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Nathan Hindman, Ph.D. - Publications

Affiliations: 
2012 Electrical Engineering Arizona State University, Tempe, AZ, United States 
Area:
Electronics and Electrical Engineering
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7 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2011 Hindman ND, Clark LT, Patterson DW, Holbert KE. Fully automated, testable design of fine-grained triple mode redundant logic Ieee Transactions On Nuclear Science. 58: 3046-3052. DOI: 10.1109/Tns.2011.2169280  0.525
2011 Clark LT, Patterson DW, Hindman ND, Holbert KE, Maurya S, Guertin SM. A dual mode redundant approach for microprocessor soft error hardness Ieee Transactions On Nuclear Science. 58: 3018-3025. DOI: 10.1109/Tns.2011.2168828  0.529
2011 Clark LT, Pettit DE, Holbert KE, Hindman ND. Validation of and delay variation in total ionizing dose hardened standard cell libraries Proceedings - Ieee International Symposium On Circuits and Systems. 2051-2054. DOI: 10.1109/ISCAS.2011.5938000  0.533
2010 Yao X, Clark LT, Chellappa S, Holbert KE, Hindman ND. Design and experimental validation of radiation hardened by design SRAM cells Ieee Transactions On Nuclear Science. 57: 258-265. DOI: 10.1109/Tns.2009.2034661  0.553
2009 Hindman ND, Pettit DE, Patterson DW, Nielsen KE, Yao X, Holbert KE, Clark LT. High speed redundant self-correcting circuits for radiation hardened by design logic Proceedings of the European Conference On Radiation and Its Effects On Components and Systems, Radecs. 465-472. DOI: 10.1109/RADECS.2009.5994697  0.325
2008 Yao X, Hindman N, Clark LT, Holbert KE, Alexander DR, Shedd WM. The impact of total ionizing dose on unhardened SRAM cell margins Ieee Transactions On Nuclear Science. 55: 3280-3287. DOI: 10.1109/Tns.2008.2007122  0.542
2007 Hindman ND, Wang Z, Clark LT, Allee DR. Experimentally measured input referred voltage offsets and kickback noise in RHBD analog comparator arrays Ieee Transactions On Nuclear Science. 54: 2073-2079. DOI: 10.1109/Tns.2007.908654  0.476
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