Schwarz UD, Wiesendanger R. Load-dependent topographic and friction studies of individual ion tracks in layered materials by scanning force microscopy and lateral force microscopy. Physical Review. B, Condensed Matter. 53: R16180-R16183. PMID 9983527 DOI: 10.1103/Physrevb.53.R16180 |
0.471 |
|
| 1996 |
Hölscher H, Schwarz UD, Wiesendanger R. Simulation of a scanned tip on a NaF (001) surface in friction force microscopy Europhysics Letters. 36: 19-24. DOI: 10.1209/Epl/I1996-00181-4 |
0.542 |
|
| 1996 |
Wiesendanger R, Bode M, Pascal R, Allers W, Schwarz UD. Issues of atomic‐resolution structure and chemical analysis by scanning probe microscopy and spectroscopy Journal of Vacuum Science & Technology a: Vacuum, Surfaces, and Films. 14: 1161-1167. DOI: 10.1116/1.580259 |
0.509 |
|
| 1996 |
Allers W, Hahn C, Löhndorf M, Lukas S, Pan S, Schwarz UD, Wiesendanger R. Nanomechanical investigations and modifications of thin films based on scanning force methods Nanotechnology. 7: 346-350. DOI: 10.1088/0957-4484/7/4/007 |
0.442 |
|
| 1996 |
Schwarz UD, Köster P, Wiesendanger R. Quantitative analysis of lateral force microscopy experiments Review of Scientific Instruments. 67: 2560-2567. DOI: 10.1063/1.1147214 |
0.433 |
|
| 1995 |
Schwarz UD, Allers W, Gensterblum G, Pireaux J, Wiesendanger R. Growth of C60 thin films on GeS(001) studied by scanning force microscopy. Physical Review. B, Condensed Matter. 52: 5967-5976. PMID 9981788 DOI: 10.1103/Physrevb.52.5967 |
0.438 |
|
| 1995 |
Schwarz UD, Allers W, Gensterblum G, Wiesendanger R. Low-load friction behavior of epitaxial C60 monolayers under Hertzian contact. Physical Review. B, Condensed Matter. 52: 14976-14984. PMID 9980840 DOI: 10.1007/S002570050001 |
0.428 |
|
| 1995 |
Bluhm H, Schwarz UD, Meyer KP, Wiesendanger R. Anisotropy of sliding friction on the triglycine sulfate (010) surface Applied Physics a Materials Science & Processing. 61: 525-533. DOI: 10.1007/Bf01540254 |
0.51 |
|
| 1995 |
Schwarz A, Schwarz UD, Bluhm H, Wiesendanger R. Determination of Miller indices of slide faces of small crystallites from scanning force microscopy angle measurements Surface and Interface Analysis. 23: 409-415. DOI: 10.1002/Sia.740230613 |
0.477 |
|
| 1994 |
Schwarz UD, Haefke H, Reimann P, Guntherodt HJ. Tip artefacts in scanning force microscopy Journal of Microscopy. 173: 183-197. DOI: 10.1111/J.1365-2818.1994.Tb03441.X |
0.559 |
|
| 1994 |
Schwarz UD, Haefke H. Investigation of precipitated colloidal particles by scanning force microscopy: silver-halide microcrystals Applied Physics a Solids and Surfaces. 59: 33-40. DOI: 10.1007/Bf00348417 |
0.444 |
|
| 1994 |
Bluhm H, Schwarz UD, Herrmann F, Paufler P. Study of the influence of native oxide layers on atomic force microscopy imaging of semiconductor surfaces Applied Physics a Solids and Surfaces. 59: 23-27. DOI: 10.1007/Bf00348415 |
0.55 |
|
| 1994 |
Allers W, Schwarz UD, Gensterblum G, Wiesendanger R. Scanning and friction-force microscopy of thin C60 films on GeS(001) Applied Physics a Solids and Surfaces. 59: 11-15. DOI: 10.1007/Bf00348413 |
0.416 |
|
| 1993 |
Jung TA, Moser A, Gale MT, Hug HJ, Schwarz UD. Atomic force microscopy experimentation at surfaces: hardness, wear and lithographic applications Advanced Optical Technologies. 10310. DOI: 10.1117/12.183188 |
0.612 |
|
| 1993 |
Jurkschat K, Bluhm H, Schwarz UD, Klöβ G, Paufler P. Slip line resolution in atomic range on plastically deformedAIII-BVsemiconductor surface by scanning force microscopy Acta Crystallographica Section a Foundations of Crystallography. 49: c315-c315. DOI: 10.1107/S0108767378091229 |
0.597 |
|
| 1993 |
Moser A, Hug HJ, Jung T, Schwarz UD, Guntherodt HJ. Miniature fibre optic force microscope scan head Engineering Optics. 6: 403-409. DOI: 10.1088/0957-0233/4/7/009 |
0.461 |
|
| 1993 |
Steiger R, Haefke H, Schwarz UD, Guntherodt HJ, Frob H. Investigation of AgBr photographic systems with scanning force microscopy Journal of Imaging Science and Technology. 37: 545-551. |
0.44 |
|
| 1993 |
Schwarz UD, Haefke H, Guntherodt HJ, Bohonek J, Steiger R. Atomic force microscopy study of cubic and octahedral AgBr microcrystals Journal of Imaging Science. 37: 344-347. |
0.533 |
|
| 1992 |
Jung TA, Moser A, Hug HJ, Brodbeck D, Hofer R, Hidber HR, Schwarz UD. The atomic force microscope used as a powerful tool for machining surfaces Ultramicroscopy. 42: 1446-1451. DOI: 10.1016/0304-3991(92)90464-U |
0.541 |
|
| 1992 |
Haefke H, Meyer E, Howald L, Schwarz U, Gerth G, Krohn M. Atomic surface and lattice structures of AgBr thin films Ultramicroscopy. 42: 290-297. DOI: 10.1016/0304-3991(92)90281-N |
0.531 |
|
| 1992 |
Schwarz UD, Haefke H, Jung T, Meyer E, Güntherodt HJ, Steiger R, Bohonek J. Plate-like microcrystals of silver bromide investigated by scanning force microscopy Ultramicroscopy. 41: 435-439. DOI: 10.1016/0304-3991(92)90224-8 |
0.509 |
|
| Show low-probability matches. |
