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Abde A. Kagalwalla, Ph.D. - Publications

Affiliations: 
2014 Electrical Engineering University of California, Los Angeles, Los Angeles, CA 
Area:
Design-technology co-optimization, physical design, variability and reliability aware computer architectures
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13 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2017 Chan T, Gupta P, Han K, Kagalwalla AA, Kahng AB. Benchmarking of Mask Fracturing Heuristics Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 36: 170-183. DOI: 10.1109/Tcad.2016.2620902  0.542
2015 Kagalwalla AA, Gupta P. Effective model-based mask fracturing for mask cost reduction Proceedings - Design Automation Conference. 2015. DOI: 10.1145/2744769.2744828  0.307
2015 Chan TB, Gupta P, Han K, Kagalwalla AA, Kahng AB, Sahouria E. Benchmarking of mask fracturing heuristics Ieee/Acm International Conference On Computer-Aided Design, Digest of Technical Papers, Iccad. 2015: 246-253. DOI: 10.1109/ICCAD.2014.7001359  0.504
2014 Kagalwalla AA, Gupta P. Comprehensive defect avoidance framework for mitigating EUV mask defects Proceedings of Spie - the International Society For Optical Engineering. 9048. DOI: 10.1117/12.2046701  0.555
2014 Kagalwalla AA, Gupta P. Comprehensive defect avoidance framework for mitigating extreme ultraviolet mask defects Journal of Micro/ Nanolithography, Mems, and Moems. 13. DOI: 10.1117/1.Jmm.13.4.043005  0.54
2014 Kagalwalla AA, Lam M, Adam K, Gupta P. EUV-CDA: Pattern shift aware critical density analysis for EUV mask layouts Proceedings of the Asia and South Pacific Design Automation Conference, Asp-Dac. 155-160. DOI: 10.1109/ASPDAC.2014.6742882  0.356
2013 Kagalwalla AA, Gupta P. Design-aware defect-avoidance floorplanning of EUV masks Ieee Transactions On Semiconductor Manufacturing. 26: 111-124. DOI: 10.1109/Tsm.2012.2234151  0.575
2012 Kagalwalla AA, Muddu S, Capodieci L, Zelnik C, Gupta P. Design-of-experiments based design rule optimization Proceedings of Spie - the International Society For Optical Engineering. 8327. DOI: 10.1117/12.918067  0.51
2012 Kagalwalla AA, Gupta P, Progler CJ, McDonald S. Design-aware mask inspection Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 31: 690-702. DOI: 10.1109/Tcad.2011.2181909  0.551
2012 Gottscho M, Kagalwalla AA, Gupta P. Power variability in contemporary DRAMs Ieee Embedded Systems Letters. 4: 37-40. DOI: 10.1109/Les.2012.2192414  0.417
2011 Kagalwalla AA, Gupta P, Hur DH, Park CH. Defect-aware reticle floorplanning for EUV masks Proceedings of Spie - the International Society For Optical Engineering. 7974. DOI: 10.1117/12.881667  0.575
2011 Chan TB, Kagalwalla AA, Gupta P. Measurement and optimization of electrical process window Journal of Micro/Nanolithography, Mems, and Moems. 10. DOI: 10.1117/1.3545822  0.481
2010 Chan T, Kagalwalla AA, Gupta P. Measurement and optimization of electrical process window Proceedings of Spie. 7641. DOI: 10.1117/12.849066  0.498
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