☰

Robert E. Geer - Publications

Affiliations: 
Nanoscale Science and Engineering-Nanoscale Engineering State University of New York, Albany, Albany, NY, United States 
Area:
Nanotechnology, Nanoscience, Materials Science Engineering
Website:
https://sunypoly.edu/faculty-and-staff/robert-geer.html
Tree Info Similar researchers PubMed Report error

40/111 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2019 Nounesis G, Geer R, Liu HY, Huang CC, Goodby JW. Effect of the hexatic-B temperature range on the nature of the smectic-A-hexatic-B phase transition. Physical Review. a, General Physics. 40: 5468-5471. PMID 9902830 DOI: 10.1103/Physreva.40.5468  0.636
2014 Wielgoszewski G, Jóźwiak G, Babij M, Baraniecki T, Geer R, Gotszalk T. Investigation of thermal effects in through-silicon vias using scanning thermal microscopy. Micron. 66: 63-68. PMID 25080278 DOI: 10.1016/J.Micron.2014.05.008  0.3
2014 Lund IN, Lee JH, Efstathiadis H, Haldar P, Geer R. The cycling performance and surface passivation qualities of a heterogeneous amorphous NixSiOy/polycrystalline NiSi2 core shell nanowire used as a Li-ion battery anode Journal of the Electrochemical Society. 161: A1772-A1776. DOI: 10.1149/2.0061412Jes  0.527
2014 Lund IN, Lee JH, Efstathiadis H, Haldar P, Geer RE. Influence of catalyst layer thickness on the growth of nickel silicide nanowires and its application for Li-ion batteries Journal of Power Sources. 246: 117-123. DOI: 10.1016/J.Jpowsour.2013.07.059  0.553
2013 Kawde AY, O'Toole AW, He X, Phillips R, Lemke A, Murray T, Geer R, Eisenbraun E. Electrochemical catalytic behavior for platinum functionalized TiO2 nanotube arrays in PEM fuel cells Prehospital and Disaster Medicine. 1497. DOI: 10.1557/Opl.2013.328  0.442
2013 He X, Phillips R, Kawde A, Hansen R, Lee JH, Lund I, Eisenbraun E, Geer RE. Si/TiOx core/shell nanowires with branched cathode support structures for Pt catalysts in PEM fuel cells Prehospital and Disaster Medicine. 1497. DOI: 10.1557/Opl.2013.327  0.613
2013 Phillips R, O'Toole A, He X, Hansen R, Geer R, Eisenbraun E. Processing and functionalization of conductive substoichiometric TiO 2 catalyst supports for PEM fuel cell applications Journal of Materials Research. 28: 461-467. DOI: 10.1557/Jmr.2012.324  0.533
2012 Carlsen A, Higashiya S, Topilina NI, Dunn KA, Geer RE, Eisenbraun ET, Kaloyeros AE, Welch JT. Metallization of a genetically engineered polypeptide. Macromolecular Bioscience. 12: 269-73. PMID 22147415 DOI: 10.1002/Mabi.201100245  0.302
2012 He X, Geer RE. High total-dose proton radiation tolerance in TiN/HfO2/TiN ReRAM devices Materials Research Society Symposium Proceedings. 1430: 165-170. DOI: 10.1557/Opl.2012.1101  0.457
2012 He X, Wang W, Butcher B, Tanachutiwat S, Geer RE. Superior TID hardness in TiN/HfO 2/TiN ReRAMs after proton radiation Ieee Transactions On Nuclear Science. 59: 2550-2555. DOI: 10.1109/Tns.2012.2208480  0.485
2012 Backes B, McDonough C, Smith L, Wang W, Geer RE. Effects of copper plasticity on the induction of stress in silicon from copper through-silicon vias (TSVs) for 3D integrated circuits Journal of Electronic Testing: Theory and Applications (Jetta). 28: 53-62. DOI: 10.1007/S10836-011-5242-7  0.661
2011 Lee JH, Lund IN, Eisenbraun ET, Geer RE. Silicide-induced multi-wall carbon nanotube growth on silicon nanowires. Nanotechnology. 22: 085603. PMID 21242615 DOI: 10.1088/0957-4484/22/8/085603  0.56
2011 He X, Tokranova NA, Wang W, Geer RE. Improved resistive switching properties in HfO2-based ReRAMs by Hf/Au doping Materials Research Society Symposium Proceedings. 1394: 81-86. DOI: 10.1557/Opl.2012.530  0.511
2010 Lee JH, Lund IN, Eisenbraun ET, Xue Y, Geer RE. Synthesis and characterization of templated si-based nanowires via vapor-liquid-solid (VLS) growth for electrical transport Inec 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings. 1140-1141. DOI: 10.1109/INEC.2010.5424988  0.537
2010 Briggs BD, Nagabhirava B, Rao G, Geer R, Gao H, Xu Y, Yu B. Electromechanical robustness of monolayer graphene with extreme bending Applied Physics Letters. 97. DOI: 10.1063/1.3519982  0.505
2009 Rao G, Mctaggart S, Lee JL, Geer RE. Study of electron beam irradiation induced defectivity in mono and bi layer graphene and the influence on Raman band position and line-width Materials Research Society Symposium Proceedings. 1184: 151-156. DOI: 10.1557/Proc-1184-Hh03-07  0.511
2007 Ul-hasan I, Geer R. Spectroscopic and Topographic Investigations of Nanoparticle Abrasive retention in Polyurethane CMP Pads for Cu CMP Mrs Proceedings. 991. DOI: 10.1557/Proc-0991-C02-02  0.665
2004 Zheng Y, Geer RE. Namomechanical imaging and nanoscale elastic modulus measurements of SnO 2 nanobelts Materials Research Society Symposium Proceedings. 821: 175-180. DOI: 10.1557/Proc-821-P2.3  0.32
2002 Dunn KA, Dovidenko K, Topol AW, Shekhawat GS, Geer RE, Kaloyeros AE. MOCVD ZnS:Mn films: Crystal structure and defect microstructure as a function of the growth parameters Materials Research Society Symposium - Proceedings. 695: 41-46. DOI: 10.1557/Proc-695-L2.5.1  0.364
2002 Geer RE, Kolosov OV, Briggs GAD, Shekhawat GS. Nanometer-scale mechanical imaging of aluminum damascene interconnect structures in a low-dielectric-constant polymer Journal of Applied Physics. 91: 4549-4555. DOI: 10.1063/1.1447330  0.311
2000 Talevi R, Gundlach H, Bian Z, Knorr A, Van Gestel M, Padiyar S, Kaloyeros AE, Geer RE, Shaffer EO, Martin S. Material and process studies in the integration of plasma-promoted chemical-vapor deposition of aluminum with benzocyclobutene low-dielectric constant polymer Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 18: 252-261. DOI: 10.1116/1.591180  0.695
2000 Wickland H, Talevi R, Bian Z, Nuesca G, Sankaran S, Kumar K, Geer RE, Kaloyeros AE, Liu J, Hummel J, Shatter EO, Martin SJ. Integration of chemical vapor deposition Al interconnects in a benzocyclobutene low dielectric constant polymer matrix: A feasibility study Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 18: 2463-2471. DOI: 10.1116/1.1308599  0.325
1999 Hermanns A, Shirey LM, Geer RE, Radler MJ, Bian Z, Ratna BR. Postprocessing sequence for liquid-crystal-on-silicon microdisplays Electronic Imaging. 3635: 103-111. DOI: 10.1117/12.343861  0.321
1997 Geer RE, Yang JY, Frank CW. Binary self-assembled monolayers for surface control of liquid-crystal orientation: an x-ray study Mrs Proceedings. 501: 173. DOI: 10.1557/Proc-501-173  0.302
1997 Schmitt J, Decker G, Dressick WJ, Brandow SL, Geer RE, Shashidhar R, Calvert JM. Metal nanoparticle/polymer superlattice films: Fabrication and control of layer structure Advanced Materials. 9: 61-65. DOI: 10.1002/Adma.19970090114  0.353
1995 Geer RE, Qadri SB, Shashidhar R, Thibodeaux AF, Duran RS. Off-specular x-ray scattering in Langmuir-Blodgett multilayers of a liquid-crystalline polymer. Physical Review. E, Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics. 52: 671-680. PMID 9963468 DOI: 10.1103/Physreve.52.671  0.304
1995 Geer RE, Thibodeaux AF, Duran RS, Shashidhar R. Interfacial structure and correlations in finite-sized liquid-crystalline polymer films Epl. 32: 419-424. DOI: 10.1209/0295-5075/32/5/007  0.356
1995 Geer RE, Shashidhar R. Crossover from static to thermal layer undulations in finite-size liquid-crystalline films Physical Review E. 51. DOI: 10.1103/Physreve.51.R8  0.346
1993 Geer RE, Qadri SB, Shashidhar R. X-Ray Specular Reflection Studies on Multilayer Films of a Ferroelectric Liquid Crystalline Polymer Ferroelectrics. 149: 147-158. DOI: 10.1080/00150199308217288  0.326
1992 Stoebe T, Geer R, Huang C, Goodby JW. Layer-by-layer surface ordering near a continuous transition in free-standing liquid-crystal films. Physical Review Letters. 69: 2090-2093. PMID 10046396 DOI: 10.1103/Physrevlett.69.2090  0.659
1992 Geer R, Stoebe T, Huang C. Thickness dependence of the interior smectic-A-hexatic-B transition temperatures in liquid-crystal films. Physical Review B. 45: 13055-13056. PMID 10001372 DOI: 10.1103/Physrevb.45.13055  0.661
1992 Geer R, Stoebe T, Huang C, Goodby J. Effect of surface crystal-E order on the interior smectic-A-hexatic-B transition Physical Review A. 46. PMID 9908003 DOI: 10.1103/Physreva.46.R6162  0.656
1992 Huang C, Geer R, Stoebe T. Heat Capacity Investigations of Extremely Thin Liquid-Crystal Free-Standing Films Molecular Crystals and Liquid Crystals. 212: 9-20. DOI: 10.1080/10587259208037244  0.66
1992 Geer R, Stoebe T, Huang CC, Pindak R, Goodby JW, Cheng M, Ho JT, Hui SW. Liquid-hexatic phase transitions in single molecular layers of liquid-crystal films Nature. 355: 152-154. DOI: 10.1038/355152A0  0.622
1991 Geer R, Stoebe T, Huang CC, Pindak R, Srajer G, Goodby JW, Cheng M, Ho JT, Hui SW. Hexatic and crystal phase transitions in thin free-standing liquid-crystal films. Physical Review Letters. 66: 1322-1325. PMID 10043176 DOI: 10.1103/Physrevlett.66.1322  0.623
1991 Cheng M, Ho JT, Hui SW, Goodby JW, Pindak R, Geer R, Huang CC. Orientational epitaxy of a crystal-E overlayer on a hexatic-B substrate. Physical Review. A. 44: R7891-R7893. PMID 9906023 DOI: 10.1103/Physreva.44.R7891  0.576
1991 Geer R, Stoebe T, Pitchford T, Huang CC. An ac calorimeter for measuring heat capacity of free-standing liquid-crystal films Review of Scientific Instruments. 62: 415-421. DOI: 10.1063/1.1142136  0.429
1989 Huang C, Nounesis G, Geer R, Goodby JW, Guillon D. Calorimetric study of the smectic-A-hexatic-B phase transition of a liquid-crystal binary mixture. Physical Review A. 39: 3741-3744. PMID 9901692 DOI: 10.1103/Physreva.39.3741  0.638
1989 Geer R, Stoebe T, Huang CC, Pindak R, Goodby J. Thermal Property Evolution Toward Effectively Two-Dimensional Substrate-Free Systems Mrs Proceedings. 177. DOI: 10.1557/Proc-177-299  0.371
1989 Geer R, Huang CC, Pindak R, Goodby JW. Heat-capacity anomaly from four-layer liquid-crystal films Physical Review Letters. 63: 540-543. DOI: 10.1103/Physrevlett.63.540  0.411
Low-probability matches (unlikely to be authored by this person)
2001 Harris W, Tarte LL, Bakhru H, Gibson W, Wu D, Geer RE, Wollman DA. Energy dispersive x-ray analysis using a microcalorimeter detector Characterization and Metrology For Ulsi Technology. 550: 412-415. DOI: 10.1063/1.1354434  0.299
1998 Geer RE, Singer SJ, Selinger JV, Ratna BR, Shashidhar R. Electric-field-induced layer buckling in chiral smectic-A liquid crystals Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics. 57: 3059-3062. DOI: 10.1103/Physreve.57.3059  0.299
2001 Shekhawat GS, Briggs GAD, Kolosov OV, Geer RE. Nanoscale elastic imaging and mechanical modulus measurements of aluminum/low-k dielectric interconnect structures Characterization and Metrology For Ulsi Technology. 550: 449-452. DOI: 10.1063/1.1354440  0.298
2013 Privitera S, Bersuker G, Butcher B, Kalantarian A, Lombardo S, Bongiorno C, Geer R, Gilmer DC, Kirsch PD. Microscopy study of the conductive filament in HfO2 resistive switching memory devices Microelectronic Engineering. 109: 75-78. DOI: 10.1016/J.Mee.2013.03.145  0.294
1994 Crawford GP, Geer RE, Naciri J, Shashidhar R, Ratna BR. Influence of the electric field on the quasibookshelf stripe deformation in an electroclinic liquid crystal Applied Physics Letters. 65: 2937-2939. DOI: 10.1063/1.112540  0.294
1998 Sprunt S, Geer RE, Crawford GP, Naciri J, Ratna BR, Shashidhar R. Large second-order optical nonlinearity in a molecular crystal formed from a chiral smectic liquid crystal Journal of Applied Physics. 83: 2392-2398. DOI: 10.1063/1.366998  0.29
1997 Crandall KA, Taylor SB, Kakarla UK, Naciri JW, Shashidhar R, Geer RE. Development of liquid crystalline materials for IR sensing Electronic Imaging. 3015: 105-111. DOI: 10.1117/12.271385  0.289
1998 Shaffer EO, Mills ME, Hawn D, Van Gestel M, Knorr A, Gundlach H, Kumar K, Kaloyeros AE, Geer RE. Adhesion energy measurements of multilayer low-K dielectric materials for ULSI applications Materials Research Society Symposium - Proceedings. 511: 133-138. DOI: 10.1557/Proc-511-133  0.288
1996 Turner DC, Peek BM, Wertz TE, Archibald DD, Geer RE, Gaber BP. Enzymatic modification of a chemisorbed lipid monolayer Langmuir. 12: 4411-4416. DOI: 10.1021/La951520O  0.286
1989 Geer R, Liu H, Hobbie E, Nounesis G, Huang C, Goodby J. Critical slowing down near the smectic-A-hexatic-B transition Journal De Physique. 50: 3167-3172. DOI: 10.1051/Jphys:0198900500200316700  0.286
2002 Geer RE, Wu D, Wollman DA. High-resolution energy-dispersive x-ray spectroscopic analysis of ultrathin ion diffusion barriers using microcalorimetry Journal of Applied Physics. 91: 1099-1103. DOI: 10.1063/1.1415762  0.285
2002 Dovidenko K, Rullan J, Moore R, Dunn KA, Geer RE, Heuchling F. FIB-assisted Pt deposition for carbon nanotube integration and 3-D nanoengineering Materials Research Society Symposium - Proceedings. 739: 193-198. DOI: 10.1557/Proc-739-H7.7  0.28
2019 Carroll R, Tulipe DL, Coolbaugh D, Geer R. Collective Cu-Cu Thermocompression Bonding Using Pillars Journal of Microelectronics and Electronic Packaging. 16: 28-38. DOI: 10.4071/Imaps.741710  0.28
2011 Kharche N, Manjari SR, Zhou Y, Geer RE, Nayak SK. A comparative study of quantum transport properties of silver and copper nanowires using first principles calculations. Journal of Physics. Condensed Matter : An Institute of Physics Journal. 23: 085501. PMID 21411899 DOI: 10.1088/0953-8984/23/8/085501  0.28
2000 Shekhawat GS, Kolosov OV, Briggs GAD, Shaffer EO, Martin S, Geer RE. Nanoscale elastic imaging of aluminum/low-k dielectric interconnect structures Materials Research Society Symposium - Proceedings. 612. DOI: 10.1557/Proc-612-D10.7.1  0.279
2006 Zheng Y, Geer RE, Dovidenko K, Kopycinska-Müller M, Hurley DC. Quantitative nanoscale modulus measurements and elastic imaging of SnO 2 nanobelts Journal of Applied Physics. 100. DOI: 10.1063/1.2401027  0.277
1996 Geer RE, Naciri J, Ratna BR, Shashidhar R. Optimization of pyroelectricity in the smectic-C* phase of a liquid-crystalline terpolymer Applied Physics Letters. 69: 1405-1407. DOI: 10.1063/1.117596  0.274
2011 Lee JH, Carpenter MA, Geer RE. Novel growth mode of solid-liquid-solid (SLS) silica nanowires Journal of Materials Research. 26: 2232-2239. DOI: 10.1557/Jmr.2011.119  0.273
2001 Altemus B, Shekhawat G, Xu B, Geer RE, Castracane J. Nanoscale elastic imaging of micro-electro-mechanical system based micromirrors Proceedings of Spie. 4558: 143-150. DOI: 10.1117/12.442995  0.27
1996 Lindle JR, Flom SR, Bartoli FJ, Harter AT, Geer RE, Ratna BR, Shashidhar R. Spatially resolved characterization of the electroclinic effect in chiral smectic A liquid crystals Materials Research Society Symposium - Proceedings. 425: 191-196. DOI: 10.1557/Proc-425-191  0.268
1997 Kotov NA, Haraszti T, Turi L, Zavala G, Geer RE, Dékány I, Fendler JH. Mechanism of and defect formation in the self-assembly of polymeric polycation-montmorillonite ultrathin films Journal of the American Chemical Society. 119: 6821-6832. DOI: 10.1021/Ja964409T  0.256
2019 Carroll R, Geer RE. Fault localization in a 3D test assembly using voltage contrast imaging Microelectronics Journal. 87: 73-80. DOI: 10.1016/J.Mejo.2019.03.015  0.256
2007 Kaloyeros AE, Stan MR, Arkles B, Geer R, Eisenbraun ET, Raynolds JE, Gadre A, Xue Y, Ryan J. Conformational molecular switches for post-CMOS nanoelectronics Ieee Transactions On Circuits and Systems I: Regular Papers. 54: 2345-2352. DOI: 10.1109/Tcsi.2007.907827  0.253
2000 Xu B, Castracane J, Geer RE, Yao Y, Altemus B. Process development and fabrication of application-specific microvalves Proceedings of Spie. 4174: 299-306. DOI: 10.1117/12.396446  0.252
2011 Rana N, Kossow C, Eisenbraun ET, Geer RE, Kaloyeros AE. Controlling interfacial adhesion of self-assembled polypeptide fibrils for novel nanoelectromechanical system (NEMS) applications Micromachines. 2: 1-16. DOI: 10.3390/Mi2010001  0.247
2002 Shekhawat GS, Xie H, Zheng Y, Geer RE. Near-field ultrasonic imaging: A novel method for nondestructive mechanical imaging of IC interconnect structures Materials Research Society Symposium - Proceedings. 716: 519-524. DOI: 10.1557/Proc-716-B11.14  0.245
2006 Topilina NI, Higashiya S, Rana N, Ermolenkov VV, Kossow C, Carlsen A, Ngo SC, Wells CC, Eisenbraun ET, Dunn KA, Lednev IK, Geer RE, Kaloyeros AE, Welch JT. Bilayer fibril formation by genetically engineered polypeptides: preparation and characterization. Biomacromolecules. 7: 1104-11. PMID 16602727 DOI: 10.1021/Bm0509016  0.239
2003 Xie H, Li B, Geer R, Xu B, Castracane J. Focused ion beam Moiré method Optics and Lasers in Engineering. 40: 163-177. DOI: 10.1016/S0143-8166(02)00099-4  0.234
2002 Li B, Xie H, Xu B, Geer R, Castracane J. Investigation of strain in microstructures by a novel moire method Ieee\/Asme Journal of Microelectromechanical Systems. 11: 829-836. DOI: 10.1109/Jmems.2002.805044  0.226
2000 Shashidhar R, Geer RE. Surface-induced undulations in a liquid crystalline polymer International Journal of Engineering Science. 38: 1049-1056. DOI: 10.1016/S0020-7225(99)00103-2  0.225
2000 Sankaran S, Harris W, Nuesca G, Shaffer EO, Hiartin SJ, Geer RE. Development of TiSiN diffusion barriers for Cu/SiLK metallization schemes Proceedings of the Ieee 2000 International Interconnect Technology Conference, Iitc 2000. 40-42. DOI: 10.1109/IITC.2000.854275  0.215
2002 Nandini A, Roy U, Mallikarjunan A, Kumar A, Fortin J, Shekhawat GS, Geer R, Dovidenko K, Lifshin E, Bakhru H, Lu TM. Modification of Low ĸ Materials for ULSI Multilevel Interconnects by Ion Implantation Mrs Proceedings. 716: 349-354. DOI: 10.1557/Proc-716-B7.19  0.204
1994 Geer RE, Stenger DA, Chen MS, Calvert JM, Shashidhar R, Jeong YH, Pershan PS. X-ray and ellipsometric studies of self-assembled monolayers of fluorinated chlorosilanes Langmuir. 10: 1171-1176. DOI: 10.1021/La00016A034  0.201
1994 Geer R, Qadri S, Shashidhar R, Thibodeaux AF, Duran RS. X-ray investigations of langmuir-blodgett multilayer films of side-chain liquid crystal copolymers Liquid Crystals. 16: 869-875. DOI: 10.1080/02678299408027857  0.2
2010 Matyi RJ, Geer RE. Implementation of a curriculum leading to a baccalaureate degree in nanoscale science Materials Research Society Symposium Proceedings. 1233: 141-151. DOI: 10.1557/Proc-1233-Pp09-02  0.19
2004 Zheng Y, Geer RE. Nondestructive mechanical imaging of SnO 2 nanobelts Proceedings of Spie - the International Society For Optical Engineering. 5392: 14-20. DOI: 10.1117/12.540411  0.185
2001 Padiyar S, Chen L, Efstadhiadis H, Geer RE. Remote vapor phase processing of organic semiconductors for optoelectronic applications Proceedings of Spie - the International Society For Optical Engineering. 4279: 117-122. DOI: 10.1117/12.429374  0.178
1995 Geer RE, Qadri SB, Shashidhar R, Thibodeaux AF, Duran RS. Off-specular x-ray scattering in Langmuir-Blodgett multilayers of a liquid-crystalline polymer Physical Review E. 52: 671-680. DOI: 10.1103/PhysRevE.52.671  0.171
1998 Geer RE, Yang JY, Frank CW. Binary self-assembled monolayers for surface control of liquid-crystal orientation: An X-ray study Materials Research Society Symposium - Proceedings. 501: 173-178.  0.171
2003 Muthuswami L, Zheng Y, Geer RE. Nondestructive nanomechanical imaging: Cross-sectional ultrasonic force microscopy of integrated circuit test structures Proceedings of Spie - the International Society For Optical Engineering. 5045: 54-62. DOI: 10.1117/12.483994  0.17
2014 Xu M, Carroll R, Manem H, Geer R. RF characterization of Through Silicon Via test structures in a 3-tier stacked wafer Asmc (Advanced Semiconductor Manufacturing Conference) Proceedings. 73-77. DOI: 10.1109/ASMC.2014.6846980  0.157
1993 Geer RE, Shashidhar R, Thibodeaux AF, Duran RS. X-ray diffuse scattering study of static undulations in multilayer films of a liquid-crystalline polymer. Physical Review Letters. 71: 1391-1394. PMID 10055528 DOI: 10.1103/PhysRevLett.71.1391  0.15
2002 Muthuswami L, Moyer ES, Li Z, Thompson E, Dunn K, Victoria A, Shekhawat GS, Geer RE. Cross-sectional elastic imaging and mechanical defect detection in low-k dielectrics in integrated circuit interconnect test structures Materials Research Society Symposium - Proceedings. 716: 557-562.  0.15
2000 Shekhawat GS, Kolosov OV, Briggs GAD, Shaffer EO, Martin SJ, Geer RE. Nanoscale elastic imaging: A new metrology tool for low-k dielectric integration Proceedings of the Ieee 2000 International Interconnect Technology Conference, Iitc 2000. 96-98. DOI: 10.1109/IITC.2000.854293  0.146
2002 Muthuswami L, Moyer ES, Li Z, Geer RE. Cross-sectional elastic imaging and defect detection in low-k spin-on dielectrics Proceedings of the Ieee 2002 International Interconnect Technology Conference, Iitc 2002. 239-241. DOI: 10.1109/IITC.2002.1014945  0.14
2002 Rana N, Bousman K, Shekhawat GS, Sirinakis G, Heuchling F, Welch J, Eisenbraun ET, Geer RE, Kaloyeros AE. Investigations of substrate-selective covalent attachment for genetically-engineered molecular interconnects Materials Research Society Symposium - Proceedings. 728: 45-52.  0.128
2009 Rao G, McTaggart S, Lee JU, Geer RE. Characterization of nano-scale graphene devices for thickness and defect metrology using micro and nano-raman spectroscopy Aip Conference Proceedings. 1173: 139-142. DOI: 10.1063/1.3251209  0.119
2007 Muthaswami L, Zheng Y, Vajtai R, Shehkawat G, Ajayan P, Geer RE. Variation of radial elasticity in multiwalled carbon nanotubes. Nano Letters. 7: 3891-4. PMID 18020474 DOI: 10.1021/Nl072002O  0.111
2014 He X, Geer RE. Universal-ion irradiation dose threshold and error recovery in HfO 2 resistance random access memory Ieee Aerospace Conference Proceedings. DOI: 10.1109/AERO.2014.6836362  0.106
2003 Kaloyeros AE, Eisenbraun ET, Welch J, Geer RE. Exploiting nanotechnology for terahertz interconnects Semiconductor International. 26: 56-59.  0.104
2003 Muthuswami L, Ajayan PM, Geer RE. Nanomechanical imaging of multi-walled carbon nanotubes Materials Research Society Symposium - Proceedings. 778: 151-156.  0.102
2008 Jae Ho L, Rogers PH, Carpenter MA, Eisenbraun ET, Yongqiang X, Geer RE. Synthesis and properties of templated Si-based nanowires for electrical transport 2008 8th Ieee Conference On Nanotechnology, Ieee-Nano. 584-587. DOI: 10.1109/NANO.2008.173  0.101
2008 Bennett SG, Steinke D, McTaggart SA, Rao G, Borst CL, Geer RE, Lee JU. Post-CMOS graphene device integration 2008 Proceedings - 25th International Vlsi Multilevel Interconnection Conference, Vmic 2008. 283-290.  0.099
2013 He X, Geer RE. Heavy ion radiation effects on TiN/HfO2/W resistive random access memory Ieee Aerospace Conference Proceedings. DOI: 10.1109/AERO.2013.6497401  0.099
2011 McDonough C, Backes B, Wang W, Caramto R, Geer RE. Thermal and spatial dependence of TSV-induced stress in Si 2011 Ieee International Interconnect Technology Conference and 2011 Materials For Advanced Metallization, Iitc/Mam 2011. DOI: 10.1109/IITC.2011.5940275  0.097
2012 Wang Y, Geer RE. Surface potential measurements of reconfigurable p-n junctions in graphene Ecs Transactions. 45: 31-37. DOI: 10.1149/1.3700450  0.095
2010 Lee JH, Lund IN, Eisenbraun ET, Geer RE. Synthesis and characterization of templated Si-based nanowires for electrical transport Advanced Metallization Conference (Amc). 29-30.  0.095
2007 McDonough C, Atesang J, Wang Y, Geer RE. Investigation of apertureless NSOM for measurement of stress in strained silicon-on-insulator test structures Aip Conference Proceedings. 931: 94-98. DOI: 10.1063/1.2799444  0.094
2004 Muthuswami L, Geer RE. Nanomechanical defect imaging in premetal dielectrics for integrated circuits Applied Physics Letters. 84: 5082-5084. DOI: 10.1063/1.1756673  0.088
2016 Manem H, Xu M, Carroll R, Geer R. Design considerations for three dimensional integrated circuits for aerospace applications Ieee Aerospace Conference Proceedings. 2016. DOI: 10.1109/AERO.2016.7500735  0.08
2015 Manem H, Beckmann K, Xu M, Carroll R, Geer R, Cady NC. An extendable multi-purpose 3D neuromorphic fabric using nanoscale memristors 2015 Ieee Symposium On Computational Intelligence For Security and Defense Applications, Cisda 2015 - Proceedings. 35-42. DOI: 10.1109/CISDA.2015.7208625  0.08
2011 McDonough C, Backes B, Wei Wang, Geer RE. Thermal and spatial profiling of TSV-induced stress in 3DICs Ieee International Reliability Physics Symposium Proceedings. 5D.2.1-5D.2.6. DOI: 10.1109/IRPS.2011.5784530  0.073
2007 McDonough C, Atesang J, Wang Y, Geer RE. Investigation of apertureless NSOM for measurement of stress in strained silicon Ecs Transactions. 6: 235-244. DOI: 10.1149/1.2728866  0.068
2005 Kaloyeros AE, Eisenbraun ET, Welch J, Geer RE. Molecular interconnects: A bottom-up paradigm for signal propagation Semiconductor International. 28: 46-52.  0.065
2010 Ok I, Veksler D, Hung PY, Oh J, Moore RL, McDonough C, Geer RE, Gaspe CK, Santos MB, Wong G, Kirsch P, Tseng HH, Bersuker G, Hobbs C, Jammy R. Reducing Rext in laser annealed enhancement-mode In 0.53Ga0.47as surface channel n-MOSFET Proceedings of 2010 International Symposium On Vlsi Technology, System and Application, Vlsi-Tsa 2010. 38-39. DOI: 10.1109/VTSA.2010.5488957  0.054
2009 Chidambaram T, Mcdonough C, Geer R, Wang W. TSV stress testing and modeling for 3D IC applications Proceedings of the International Symposium On the Physical and Failure Analysis of Integrated Circuits, Ipfa. 723-726. DOI: 10.1109/IPFA.2009.5232736  0.044
2011 Hung PY, McDonough C, Geer R, Hill R, Deeb C, Rader K, Jammy R. Characterization scheme for III-V junction development Ecs Transactions. 35: 319-324. DOI: 10.1149/1.3569924  0.029
2005 Geer RE, Meyendorf N, Boaklini GY, Michael B. Proceeding of SPIE - The International Society for Optical Engineering: Introduction Proceedings of Spie - the International Society For Optical Engineering. 5766.  0.027
2004 Geer R, Smith J. Strategies to take hospitals off (revenue) diversion. Healthcare Financial Management : Journal of the Healthcare Financial Management Association. 58: 70-4. PMID 15029802  0.02
2003 Geer R. Improving collections in the ED. Patient Accounts. 26: 1-3. PMID 14582212  0.018
2003 Geer R, Burton E. Containing revenue-cycle costs. Healthcare Financial Management : Journal of the Healthcare Financial Management Association. 57: 38-42. PMID 12735186  0.017
Hide low-probability matches.