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Marc De Graef - Publications

Affiliations: 
Carnegie Mellon University, Pittsburgh, PA 
Area:
Materials Science Engineering, Mechanical Engineering
Website:
https://engineering.cmu.edu/directory/bios/degraef-marc.html
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11/26 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2021 Brock JA, Kitcher MD, Vallobra P, Medapalli R, Li MP, De Graef M, Riley GA, Nembach HT, Mangin S, Sokalski V, Fullerton EE. Dynamic Symmetry Breaking in Chiral Magnetic Systems. Advanced Materials (Deerfield Beach, Fla.). e2101524. PMID 34363253 DOI: 10.1002/adma.202101524  0.326
2020 Wang F, Echlin MP, Taylor AA, Shin J, Bammes B, Levin BDA, De Graef M, Pollock TM, Gianola DS. Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition. Ultramicroscopy. 220: 113160. PMID 33197699 DOI: 10.1016/j.ultramic.2020.113160  0.45
2020 Zhu C, De Graef M. EBSD pattern simulations for an interaction volume containing lattice defects. Ultramicroscopy. 218: 113088. PMID 32784084 DOI: 10.1016/J.Ultramic.2020.113088  0.312
2018 Kashyap I, Jin YM, Vetter EP, Floro JA, De Graef M. Lorentz Transmission Electron Microscopy Image Simulations of Experimental Nano-Chessboard Observations in Co-Pt Alloys. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-6. PMID 29855395 DOI: 10.1017/S143192761800034X  0.437
2017 Callahan PG, Stinville JC, Yao ER, Echlin MP, Titus MS, De Graef M, Gianola DS, Pollock TM. Transmission scanning electron microscopy: Defect observations and image simulations. Ultramicroscopy. 186: 49-61. PMID 29268135 DOI: 10.1016/J.Ultramic.2017.11.004  0.485
2017 Callahan PG, Echlin MP, Pollock TM, De Graef M. Reconstruction of Laser-Induced Surface Topography from Electron Backscatter Diffraction Patterns. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 23: 730-740. PMID 28784197 DOI: 10.1017/S1431927617012326  0.45
2017 Prabhat KC, Aditya Mohan K, Phatak C, Bouman C, De Graef M. 3D reconstruction of the magnetic vector potential using model based iterative reconstruction. Ultramicroscopy. 182: 131-144. PMID 28689080 DOI: 10.1016/J.Ultramic.2017.07.005  0.54
2016 Akhtari-Zavareh A, De Graef M, Kavanagh KL. Magnetic phase shift reconstruction for uniformly magnetized nanowires. Ultramicroscopy. 172: 10-16. PMID 27744132 DOI: 10.1016/J.Ultramic.2016.10.002  0.329
2016 Phatak C, Heinonen O, De Graef M, Petford-Long A. Nanoscale skyrmions in a non-chiral metallic multiferroic: Ni2MnGa. Nano Letters. PMID 27186990 DOI: 10.1021/Acs.Nanolett.6B01011  0.49
2013 Venkatakrishnan SV, Drummy LF, Jackson MA, De Graef M, Simmons J, Bouman CA. A model based iterative reconstruction algorithm for high angle annular dark field-scanning transmission electron microscope (HAADF-STEM) tomography. Ieee Transactions On Image Processing : a Publication of the Ieee Signal Processing Society. 22: 4532-44. PMID 23955748 DOI: 10.1109/Tip.2013.2277784  0.377
2010 Phatak C, Petford-Long AK, De Graef M. Three-dimensional study of the vector potential of magnetic structures. Physical Review Letters. 104: 253901. PMID 20867379 DOI: 10.1103/Physrevlett.104.253901  0.549
Low-probability matches (unlikely to be authored by this person)
2013 Callahan PG, De Graef M. Dynamical electron backscatter diffraction patterns. Part I: pattern simulations. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 19: 1255-65. PMID 23800378 DOI: 10.1017/S1431927613001840  0.259
2015 Wright SI, Nowell MM, Lindeman SP, Camus PP, De Graef M, Jackson MA. Introduction and comparison of new EBSD post-processing methodologies. Ultramicroscopy. 159: 81-94. PMID 26342553 DOI: 10.1016/J.Ultramic.2015.08.001  0.254
2019 Wright SI, Singh S, De Graef M. Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-7. PMID 30914069 DOI: 10.1017/S1431927619000333  0.243
2017 Hansen LT, Jackson BE, Fullwood DT, Wright SI, De Graef M, Homer ER, Wagoner RH. Influence of Noise-Generating Factors on Cross-Correlation Electron Backscatter Diffraction (EBSD) Measurement of Geometrically Necessary Dislocations (GNDs). Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-12. PMID 28262082 DOI: 10.1017/S1431927617000204  0.233
2017 Singh S, De Graef M. Dictionary Indexing of Electron Channeling Patterns. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-10. PMID 28162123 DOI: 10.1017/S1431927616012769  0.231
2015 Chen YH, Park SU, Wei D, Newstadt G, Jackson MA, Simmons JP, De Graef M, Hero AO. A Dictionary Approach to Electron Backscatter Diffraction Indexing. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 21: 739-52. PMID 26055190 DOI: 10.1017/S1431927615000756  0.221
2018 Singh S, Guo Y, Winiarski B, Burnett TL, Withers PJ, De Graef M. High resolution low kV EBSD of heavily deformed and nanocrystalline Aluminium by dictionary-based indexing. Scientific Reports. 8: 10991. PMID 30030500 DOI: 10.1038/S41598-018-29315-8  0.219
2021 Chapman M, De Graef M, James RD, Chen X. Quantitative analysis of compatible microstructure by electron backscatter diffraction. Philosophical Transactions. Series a, Mathematical, Physical, and Engineering Sciences. 379: 20200112. PMID 34024127 DOI: 10.1098/rsta.2020.0112  0.217
2016 Burch MJ, Fancher CM, Patala S, De Graef M, Dickey EC. Mapping 180° polar domains using electron backscatter diffraction and dynamical scattering simulations. Ultramicroscopy. 173: 47-51. PMID 27907831 DOI: 10.1016/J.Ultramic.2016.11.013  0.216
2016 Jackson BE, Christensen JJ, Singh S, De Graef M, Fullwood DT, Homer ER, Wagoner RH. Performance of Dynamically Simulated Reference Patterns for Cross-Correlation Electron Backscatter Diffraction. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-14. PMID 27509538 DOI: 10.1017/S143192761601148X  0.213
2013 Waggoner J, Zhou Y, Simmons J, De Graef M, Wang S. 3D Materials image segmentation by 2D propagation: a graph-cut approach considering homomorphism. Ieee Transactions On Image Processing : a Publication of the Ieee Signal Processing Society. 22: 5282-93. PMID 24108718 DOI: 10.1109/Tip.2013.2284071  0.194
2003 De Graef M, Nuhfer NT, Cleary NJ. The digital microscopy classroom. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 8: 176-81. PMID 12539788  0.172
2021 Zhu C, Kurniawan C, Ochsendorf M, An D, Zaefferer S, De Graef M. Orientation, pattern center refinement and deformation state extraction through global optimization algorithms. Ultramicroscopy. 233: 113407. PMID 34800895 DOI: 10.1016/j.ultramic.2021.113407  0.155
2017 Ram F, Wright S, Singh S, De Graef M. Error analysis of the crystal orientations obtained by the dictionary approach to EBSD indexing. Ultramicroscopy. 181: 17-26. PMID 28478346 DOI: 10.1016/J.Ultramic.2017.04.016  0.138
2018 Jha D, Singh S, Al-Bahrani R, Liao WK, Choudhary A, De Graef M, Agrawal A. Extracting Grain Orientations from EBSD Patterns of Polycrystalline Materials Using Convolutional Neural Networks. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 24: 497-502. PMID 30334515 DOI: 10.1017/S1431927618015131  0.123
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