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Francois-Fabien Ferhani, Ph.D. - Publications

Affiliations: 
2008 Stanford University, Palo Alto, CA 
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3 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2008 Ferhani FF, Saxena NR, McCluskey EJ, Nigh P. How many test patterns are useless? Proceedings of the Ieee Vlsi Test Symposium. 23-28. DOI: 10.1109/VTS.2008.27  0.604
2007 Ferhani FF, McCluskey EJ. Classifying bad chips and ordering test sets Proceedings - International Test Conference. DOI: 10.1109/TEST.2006.297736  0.619
2004 McCluskey EJ, Al-Yamani A, Li JCM, Tseng CW, Volkerink E, Ferhani FF, Li E, Mitra S. ELF-Murphy data on defects and test sets Proceedings of the Ieee Vlsi Test Symposium. 16-22. DOI: 10.1109/VTEST.2004.1299220  0.342
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