Christopher S. Litteken, Ph.D. - Publications
Affiliations: | 2004 | Stanford University, Palo Alto, CA |
Area:
Materials Science Engineering, Mechanical EngineeringYear | Citation | Score | |||
---|---|---|---|---|---|
2008 | Gage DM, Kim K, Litteken CS, Dauskardt RH. Role of friction and loading parameters in four-point bend adhesion measurements Journal of Materials Research. 23: 87-96. DOI: 10.1557/Jmr.2008.0001 | 0.681 | |||
2008 | Kearney AV, Litteken CS, Mohler CE, Mills ME, Dauskardt RH. Pore size scaling for enhanced fracture resistance of nanoporous polymer thin films Acta Materialia. 56: 5946-5953. DOI: 10.1016/J.Actamat.2008.08.009 | 0.636 | |||
2005 | Litteken CS, Strohband S, Dauskardt RH. Residual stress effects on plastic deformation and interfacial fracture in thin-film structures Acta Materialia. 53: 1955-1961. DOI: 10.1016/J.Actamat.2005.01.005 | 0.602 | |||
2005 | Lee A, Litteken CS, Dauskardt RH, Nix WD. Comparison of the telephone cord delamination method for measuring interfacial adhesion with the four-point bending method Acta Materialia. 53: 609-616. DOI: 10.1016/J.Actamat.2004.10.014 | 0.703 | |||
2005 | Gage DM, Kim K, Litteken CS, Dauskardt RH. Effects of friction and loading parameters on four-point bend adhesion measurements of low-k thin film interconnect structures Proceedings of the Ieee 2005 International Interconnect Technology Conference, Iitc. 42-44. | 0.721 | |||
2003 | Litteken CS, Dauskardt RH. Adhesion of polymer thin-films and patterned lines International Journal of Fracture. 120: 475-485. DOI: 10.1023/A:1024940132299 | 0.686 | |||
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