| Year |
Citation |
Score |
| 2023 |
Jaszewski ST, Calderon S, Shrestha B, Fields SS, Samanta A, Vega FJ, Minyard JD, Casamento JA, Maria JP, Podraza NJ, Dickey EC, Rappe AM, Beechem TE, Ihlefeld JF. Infrared Signatures for Phase Identification in Hafnium Oxide Thin Films. Acs Nano. PMID 38015799 DOI: 10.1021/acsnano.3c08371 |
0.784 |
|
| 2023 |
Henry MD, Smith SW, Fields SS, Jaszewski ST, Esteves G, Heinrich H, Ihlefeld JF. Impacts to FeRAM design arising from interfacial dielectric layers and wake up modulation in ferroelectric hafnium zirconium oxide. Ieee Transactions On Ultrasonics, Ferroelectrics, and Frequency Control. PMID 37703163 DOI: 10.1109/TUFFC.2023.3311328 |
0.771 |
|
| 2023 |
Kelley KP, Morozovska AN, Eliseev EA, Liu Y, Fields SS, Jaszewski ST, Mimura T, Calderon S, Dickey EC, Ihlefeld JF, Kalinin SV. Ferroelectricity in hafnia controlled via surface electrochemical state. Nature Materials. PMID 37580369 DOI: 10.1038/s41563-023-01619-9 |
0.667 |
|
| 2021 |
Jenkins MA, Holden KEK, Smith SW, Brumbach MT, Henry MD, Weiland C, Woicik JC, Jaszewski ST, Ihlefeld JF, Conley JF. Determination of Hafnium Zirconium Oxide Interfacial Band Alignments Using Internal Photoemission Spectroscopy and X-ray Photoelectron Spectroscopy. Acs Applied Materials & Interfaces. PMID 33749229 DOI: 10.1021/acsami.0c17729 |
0.702 |
|
| 2020 |
Fields SS, Smith SW, Ryan PJ, Jaszewski ST, Brummel IA, Salanova A, Esteves G, Wolfley SL, Henry M, Davids P, Ihlefeld J. Phase Exchange Driven Wake-Up and Fatigue in Ferroelectric Hafnium Zirconium Oxide Films. Acs Applied Materials & Interfaces. PMID 32410447 DOI: 10.1021/Acsami.0C03570 |
0.369 |
|
| 2018 |
Scott EA, Smith SW, Henry MD, Rost CM, Giri A, Gaskins JT, Fields SS, Jaszewski ST, Ihlefeld JF, Hopkins PE. Thermal resistance and heat capacity in hafnium zirconium oxide (Hf1–xZrxO2) dielectrics and ferroelectric thin films Applied Physics Letters. 113: 192901. DOI: 10.1063/1.5052244 |
0.66 |
|
| Show low-probability matches. |