Swarnagowri Addepalli, Ph.D.

Affiliations: 
2000 University of North Texas, Denton, TX, United States 
Area:
Analytical Chemistry
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"Swarnagowri Addepalli"
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Parents

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Jeffry A. Kelber grad student 2000 University of North Texas
 (High-temperature corrosion of aluminum alloys: Oxide -alloy interactions and sulfur interface chemistry.)
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Publications

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Addepalli S, Suda U. (2016) Influence of heat treatment on the structural, morphological and optical properties of DC magnetron sputtered TixSi1-xO2 films Bulletin of Materials Science. 39: 789-795
Bishop SM, Briggs BD, Rice ZP, et al. (2011) Fabrication and characterization of copper oxide resistive memory devices Materials Research Society Symposium Proceedings. 1337: 55-60
Addepalli S, Sivasubramani P, Kim MJ, et al. (2004) The electrical properties and stability of the hafnium silicate/Si 0.8Ge 0.2(100) interface Journal of Electronic Materials. 33: 1016-1021
Quevedo-Lopez M, El-Bouanani M, Addepalli S, et al. (2001) Thermally induced Zr incorporation into Si from zirconium silicate thin films Applied Physics Letters. 79: 2958-2960
Magtoto NP, Niu C, Ekstrom BM, et al. (2000) Dielectric breakdown of ultrathin aluminum oxide films induced by scanning tunneling microscopy Applied Physics Letters. 77: 2228-2230
Addepalli S, Magtoto NP, Kelber JA. (2000) Interactions at the Ni3Al(111)-S-Al2O3 interface at elevated temperatures: Ordering of Al2O3 on an S-modified substrate Langmuir. 16: 8352-8359
Addepalli SG, Magtoto NP, Kelber JA. (2000) H2S adsorption and the effect of sulfur on the oxidation of Ni3Al(111) Surface Science. 458: 123-134
Chen L, Magtoto NP, Addepalli S, et al. (2000) S-induced destabilization of aluminum oxide at the Fe(poly)-S-Al2O3 interface Oxidation of Metals. 54: 285-300
Addepalli SG, Lin JS, Ekstrom B, et al. (1999) Interactions at the Al-S-Fe interface: S inhibition of aluminum oxidation Oxidation of Metals. 52: 139-153
Addepalli SG, Ekstrom B, Magtoto NP, et al. (1999) STM atomic-scale characterization of the γ′-Al22O3 film on Ni3Al(111) Surface Science. 442: 385-389
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