☰

Thomas A. Frewen, Ph.D. - Publications

Affiliations: 
2004 University of Pennsylvania, Philadelphia, PA, United States 
Area:
Chemical Engineering
Tree Info Similar researchers PubMed Report error

12 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2012 Punckt C, Jan L, Jiang P, Frewen TA, Saville DA, Kevrekidis IG, Aksay IA. Autonomous colloidal crystallization in a galvanic microreactor Journal of Applied Physics. 112. DOI: 10.1063/1.4755807  0.325
2011 Banaszuk A, Fonoberov VA, Frewen TA, Kobilarov M, Mathew G, Mezic I, Pinto A, Sahai T, Sane H, Speranzon A, Surana A. Scalable approach to uncertainty quantification and robust design of interconnected dynamical systems Annual Reviews in Control. 35: 77-98. DOI: 10.1016/J.Arcontrol.2011.03.005  0.38
2010 Laing CR, Frewen T, Kevrekidis IG. Reduced models for binocular rivalry. Journal of Computational Neuroscience. 28: 459-76. PMID 20182782 DOI: 10.1007/S10827-010-0227-6  0.397
2009 Frewen TA, Hummer G, Kevrekidis IG. Exploration of effective potential landscapes using coarse reverse integration. The Journal of Chemical Physics. 131: 134104. PMID 19814540 DOI: 10.1063/1.3207882  0.329
2008 Kolpas A, Moehlis J, Frewen TA, Kevrekidis IG. Coarse analysis of collective motion with different communication mechanisms. Mathematical Biosciences. 214: 49-57. PMID 18598705 DOI: 10.1016/J.Mbs.2008.06.003  0.36
2007 Erban R, Frewen TA, Wang X, Elston TC, Coifman R, Nadler B, Kevrekidis IG. Variable-free exploration of stochastic models: a gene regulatory network example. The Journal of Chemical Physics. 126: 155103. PMID 17461667 DOI: 10.1063/1.2718529  0.363
2007 Laing CR, Frewen TA, Kevrekidis IG. Coarse-grained dynamics of an activity bump in a neural field model Nonlinearity. 20: 2127-2146. DOI: 10.1088/0951-7715/20/9/007  0.378
2006 Frewen TA, Sinno T. Vacancy self-trapping during rapid thermal annealing of silicon wafers Applied Physics Letters. 89. DOI: 10.1063/1.2385069  0.601
2005 Frewen TA, Kapur SS, Haeckl W, Von Ammon W, Sinno T. A microscopically accurate continuum model for void formation during semiconductor silicon processing Journal of Crystal Growth. 279: 258-271. DOI: 10.1016/J.Jcrysgro.2005.02.062  0.527
2005 Frewen TA, Sinno T, Haeckl W, Von Ammon W. A systems-based approach for generating quantitative models of microstructural evolution in silicon materials processing Computers and Chemical Engineering. 29: 713-730. DOI: 10.1016/J.Compchemeng.2004.09.004  0.666
2003 Frewen TA, Sinno T, Dornberger E, Hoelzl R, Von Ammon W, Bracht H. Global parameterization of multiple point-defect dynamics models in silicon Journal of the Electrochemical Society. 150. DOI: 10.1149/1.1610470  0.672
2002 Sinno T, Frewen T, Dornberger E, Hoelzl R, Hoess C. Parameterization of transient models of defect dynamics in Czochralski silicion crystal growth Materials Research Society Symposium - Proceedings. 700: 259-264. DOI: 10.1557/Proc-700-S8.3  0.66
Show low-probability matches.