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Patrick A. Juliano, Ph.D. - Publications

Affiliations: 
2001 University of Illinois, Urbana-Champaign, Urbana-Champaign, IL 
Area:
Electronics and Electrical Engineering
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6 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2002 Voldman SH, Ronan B, Juliano PA, Botula A, Hui DT, Lanzerotti LD. Silicon germanium heterojunction bipolar transistor electrostatic discharge power clamps and the Johnson Limit in RF BICMOS SiGe technology Journal of Electrostatics. 56: 341-362. DOI: 10.1016/S0304-3886(02)00064-5  0.388
2001 Juliano PA, Rosenbaum E. Accurate wafer-level measurement of BSD protection device turn-on using a modified very fast transmission-line pulse system Ieee Transactions On Device and Materials Reliability. 1: 95-103. DOI: 10.1109/7298.956702  0.493
2001 Wang Y, Juliano P, Joshi S, Rosenbaum E. Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits Microelectronics Reliability. 41: 1781-1787. DOI: 10.1016/S0026-2714(01)00034-8  0.44
2001 Juliano PA, Rosenbaum E. A novel SCR macromodel for ESD circuit simulation Technical Digest - International Electron Devices Meeting. 319-322.  0.549
2001 Voldman SH, Botula A, Hui DT, Juliano PA. Silicon Germanium heterojunction bipolar transistor ESD power clamps and the Johnson Limit Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 2001: 324-334.  0.309
2000 Wu J, Juliano P, Rosenbaum E. Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 287-295. DOI: 10.1016/S0026-2714(01)00033-6  0.468
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