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Zhanglei Wang, Ph.D. - Publications

Affiliations: 
2007 Duke University, Durham, NC 
Area:
Electronics and Electrical Engineering
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9 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2012 Zhang Z, Wang Z, Gu X, Chakrabarty K. Physical-Defect Modeling and Optimization for Fault-Insertion Test Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 20: 723-736. DOI: 10.1109/Tvlsi.2011.2114681  0.62
2010 Wang S, Wei W, Wang Z. A Low Overhead High Test Compression Technique Using Pattern Clustering With $n$-Detection Test Support Ieee Transactions On Very Large Scale Integration Systems. 18: 1672-1685. DOI: 10.1109/Tvlsi.2009.2026420  0.579
2009 Wang Z, Chakrabarty K, Wang S. Integrated LFSR Reseeding, Test-Access Optimization, and Test Scheduling for Core-Based System-on-Chip Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 28: 1251-1264. DOI: 10.1109/Tcad.2009.2021731  0.595
2009 Wang Z, Fang H, Chakrabarty K, Bienek M. Deviation-Based LFSR Reseeding for Test-Data Compression Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 28: 259-271. DOI: 10.1109/Tcad.2008.2009166  0.639
2008 Wang Z, Chakrabarty K. Test Data Compression Using Selective Encoding of Scan Slices Ieee Transactions On Very Large Scale Integration Systems. 16: 1429-1440. DOI: 10.1109/Tvlsi.2008.2000674  0.633
2008 Wang Z, Chakrabarty K. Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 27: 352-365. DOI: 10.1109/Tcad.2007.907228  0.729
2008 Badereddine N, Wang Z, Girard P, Chakrabarty K, Virazel A, Pravossoudovitch S, Landrault C. A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction Journal of Electronic Testing. 24: 353-364. DOI: 10.1007/S10836-007-5053-Z  0.571
2007 Li L, Wang Z, Chakrabarty K. Scan-BIST based on cluster analysis and the encoding of repeating sequences Acm Transactions On Design Automation of Electronic Systems. 12: 1-21. DOI: 10.1145/1188275.1188279  0.608
2007 Wang Z, Chakrabarty K. Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics Journal of Electronic Testing. 23: 145-161. DOI: 10.1007/S10836-006-0550-Z  0.669
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