Kevin J. Yang, Ph.D. - Publications
Affiliations: | 2002 | University of California, Berkeley, Berkeley, CA, United States |
Area:
Semiconductor Device TechnologiesYear | Citation | Score | |||
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2002 | Yang KJ, Takeuchi H, King T, Hu C. Frequency Dependence of Capacitance Measurement for Advanced Gate Dielectrics The Japan Society of Applied Physics. DOI: 10.7567/Ssdm.2002.P4-7 | 0.447 | |||
2002 | Chang L, Yang KJ, Yeo YC, Polishchuk I, King TJ, Hu C. Direct-tunneling gate leakage current in double-gate and ultrathin body MOSFETs Ieee Transactions On Electron Devices. 49: 2288-2294. DOI: 10.1109/Ted.2002.807446 | 0.601 | |||
2001 | Lu Q, Yeo YC, Yang KJ, Lin R, Polishchuk I, King TJ, Hu C, Song SC, Luan HF, Kwong DL, Guo X, Luo Z, Wang X, Tso-Ping M. Two silicon nitride technologies for post-SiO2 MOSFET gate dielectric Ieee Electron Device Letters. 22: 324-326. DOI: 10.1109/55.930679 | 0.607 | |||
2001 | Yeo YC, Lu Q, Ranade P, Takeuchi H, Yang KJ, Polishchuk I, King TJ, Hu C, Song SC, Luan HF, Kwong DL. Dual-metal gate CMOS technology with ultrathin silicon nitride gate dielectric Ieee Electron Device Letters. 22: 227-229. DOI: 10.1109/55.919237 | 0.609 | |||
1999 | Register LF, Rosenbaum E, Yang K. Analytic model for direct tunneling current in polycrystalline silicon-gate metal–oxide–semiconductor devices Applied Physics Letters. 74: 457-459. DOI: 10.1063/1.123060 | 0.546 | |||
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