| Year |
Citation |
Score |
| 2020 |
Shinki, Sarkar S. Dependence of the far-field optical response of ion beam sculpted Cu thin films on their surface correlations Applied Surface Science. 526: 146473. DOI: 10.1016/J.Apsusc.2020.146473 |
0.397 |
|
| 2018 |
Lohani D, Sarkar S. Nanoscale topographical fluctuations: A key factor for evaporative colloidal self-assembly. Langmuir : the Acs Journal of Surfaces and Colloids. PMID 30299962 DOI: 10.1021/Acs.Langmuir.8B02409 |
0.374 |
|
| 2018 |
Parida BK, Ranjan M, Sarkar S. Influence of obliquely incident primary ion species on patterning of CoSi binary mixtures: An experimental study Physica B-Condensed Matter. 545: 34-39. DOI: 10.1016/J.Physb.2018.05.039 |
0.421 |
|
| 2018 |
Parida BK, Ranjan M, Sarkar S. Morphological instabilities in argon ion sputtered CoSi binary mixtures Current Applied Physics. 18: 993-1000. DOI: 10.1016/J.Cap.2018.05.011 |
0.386 |
|
| 2016 |
Dhillon PK, Sarkar S. Erosion dynamics of faceted pyramidal surfaces Current Applied Physics. 16: 956-962. DOI: 10.1016/J.Cap.2016.05.017 |
0.402 |
|
| 2014 |
Dhillon PK, Brown PS, Bain CD, Badyal JPS, Sarkar S. Topographical length scales of hierarchical superhydrophobic surfaces Applied Surface Science. 317: 1068-1074. DOI: 10.1016/J.Apsusc.2014.08.106 |
0.364 |
|
| 2013 |
Dhillon PK, Sarkar S. Non-monotonic roughening at early stages of isotropic silicon etching Applied Surface Science. 284: 569-574. DOI: 10.1016/J.Apsusc.2013.07.135 |
0.393 |
|
| 2012 |
Dhillon PK, Sarkar S, Franquet A, Moussa A, Vandervorst W. Si nanoripples: A growth dynamical study Applied Surface Science. 258: 9579-9583. DOI: 10.1016/J.Apsusc.2012.05.150 |
0.377 |
|
| 2008 |
Sarkar S, Daele BV, Vandervorst W. Impact of repetitive and random surface morphologies on the ripple formation on ion bombarded SiGe-surfaces New Journal of Physics. 10: 83012. DOI: 10.1088/1367-2630/10/8/083012 |
0.419 |
|
| 2008 |
Saha B, Sarkar S, Chakraborty P, Gnaser H. Secondary emission of MCsn+ molecular ions under the joint influence of electropositive and electronegative elements Surface Science. 602: 1061-1065. DOI: 10.1016/J.Susc.2008.01.001 |
0.382 |
|
| 2008 |
Sarkar S, Daele BV, Vandervorst W. Ripple morphologies on ion irradiated Si1−xGex Applied Surface Science. 255: 1368-1372. DOI: 10.1016/J.Apsusc.2008.05.088 |
0.363 |
|
| 2006 |
Chattopadhyay S, Sarkar S, Datta A, Chakraborty P. Morphology of Au nanoparticles formed by magnetron sputtering: ellipsoids and rings Surface Engineering. 22: 208-211. DOI: 10.1179/174329406X108834 |
0.405 |
|
| 2005 |
Sarkar S, Datta A, Chakraborty P, Satpati B. Interface-dominated Growth of a Metastable Novel Alloy Phase Journal of Materials Research. 20: 2639-2646. DOI: 10.1557/Jmr.2005.0355 |
0.462 |
|
| 2005 |
Sarkar S, Datta A, Chakraborty P. FORMATION OF NOVEL Cu3Au ALLOY PHASE UNDER CONFINEMENT International Journal of Nanoscience. 4: 1011-1020. DOI: 10.1142/S0219581X05003991 |
0.429 |
|
| 2005 |
Sarkar S, Chakraborty P. Instantaneous surface work function dependence of MCsn + molecular ion emission under varying Cs environments Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 232: 153-158. DOI: 10.1016/J.Nimb.2005.03.038 |
0.355 |
|
| 2004 |
Sarkar S, Chakraborty P, Gnaser H. Energetics of M Cs + n molecular ions emitted from Cs + irradiated surfaces Physical Review B. 70: 195427. DOI: 10.1103/Physrevb.70.195427 |
0.339 |
|
| 2003 |
Sarkar S, Chakraborty P. Towards an understanding of MCsn+ formation mechanism in SIMS Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 212: 364-368. DOI: 10.1016/S0168-583X(03)01724-5 |
0.412 |
|
| 2003 |
Sarkar S, Datta A, Chakraborty P, Satpati B. Formation of a tetragonal Cu3Au alloy at gold/copper interfaces Surface and Interface Analysis. 35: 793-798. DOI: 10.1002/Sia.1603 |
0.439 |
|
| 2001 |
Sarkar S, Chakraborty P. Preferential Oxygen-Trapping in Metallic Multilayers: ASIMS Perspective Journal of the Chinese Chemical Society. 48: 521-524. DOI: 10.1002/Jccs.200100078 |
0.34 |
|
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