Robert E. Geer - Publications

Affiliations: 
Nanoscale Science and Engineering-Nanoscale Engineering State University of New York, Albany, Albany, NY, United States 
Area:
Nanotechnology, Nanoscience, Materials Science Engineering
Website:
https://sunypoly.edu/faculty-and-staff/robert-geer.html

40 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2019 Nounesis G, Geer R, Liu HY, Huang CC, Goodby JW. Effect of the hexatic-B temperature range on the nature of the smectic-A-hexatic-B phase transition. Physical Review. a, General Physics. 40: 5468-5471. PMID 9902830 DOI: 10.1103/Physreva.40.5468  0.636
2014 Wielgoszewski G, Jóźwiak G, Babij M, Baraniecki T, Geer R, Gotszalk T. Investigation of thermal effects in through-silicon vias using scanning thermal microscopy. Micron. 66: 63-68. PMID 25080278 DOI: 10.1016/J.Micron.2014.05.008  0.3
2014 Lund IN, Lee JH, Efstathiadis H, Haldar P, Geer R. The cycling performance and surface passivation qualities of a heterogeneous amorphous NixSiOy/polycrystalline NiSi2 core shell nanowire used as a Li-ion battery anode Journal of the Electrochemical Society. 161: A1772-A1776. DOI: 10.1149/2.0061412Jes  0.527
2014 Lund IN, Lee JH, Efstathiadis H, Haldar P, Geer RE. Influence of catalyst layer thickness on the growth of nickel silicide nanowires and its application for Li-ion batteries Journal of Power Sources. 246: 117-123. DOI: 10.1016/J.Jpowsour.2013.07.059  0.553
2013 Kawde AY, O'Toole AW, He X, Phillips R, Lemke A, Murray T, Geer R, Eisenbraun E. Electrochemical catalytic behavior for platinum functionalized TiO2 nanotube arrays in PEM fuel cells Prehospital and Disaster Medicine. 1497. DOI: 10.1557/Opl.2013.328  0.442
2013 He X, Phillips R, Kawde A, Hansen R, Lee JH, Lund I, Eisenbraun E, Geer RE. Si/TiOx core/shell nanowires with branched cathode support structures for Pt catalysts in PEM fuel cells Prehospital and Disaster Medicine. 1497. DOI: 10.1557/Opl.2013.327  0.613
2013 Phillips R, O'Toole A, He X, Hansen R, Geer R, Eisenbraun E. Processing and functionalization of conductive substoichiometric TiO 2 catalyst supports for PEM fuel cell applications Journal of Materials Research. 28: 461-467. DOI: 10.1557/Jmr.2012.324  0.533
2012 Carlsen A, Higashiya S, Topilina NI, Dunn KA, Geer RE, Eisenbraun ET, Kaloyeros AE, Welch JT. Metallization of a genetically engineered polypeptide. Macromolecular Bioscience. 12: 269-73. PMID 22147415 DOI: 10.1002/Mabi.201100245  0.302
2012 He X, Geer RE. High total-dose proton radiation tolerance in TiN/HfO2/TiN ReRAM devices Materials Research Society Symposium Proceedings. 1430: 165-170. DOI: 10.1557/Opl.2012.1101  0.457
2012 He X, Wang W, Butcher B, Tanachutiwat S, Geer RE. Superior TID hardness in TiN/HfO 2/TiN ReRAMs after proton radiation Ieee Transactions On Nuclear Science. 59: 2550-2555. DOI: 10.1109/Tns.2012.2208480  0.485
2012 Backes B, McDonough C, Smith L, Wang W, Geer RE. Effects of copper plasticity on the induction of stress in silicon from copper through-silicon vias (TSVs) for 3D integrated circuits Journal of Electronic Testing: Theory and Applications (Jetta). 28: 53-62. DOI: 10.1007/S10836-011-5242-7  0.661
2011 Lee JH, Lund IN, Eisenbraun ET, Geer RE. Silicide-induced multi-wall carbon nanotube growth on silicon nanowires. Nanotechnology. 22: 085603. PMID 21242615 DOI: 10.1088/0957-4484/22/8/085603  0.56
2011 He X, Tokranova NA, Wang W, Geer RE. Improved resistive switching properties in HfO2-based ReRAMs by Hf/Au doping Materials Research Society Symposium Proceedings. 1394: 81-86. DOI: 10.1557/Opl.2012.530  0.511
2010 Lee JH, Lund IN, Eisenbraun ET, Xue Y, Geer RE. Synthesis and characterization of templated si-based nanowires via vapor-liquid-solid (VLS) growth for electrical transport Inec 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings. 1140-1141. DOI: 10.1109/INEC.2010.5424988  0.537
2010 Briggs BD, Nagabhirava B, Rao G, Geer R, Gao H, Xu Y, Yu B. Electromechanical robustness of monolayer graphene with extreme bending Applied Physics Letters. 97. DOI: 10.1063/1.3519982  0.505
2009 Rao G, Mctaggart S, Lee JL, Geer RE. Study of electron beam irradiation induced defectivity in mono and bi layer graphene and the influence on Raman band position and line-width Materials Research Society Symposium Proceedings. 1184: 151-156. DOI: 10.1557/Proc-1184-Hh03-07  0.511
2007 Ul-hasan I, Geer R. Spectroscopic and Topographic Investigations of Nanoparticle Abrasive retention in Polyurethane CMP Pads for Cu CMP Mrs Proceedings. 991. DOI: 10.1557/Proc-0991-C02-02  0.665
2004 Zheng Y, Geer RE. Namomechanical imaging and nanoscale elastic modulus measurements of SnO 2 nanobelts Materials Research Society Symposium Proceedings. 821: 175-180. DOI: 10.1557/Proc-821-P2.3  0.32
2002 Dunn KA, Dovidenko K, Topol AW, Shekhawat GS, Geer RE, Kaloyeros AE. MOCVD ZnS:Mn films: Crystal structure and defect microstructure as a function of the growth parameters Materials Research Society Symposium - Proceedings. 695: 41-46. DOI: 10.1557/Proc-695-L2.5.1  0.364
2002 Geer RE, Kolosov OV, Briggs GAD, Shekhawat GS. Nanometer-scale mechanical imaging of aluminum damascene interconnect structures in a low-dielectric-constant polymer Journal of Applied Physics. 91: 4549-4555. DOI: 10.1063/1.1447330  0.311
2000 Talevi R, Gundlach H, Bian Z, Knorr A, Van Gestel M, Padiyar S, Kaloyeros AE, Geer RE, Shaffer EO, Martin S. Material and process studies in the integration of plasma-promoted chemical-vapor deposition of aluminum with benzocyclobutene low-dielectric constant polymer Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 18: 252-261. DOI: 10.1116/1.591180  0.695
2000 Wickland H, Talevi R, Bian Z, Nuesca G, Sankaran S, Kumar K, Geer RE, Kaloyeros AE, Liu J, Hummel J, Shatter EO, Martin SJ. Integration of chemical vapor deposition Al interconnects in a benzocyclobutene low dielectric constant polymer matrix: A feasibility study Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 18: 2463-2471. DOI: 10.1116/1.1308599  0.325
1999 Hermanns A, Shirey LM, Geer RE, Radler MJ, Bian Z, Ratna BR. Postprocessing sequence for liquid-crystal-on-silicon microdisplays Electronic Imaging. 3635: 103-111. DOI: 10.1117/12.343861  0.321
1997 Geer RE, Yang JY, Frank CW. Binary self-assembled monolayers for surface control of liquid-crystal orientation: an x-ray study Mrs Proceedings. 501: 173. DOI: 10.1557/Proc-501-173  0.302
1997 Schmitt J, Decker G, Dressick WJ, Brandow SL, Geer RE, Shashidhar R, Calvert JM. Metal nanoparticle/polymer superlattice films: Fabrication and control of layer structure Advanced Materials. 9: 61-65. DOI: 10.1002/Adma.19970090114  0.353
1995 Geer RE, Qadri SB, Shashidhar R, Thibodeaux AF, Duran RS. Off-specular x-ray scattering in Langmuir-Blodgett multilayers of a liquid-crystalline polymer. Physical Review. E, Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics. 52: 671-680. PMID 9963468 DOI: 10.1103/Physreve.52.671  0.304
1995 Geer RE, Thibodeaux AF, Duran RS, Shashidhar R. Interfacial structure and correlations in finite-sized liquid-crystalline polymer films Epl. 32: 419-424. DOI: 10.1209/0295-5075/32/5/007  0.356
1995 Geer RE, Shashidhar R. Crossover from static to thermal layer undulations in finite-size liquid-crystalline films Physical Review E. 51. DOI: 10.1103/Physreve.51.R8  0.346
1993 Geer RE, Qadri SB, Shashidhar R. X-Ray Specular Reflection Studies on Multilayer Films of a Ferroelectric Liquid Crystalline Polymer Ferroelectrics. 149: 147-158. DOI: 10.1080/00150199308217288  0.326
1992 Stoebe T, Geer R, Huang C, Goodby JW. Layer-by-layer surface ordering near a continuous transition in free-standing liquid-crystal films. Physical Review Letters. 69: 2090-2093. PMID 10046396 DOI: 10.1103/Physrevlett.69.2090  0.659
1992 Geer R, Stoebe T, Huang C. Thickness dependence of the interior smectic-A-hexatic-B transition temperatures in liquid-crystal films. Physical Review B. 45: 13055-13056. PMID 10001372 DOI: 10.1103/Physrevb.45.13055  0.661
1992 Geer R, Stoebe T, Huang C, Goodby J. Effect of surface crystal-E order on the interior smectic-A-hexatic-B transition Physical Review A. 46. PMID 9908003 DOI: 10.1103/Physreva.46.R6162  0.656
1992 Huang C, Geer R, Stoebe T. Heat Capacity Investigations of Extremely Thin Liquid-Crystal Free-Standing Films Molecular Crystals and Liquid Crystals. 212: 9-20. DOI: 10.1080/10587259208037244  0.66
1992 Geer R, Stoebe T, Huang CC, Pindak R, Goodby JW, Cheng M, Ho JT, Hui SW. Liquid-hexatic phase transitions in single molecular layers of liquid-crystal films Nature. 355: 152-154. DOI: 10.1038/355152A0  0.622
1991 Geer R, Stoebe T, Huang CC, Pindak R, Srajer G, Goodby JW, Cheng M, Ho JT, Hui SW. Hexatic and crystal phase transitions in thin free-standing liquid-crystal films. Physical Review Letters. 66: 1322-1325. PMID 10043176 DOI: 10.1103/Physrevlett.66.1322  0.623
1991 Cheng M, Ho JT, Hui SW, Goodby JW, Pindak R, Geer R, Huang CC. Orientational epitaxy of a crystal-E overlayer on a hexatic-B substrate. Physical Review. A. 44: R7891-R7893. PMID 9906023 DOI: 10.1103/Physreva.44.R7891  0.576
1991 Geer R, Stoebe T, Pitchford T, Huang CC. An ac calorimeter for measuring heat capacity of free-standing liquid-crystal films Review of Scientific Instruments. 62: 415-421. DOI: 10.1063/1.1142136  0.429
1989 Huang C, Nounesis G, Geer R, Goodby JW, Guillon D. Calorimetric study of the smectic-A-hexatic-B phase transition of a liquid-crystal binary mixture. Physical Review A. 39: 3741-3744. PMID 9901692 DOI: 10.1103/Physreva.39.3741  0.638
1989 Geer R, Stoebe T, Huang CC, Pindak R, Goodby J. Thermal Property Evolution Toward Effectively Two-Dimensional Substrate-Free Systems Mrs Proceedings. 177. DOI: 10.1557/Proc-177-299  0.371
1989 Geer R, Huang CC, Pindak R, Goodby JW. Heat-capacity anomaly from four-layer liquid-crystal films Physical Review Letters. 63: 540-543. DOI: 10.1103/Physrevlett.63.540  0.411
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