| Year |
Citation |
Score |
| 2018 |
Barclay JD, Okobiah O, Deng L, Sengphanlaya T, Du J, Reidy RF. High temperature water as a clean and etch of low-k and SiO2 films Microelectronic Engineering. 196: 54-58. DOI: 10.1016/J.Mee.2018.04.016 |
0.358 |
|
| 2015 |
Ballard JB, Dick DD, McDonnell SJ, Bischof M, Fu J, Owen JH, Owen WR, Alexander JD, Jaeger DL, Namboodiri P, Fuchs E, Chabal YJ, Wallace RM, Reidy R, Silver RM, et al. Atomically Traceable Nanostructure Fabrication. Journal of Visualized Experiments : Jove. PMID 26274555 DOI: 10.3791/52900 |
0.325 |
|
| 2014 |
Sondhi A, Okobiah O, Chattopadhyay S, Shibata T, Scharf TW, Reidy RF. X-ray absorption spectroscopy studies on the carbothermal reduction reaction products of 3 mol% yttria-stabilized zirconia Journal of Applied Crystallography. 47: 1512-1519. DOI: 10.1107/S1600576714014642 |
0.31 |
|
| 2014 |
Smith TS, Lynch KM, Cooper CM, Okobiah O, Osei-Yiadom E, Bischof M, Kouloumpis A, Baikousi M, Dimos K, Reidy RF. Wetting behavior of plasma treated low-k films in dHF cleans solutions Microelectronic Engineering. 128: 79-84. DOI: 10.1016/J.Mee.2014.05.006 |
0.339 |
|
| 2013 |
Polley CM, Clarke WR, Miwa JA, Scappucci G, Wells JW, Jaeger DL, Bischof MR, Reidy RF, Gorman BP, Simmons M. Exploring the limits of N-type ultra-shallow junction formation. Acs Nano. 7: 5499-505. PMID 23721101 DOI: 10.1021/Nn4016407 |
0.311 |
|
| 2013 |
Sondhi A, Morandi C, Reidy RF, Scharf TW. Theoretical and Experimental Investigations on the Mechanism of Carbothermal Reduction of Zirconia (Preprint) Ceramics International. 39: 4489-4497. DOI: 10.1016/J.Ceramint.2012.11.043 |
0.319 |
|
| 2012 |
Schmucker SW, Kumar N, Abelson JR, Daly SR, Girolami GS, Bischof MR, Jaeger DL, Reidy RF, Gorman BP, Alexander J, Ballard JB, Randall JN, Lyding JW. Field-directed sputter sharpening for tailored probe materials and atomic-scale lithography. Nature Communications. 3: 935. PMID 22760634 DOI: 10.1038/Ncomms1907 |
0.314 |
|
| 2009 |
Vinogradova E, Osei-Yiadom E, Smith CE, Mueller DW, Reidy RF. Effects of plasmas on porous low dielectric constant CVD SiOCH films Microelectronic Engineering. 86: 176-180. DOI: 10.1016/J.Mee.2008.10.018 |
0.348 |
|
| 2008 |
Vinogradova E, Smith CE, Mueller D, McKerrow AJ, Reidy R. Moisture Adsorption in Plasma-Damaged Porous Low-k Dielectrics Mrs Proceedings. 1079. DOI: 10.1557/Proc-1079-N02-09 |
0.347 |
|
| 2008 |
Vinogradova E, Smith CE, Mueller DW, Reidy RF. Application of deuterium exchange to analyze moisture uptake characteristics of porous low-dielectric-constant SiOCH films Electrochemical and Solid-State Letters. 11: H255-H257. DOI: 10.1149/1.2947786 |
0.369 |
|
| 2007 |
Dong H, Zhang Z, Lee M, Mueller DW, Reidy RF. Sol-gel polycondensation of methyltrimethoxysilane in ethanol studied by 29 Si NMR spectroscopy using a two-step acid/base procedure Journal of Sol-Gel Science and Technology. 41: 11-17. DOI: 10.1007/S10971-006-0115-8 |
0.693 |
|
| 2005 |
Dong H, Reidy RF, Brennan JD. Shrinkage and springback behavior of methylsilsesquioxanes prepared by an acid/base two-step processing procedure Chemistry of Materials. 17: 6012-6017. DOI: 10.1021/Cm051369W |
0.715 |
|
| 2005 |
Orozco-Teran R, Gorman B, Mueller D, Baklanov M, Reidy R. Effect of silylation on triethoxyfluorosilane xerogel films by means of atmospheric pressure drying Thin Solid Films. 471: 145-153. DOI: 10.1016/J.Tsf.2004.05.005 |
0.342 |
|
| 2004 |
Gorman BP, Orozco-Teran RA, Zhang Z, Matz PD, Mueller DW, Reidy RF. Rapid repair of plasma ash damage in low-k dielectrics using supercritical CO 2 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 22: 1210-1212. DOI: 10.1116/1.1755220 |
0.338 |
|
| 2004 |
Dong H, Gorman B, Zhang Z, Orozco-Teran R, Roepsch J, Mueller D, Kim M, Reidy R. Reinforcement mechanism for mechanically enhanced xerogel films Journal of Non-Crystalline Solids. 350: 345-350. DOI: 10.1016/J.Jnoncrysol.2004.08.231 |
0.689 |
|
| 2004 |
Zhang Z, Dong H, Gorman BP, Mueller DW, Reidy RF. Behavior of copper ions in silica xerogels Journal of Non-Crystalline Solids. 341: 157-161. DOI: 10.1016/J.Jnoncrysol.2004.04.026 |
0.677 |
|
| 2004 |
Roepsch JA, Gorman BP, Mueller DW, Reidy RF. Dielectric behavior of triethoxyfluorosilane aerogels Journal of Non-Crystalline Solids. 336: 53-58. DOI: 10.1016/J.Jnoncrysol.2003.12.043 |
0.369 |
|
| 2003 |
Gorman BP, Mueller DW, Reidy RF. Drying and Functionalization of Triethoxyfluorosilane-Based Low-k Dielectrics in CO2 Electrochemical and Solid-State Letters. 6. DOI: 10.1149/1.1615353 |
0.335 |
|
| 2003 |
Zhang Z, Gorman BP, Dong H, Orozco-Teran RA, Mueller DW, Reidy RF. Investigation of polymerization and cyclization of dimethyldiethoxysilane by 29Si NMR and FTIR Journal of Sol-Gel Science and Technology. 28: 159-165. DOI: 10.1023/A:1026098729993 |
0.69 |
|
| 2003 |
Dong H, Lee M, Thomas RD, Zhang Z, Reidy RF, Mueller DW. Methyltrimethoxysilane Sol-Gel Polymerization in Acidic Ethanol Solutions Studied by 29Si NMR Spectroscopy Journal of Sol-Gel Science and Technology. 28: 5-14. DOI: 10.1023/A:1025690300105 |
0.696 |
|
| 2002 |
Coutinho D, Orozio-Tevan RA, Reidy RF, Balkus KJ. Further studies of DAM-1 mesoporous silica preparations Microporous and Mesoporous Materials. 54: 229-248. DOI: 10.1016/S1387-1811(02)00382-7 |
0.318 |
|
| 2001 |
Gorman BP, Orozco-Teran RA, Roepsch JA, Mueller DW, Reidy RF. Low Dielectric Constant Functionalized Silica Gels Mrs Proceedings. 714. DOI: 10.1557/Proc-714-L7.17.1 |
0.444 |
|
| 2001 |
Gorman BP, Orozco-Teran RA, Roepsch JA, Dong H, Reidy RF, Mueller DW. High strength, low dielectric constant fluorinated silica xerogel films Applied Physics Letters. 79: 4010-4012. DOI: 10.1063/1.1418267 |
0.712 |
|
| 2001 |
Reidy RF, Allen AJ, Krueger S. Small angle neutron scattering characterization of colloidal and fractal aerogels Journal of Non-Crystalline Solids. 285: 181-186. DOI: 10.1016/S0022-3093(01)00451-3 |
0.314 |
|
| 2000 |
Reidy RF, Quevedo-Lopez MA, Howard RL, Orozco-Teran RA, Hernadez-Luna A, Upadhyay R, Mendoza-Gonzalez O, Dong H. The Effect of Nanostructure on the Thermal Behavior of Aerogels Advances in Cryogenic Engineering. 46: 345-352. DOI: 10.1007/978-1-4615-4293-3_44 |
0.673 |
|
| Low-probability matches (unlikely to be authored by this person) |
| 2014 |
Ballard JB, Owen JHG, Owen W, Alexander JR, Fuchs E, Randall JN, Von Ehr JR, McDonnell S, Dick DD, Wallace RM, Chabal YJ, Bischof MR, Jaeger DL, Reidy RF, Fu J, et al. Pattern transfer of hydrogen depassivation lithography patterns into silicon with atomically traceable placement and size control Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 32. DOI: 10.1116/1.4890484 |
0.299 |
|
| 2001 |
Palos A, D'Souza NA, Snively CT, Reidy RF. Modification of cement mortar with recycled ABS Cement and Concrete Research. 31: 1003-1007. DOI: 10.1016/S0008-8846(01)00531-2 |
0.296 |
|
| 2017 |
Brice D, Samimi P, Ghamarian I, Liu Y, Mendoza M, Kenney M, Reidy R, Garcia-Avila M, Collins P. On the eutectoid transformation behavior of the Ti-Zn system and its metastable phases Journal of Alloys and Compounds. 718: 22-27. DOI: 10.1016/J.Jallcom.2017.05.103 |
0.289 |
|
| 2007 |
Wang J, Cha D, Matz P, Smith C, Mueller D, Reidy R, Kim M. TEM-EELS Study on the Ash Damage and Repair of Porous Low-k Films Microscopy and Microanalysis. 13: 794-795. DOI: 10.1017/S1431927607071863 |
0.289 |
|
| 2012 |
Scappucci G, Klesse WM, Hamilton AR, Capellini G, Jaeger DL, Bischof MR, Reidy RF, Gorman BP, Simmons MY. Stacking of 2D electron gases in Ge probed at the atomic level and its correlation to low-temperature magnetotransport. Nano Letters. 12: 4953-9. PMID 22935029 DOI: 10.1021/Nl302558B |
0.274 |
|
| 2006 |
Smith C, Mueller D, Matz P, Reidy R. Topographical and chemical surface modification of porous MSQ using silylating agents with different numbers of methoxy groups Mrs Proceedings. 914. DOI: 10.1557/Proc-0914-F04-04 |
0.265 |
|
| 2004 |
Muñoz E, Coutinho D, Reidy RF, Zakhidov A, Zhou W, Balkus KJ. Synthesis of DAM-1 molecular sieves containing single walled carbon nanotubes Microporous and Mesoporous Materials. 67: 61-65. DOI: 10.1016/J.Micromeso.2003.09.024 |
0.264 |
|
| 2016 |
Brice DA, Samimi P, Ghamarian I, Liu Y, Brice RM, Reidy RF, Cotton JD, Kaufman MJ, Collins PC. Oxidation behavior and microstructural decomposition of Ti-6Al-4V and Ti-6Al-4V-1B sheet Corrosion Science. 112: 338-346. DOI: 10.1016/J.Corsci.2016.07.032 |
0.264 |
|
| 2015 |
Harris MD, Grogg WJ, Akoma A, Hayes BJ, Reidy RF, Imhoff EF, Collins PC. Revisiting (Some of) the Lasting Impacts of the Liberty Ships via a Metallurgical Analysis of Rivets from the SS “John W. Brown” Jom. 67: 2965-2975. DOI: 10.1007/S11837-015-1668-1 |
0.252 |
|
| 2005 |
Capani P, Matz P, Mueller D, Kim M, Walter E, Rhoad J, Busch E, Reidy R. Observation of Intrusion Rates of Hexamethyldisilazane During Supercritical Carbon Dioxide Functionalization of Triethoxyfluorosilane Low-k Films Mrs Proceedings. 863. DOI: 10.1557/PROC-863-B2.7 |
0.248 |
|
| 2003 |
Orozco-Teran RA, Gorman BP, Zhang Z, Mueller DW, Reidy RF. Supercritical carbon dioxide-based fluids used as a recovery tool for low-k materials Materials Research Society Symposium - Proceedings. 766: 297-302. |
0.248 |
|
| 2010 |
Gorman B, Ballard J, Romanes M, Jaeger D, Reidy R, Randall J. Mediation of Electrostatic Discharge Induced Morphological Damage in Atomically Precise Tips Microscopy and Microanalysis. 16: 480-481. DOI: 10.1017/S1431927610059878 |
0.243 |
|
| 2007 |
Quintanilla JA, Chen JT, Reidy RF, Allen AJ. Versatility and robustness of Gaussian random fields for modelling random media Modelling and Simulation in Materials Science and Engineering. 15. DOI: 10.1088/0965-0393/15/4/S02 |
0.233 |
|
| 1998 |
Plummer MC, Koehler CP, Flanders DR, Reidy RF, Ordonez CA. Cryogenic Heat Engine Experiment Advances in Cryogenic Engineering. 43: 1245-1252. DOI: 10.1007/978-1-4757-9047-4_155 |
0.23 |
|
| 2011 |
Reinhardt KA, Reidy RF, Daviot J. Low-κ/Cu Cleaning and Drying Handbook of Cleaning in Semiconductor Manufacturing: Fundamental and Applications. 355-394. DOI: 10.1002/9781118071748.ch10 |
0.23 |
|
| 2003 |
Reidy RF, Zhang Z, Orozco-Teran RA, Gorman BP, Mueller DW. Effects of supercritical CO2 drying and photoresist strip on low-k films Materials Research Society Symposium - Proceedings. 766: 303-307. |
0.213 |
|
| 2005 |
Matz PD, Reidy RF. Supercritical CO2 Applications in BEOL Cleaning Solid State Phenomena. 315-322. DOI: 10.4028/Www.Scientific.Net/Ssp.103-104.315 |
0.208 |
|
| 2000 |
Quevedo-Lopez MA, Reidy RF, Orozco-Teran RA, Mendoza-Gonzalez O, Ramirez-Bon R. Enhancement of the photochromic and thermochromic properties of molybdenum oxide thin films by a cadmium sulfide underlayer Journal of Materials Science: Materials in Electronics. 11: 151-155. DOI: 10.1023/A:1008933632515 |
0.198 |
|
| 2003 |
Quintanilla J, Reidy RF, Gorman BP, Mueller DW. Gaussian random field models of aerogels Journal of Applied Physics. 93: 4584-4589. DOI: 10.1063/1.1563038 |
0.195 |
|
| 2000 |
Quevedo-Lopez MA, Mendoza-Gonzalez O, Reidy RF, Ramirez-Bon R, Orozco-Teran RA. Effect of energetic treatments on the structure and resistivity of evaporated MoO3 films on cadmium sulfide substrates Journal of Physics and Chemistry of Solids. 61: 727-734. DOI: 10.1016/S0022-3697(99)00343-1 |
0.18 |
|
| 2008 |
Nasrazadani S, Paliwal V, Du M, Reidy RF, Stevens J, Theimer R. Lead Adsorption on Magnetite at 200°C Corrosion. 64: 509-516. DOI: 10.5006/1.3278487 |
0.144 |
|
| 2011 |
Reinhardt KA, Reidy RF, Marsella JA. Surface Phenomena: Rinsing and Drying Handbook of Cleaning in Semiconductor Manufacturing: Fundamental and Applications. 143-168. DOI: 10.1002/9781118071748.ch4 |
0.14 |
|
| 1993 |
REIDY R, SIMKOVICH G. Electrical conductivity and point defect behavior in ceria-stabilized zirconia Solid State Ionics. 62: 85-97. DOI: 10.1016/0167-2738(93)90255-2 |
0.118 |
|
| 2010 |
JONES RL, REIDY RF, MESS D. ChemInform Abstract: Vanadate Hot Corrosion Behavior of India, Yttria-Stabilized Zirconia. Cheminform. 25: no-no. DOI: 10.1002/CHIN.199403012 |
0.106 |
|
| 1993 |
Jones RL, Reidy RF, Mess D. Vanadate Hot Corrosion Behavior of India, Yttria-Stabilized Zirconia Journal of the American Ceramic Society. 76: 2660-2662. DOI: 10.1111/J.1151-2916.1993.TB03995.X |
0.1 |
|
| 2013 |
Ballard JB, Owen JHG, Fuchs E, McDonnell S, Dick D, Mordi G, Azcatl A, Seitz O, Campbell P, Veyan JF, Chabal Y, Wallace RM, Bischof M, Jaeger D, Reidy R, et al. Atomically-precise three-dimensional top down fabrication 2013 Transducers and Eurosensors Xxvii: the 17th International Conference On Solid-State Sensors, Actuators and Microsystems, Transducers and Eurosensors 2013. 764-767. DOI: 10.1109/Transducers.2013.6626878 |
0.091 |
|
| 1996 |
Jones RL, Reidy RF, Mess D. Scandia, yttria-stabilized zirconia for thermal barrier coatings Surface and Coatings Technology. 82: 70-76. DOI: 10.1016/0257-8972(95)02646-0 |
0.085 |
|
| 1993 |
Reidy RF, Simkovich G. Anomalous electrical behaviour of polymer-carbon composites as a function of temperature Journal of Materials Science. 28: 799-804. DOI: 10.1007/BF01151260 |
0.075 |
|
| 2020 |
Gu J, Wei B, Berendt AF, Ghoshal A, Walock M, Reidy RF, Berman D, Aouadi SM. A comparative study of calcium–magnesium–aluminum–silicon oxide mitigation in selected self-healing thermal barrier coating ceramics Journal of Materials Research. 35: 2311-2320. DOI: 10.1557/Jmr.2020.220 |
0.071 |
|
| 1995 |
Reidy RF, Jones RL. Thermogravimetric Analysis of the Reaction of CeO2 with the NaVO3 ‐ SO 3 System Journal of the Electrochemical Society. 142: 1353-1357. DOI: 10.1149/1.2044177 |
0.071 |
|
| 2011 |
Reinhardt KA, Reidy RF. Handbook of Cleaning in Semiconductor Manufacturing: Fundamental and Applications Handbook of Cleaning in Semiconductor Manufacturing: Fundamental and Applications. DOI: 10.1002/9781118071748 |
0.065 |
|
| 2013 |
Reidy RF. The Grave Defect of Discretion of Judgment Necessary to Establish the Invalidity of Marriage under Canon 1095, 2° The Jurist: Studies in Church Law and Ministry. 73: 339-369. DOI: 10.1353/JUR.2013.0028 |
0.065 |
|
| 1995 |
Reidy RF, Swider KE. Determination of the Cerium Oxidation State in Cerium Vanadate Journal of the American Ceramic Society. 78: 1121-1122. DOI: 10.1111/J.1151-2916.1995.TB08453.X |
0.025 |
|
| Hide low-probability matches. |