Year |
Citation |
Score |
2019 |
Li Z, Li J, Ren A, Cai R, Ding C, Qian X, Draper J, Yuan B, Tang J, Qiu Q, Wang Y. HEIF: Highly Efficient Stochastic Computing-Based Inference Framework for Deep Neural Networks Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 38: 1543-1556. DOI: 10.1109/Tcad.2018.2852752 |
0.518 |
|
2018 |
Kim J, Baek D, Ding C, Lin S, Shin D, Lin X, Wang Y, Cho YH, Park SH, Chang N. Dynamic Reconfiguration of Thermoelectric Generators for Vehicle Radiators Energy Harvesting Under Location-Dependent Temperature Variations Ieee Transactions On Very Large Scale Integration Systems. 26: 1241-1253. DOI: 10.1109/Tvlsi.2018.2812705 |
0.475 |
|
2018 |
Ding C, Li H, Zheng W, Wang Y, Lin X. Reconfigurable Photovoltaic Systems for Electric Vehicles Ieee Design & Test of Computers. 35: 37-43. DOI: 10.1109/Mdat.2018.2841344 |
0.445 |
|
2017 |
Ding C, Liu N, Wang Y, Li J, Heidari S, Hu J, Liu Y. Multisource Indoor Energy Harvesting for Nonvolatile Processors Ieee Design & Test of Computers. 34: 42-49. DOI: 10.1109/Mdat.2017.2682242 |
0.476 |
|
2017 |
Li J, Yuan Z, Li Z, Ren A, Ding C, Draper J, Nazarian S, Qiu Q, Yuan B, Wang Y. Normalization and dropout for stochastic computing-based deep convolutional neural networks Integration. 65: 395-403. DOI: 10.1016/J.Vlsi.2017.11.002 |
0.508 |
|
Low-probability matches (unlikely to be authored by this person) |
2022 |
Sainju R, Chen WY, Schaefer S, Yang Q, Ding C, Li M, Zhu Y. DefectTrack: a deep learning-based multi-object tracking algorithm for quantitative defect analysis of in-situ TEM videos in real-time. Scientific Reports. 12: 15705. PMID 36127375 DOI: 10.1038/s41598-022-19697-1 |
0.146 |
|
2021 |
Chen X, Johnson E, Kulkarni A, Ding C, Ranelli N, Chen Y, Xu R. An Exploratory Approach to Deriving Nutrition Information of Restaurant Food from Crowdsourced Food Images: Case of Hartford. Nutrients. 13. PMID 34836387 DOI: 10.3390/nu13114132 |
0.059 |
|
2023 |
Sainju R, Roberts G, Chen WY, Hutchinson B, Yang Q, Ding C, Edwards DJ, Li M, Zhu Y. Deep Learning for Automated Quantification of Irradiation Defects in TEM Data: Relating Pixel-level Errors to Defect Properties. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 29: 1559-1560. PMID 37613789 DOI: 10.1093/micmic/ozad067.802 |
0.057 |
|
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