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Deok-kee Kim, Ph.D. - Publications

Affiliations: 
2001 Stanford University, Palo Alto, CA 
Area:
Materials Science Engineering, Condensed Matter Physics
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12 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2023 Ustad RE, Chavan VD, Kim H, Shin MH, Kim SK, Choi KK, Kim DK. Thermal, Mechanical, and Electrical Stability of Cu Films in an Integration Process with Photosensitive Polyimide (PSPI) Films. Nanomaterials (Basel, Switzerland). 13. PMID 37836283 DOI: 10.3390/nano13192642  0.311
2014 Kim D. Improved electrical and optical properties of GZO films with a thin TiO2 buffer layer deposited by RF magnetron sputtering Ceramics International. 40: 1457-1460. DOI: 10.1016/j.ceramint.2013.07.029  0.319
2013 Kim D. Effect of a TiO2 buffer layer on the properties of ITO films prepared by RF magnetron sputtering Transactions On Electrical and Electronic Materials. 14: 242-245. DOI: 10.4313/TEEM.2013.14.5.242  0.318
2013 Ahn JS, Kim DK, Joo SK. Effect of electric field on amorphous silicon thin films during Ni induced lateral crystallization Journal of Applied Physics. 113. DOI: 10.1063/1.4811350  0.329
2012 Kim D. The influence of Au thickness on the structural, optical and electrical properties of ZnO/Au/ZnO multilayer films Optics Communications. 285: 1212-1214. DOI: 10.1016/j.optcom.2011.10.043  0.338
2010 Kim D. Characterization of TiO2/Au/TiO2 films deposited by magnetron sputtering on polycarbonate substrates Applied Surface Science. 257: 704-707. DOI: 10.1016/j.apsusc.2010.07.038  0.312
2003 Kim D. Deposition of indium tin oxide films on polycarbonate substrates by direct metal ion beam deposition Applied Surface Science. 218: 70-77. DOI: 10.1016/S0169-4332(03)00542-7  0.309
2001 Kim DK, Nix WD, Vinci RP, Deal MD, Plummer JD. Study of the effect of grain boundary migration on hillock formation in Al thin films Journal of Applied Physics. 90: 781-788. DOI: 10.1063/1.1381045  0.537
2000 Kim DK, Nix WD, Arzt E, Deal MD, Plummer JD. Diffusional hillock formation in Al thin films controlled by creep Materials Research Society Symposium - Proceedings. 594: 129-134. DOI: 10.1557/Proc-594-129  0.551
2000 Kim DK, Nix WD, Deal MD, Plummer JD. Creep-controlled diffusional hillock formation in blanket aluminum thin films as a mechanism of stress relaxation Journal of Materials Research. 15: 1709-1718. DOI: 10.1557/Jmr.2000.0246  0.529
2000 Kim DK, Heiland B, Nix WD, Arzt E, Deal MD, Plummer JD. Microstructure of thermal hillocks on blanket Al thin films Thin Solid Films. 371: 278-282. DOI: 10.1016/S0040-6090(00)00971-8  0.555
1992 Kim D, Fahrenbruch AL, Lopez-Otero A, Bube RH. Effect of Electron Irradiation and Excess Cd on Ion-Assisted Doping of p-CdTe Thin Films Mrs Proceedings. 262. DOI: 10.1557/Proc-262-187  0.331
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