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Hamed F. Dadgour, Ph.D. - Publications

Affiliations: 
2010 Electrical & Computer Engineering University of California, Santa Barbara, Santa Barbara, CA, United States 
Area:
Computer Engineering/ Electronics & Photonics
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17 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2011 Dadgour HF, Hussain MM, Cassell A, Singh N, Banerjee K. Impact of scaling on the performance and reliability degradation of metal-contacts in NEMS devices Ieee International Reliability Physics Symposium Proceedings. 3D.3.1-3D.3.10. DOI: 10.1109/IRPS.2011.5784489  0.509
2010 Dadgour HF, Hussain MM, Banerjee K. A new paradigm in the design of energy-efficient digital circuits using laterally-actuated double-gate NEMS Proceedings of the International Symposium On Low Power Electronics and Design. 7-12. DOI: 10.1145/1840845.1840848  0.546
2010 Dadgour HF, Hussain MM, Smith C, Banerjee K. Design and analysis of compact ultra energy-efficient logic gates using laterally-actuated double-electrode NEMS Proceedings - Design Automation Conference. 893-896. DOI: 10.1145/1837274.1837498  0.504
2010 Dadgour HF, Banerjee K. A Novel Variation-Tolerant Keeper Architecture for High-Performance Low-Power Wide Fan-In Dynamic or Gates Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 18: 1567-1577. DOI: 10.1109/Tvlsi.2009.2025591  0.62
2010 Rasouli SH, Dadgour HF, Endo K, Koike H, Banerjee K. Design optimization of FinFET domino logic considering the width quantization property Ieee Transactions On Electron Devices. 57: 2934-2943. DOI: 10.1109/Ted.2010.2076374  0.678
2010 Dadgour HF, Endo K, De VK, Banerjee K. Grain-orientation induced work function variation in nanoscale metal-gate transistors - Part II: Implications for process, device, and circuit design Ieee Transactions On Electron Devices. 57: 2515-2525. DOI: 10.1109/Ted.2010.2063270  0.637
2010 Dadgour HF, Endo K, De VK, Banerjee K. Grain-orientation induced work function variation in nanoscale metal-gate transistors - Part I: Modeling, analysis, and experimental validation Ieee Transactions On Electron Devices. 57: 2504-2514. DOI: 10.1109/Ted.2010.2063191  0.607
2010 Banerjee K, Li H, Xu C, Khatami Y, Dadgour HF, Sarkar D, Liu W. Prospects of carbon nanomaterials for next-generation green electronics 2010 10th Ieee Conference On Nanotechnology, Nano 2010. 56-61. DOI: 10.1109/NANO.2010.5698053  0.6
2010 Dadgour HF, Banerjee K. A built-in aging detection and compensation technique for improving reliability of nanoscale CMOS designs Ieee International Reliability Physics Symposium Proceedings. 822-825. DOI: 10.1109/IRPS.2010.5488727  0.486
2010 Dadgour H, Banerjee K. Aging-resilient design of pipelined architectures using novel detection and correction circuits Proceedings -Design, Automation and Test in Europe, Date. 244-249.  0.561
2009 Dadgour HF, Banerjee K. Hybrid NEMS-CMOS integrated circuits: A novel strategy for energy-efficient designs Iet Computers and Digital Techniques. 3: 593-608. DOI: 10.1049/Iet-Cdt.2008.0148  0.628
2008 Dadgour H, Endo K, Vivek D, Banerjee K. Modeling and analysis of grain-orientation effects in emerging metal-gate devices and implications for sram reliability Technical Digest - International Electron Devices Meeting, Iedm. DOI: 10.1109/IEDM.2008.4796792  0.36
2008 Dadgour H, Cassell AM, Banerjee K. Scaling and variability analysis of CNT-based NEMS devices and circuits with implications for process design Technical Digest - International Electron Devices Meeting, Iedm. DOI: 10.1109/IEDM.2008.4796742  0.391
2008 Dadgour H, De V, Banerjee K. Statistical modeling of metal-gate work-function variability in emerging device technologies and implications for circuit design Ieee/Acm International Conference On Computer-Aided Design, Digest of Technical Papers, Iccad. 270-277. DOI: 10.1109/ICCAD.2008.4681585  0.612
2007 Dadgour HF, Lin SC, Banerjee K. A statistical framework for estimation of full-chip leakage-power distribution under parameter variations Ieee Transactions On Electron Devices. 54: 2930-2945. DOI: 10.1109/Ted.2007.906960  0.621
2007 Dadgour HF, Banerjee K. Design and analysis of hybrid NEMS-CMOS circuits for ultra low-power applications Proceedings - Design Automation Conference. 306-311. DOI: 10.1109/DAC.2007.375177  0.368
2006 Dadgour HF, Joshi RV, Banerjee K. A novel variation-aware low-power keeper architecture for wide fan-in dynamic gates Proceedings - Design Automation Conference. 977-982. DOI: 10.1145/1146909.1147156  0.588
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