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Zhaobo Zhang, Ph.D. - Publications

Affiliations: 
2011 Electrical and Computer Engineering Duke University, Durham, NC 
Area:
Electronics and Electrical Engineering
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15 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2020 Pan R, Zhang Z, Li X, Chakrabarty K, Gu X. Black-Box Test-Cost Reduction Based on Bayesian Network Models Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 1-1. DOI: 10.1109/Tcad.2020.2994257  0.444
2020 Jin S, Zhang Z, Chakrabarty K, Gu X. Self-Learning and Efficient Health-Status Analysis for a Core Router System Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 39: 1935-1948. DOI: 10.1109/Tcad.2019.2926506  0.518
2020 Jin S, Zhang Z, Chakrabarty K, Gu X. Hierarchical Symbol-Based Health-Status Analysis Using Time-Series Data in a Core Router System Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 39: 700-713. DOI: 10.1109/Tcad.2018.2890681  0.5
2019 Jin S, Zhang Z, Chakrabarty K, Gu X. Changepoint-Based Anomaly Detection for Prognostic Diagnosis in a Core Router System Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 38: 1331-1344. DOI: 10.1109/Tcad.2018.2846641  0.533
2019 Jin S, Zhang Z, Chakrabarty K, Gu X. Anomaly Detection and Health-Status Analysis in a Core Router System Ieee Design & Test. 36: 7-17. DOI: 10.1109/Mdat.2019.2906108  0.527
2018 Jin S, Zhang Z, Chakrabarty K, Gu X. Toward Predictive Fault Tolerance in a Core-Router System: Anomaly Detection Using Correlation-Based Time-Series Analysis Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 37: 2111-2124. DOI: 10.1109/Tcad.2017.2775240  0.631
2016 Jin S, Ye F, Zhang Z, Chakrabarty K, Gu X. Efficient Board-Level Functional Fault Diagnosis With Missing Syndromes Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 35: 985-998. DOI: 10.1109/Tcad.2015.2481859  0.638
2016 Ye F, Zhang Z, Chakrabarty K, Gu X. Adaptive Board-Level Functional Fault Diagnosis Using Incremental Decision Trees Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 35: 323-336. DOI: 10.1109/Tcad.2015.2459046  0.609
2015 Ye F, Zhang Z, Chakrabarty K, Gu X. Information-theoretic syndrome evaluation, statistical root-cause analysis, and correlation-based feature selection for guiding board-level fault diagnosis Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 34: 1014-1026. DOI: 10.1109/Tcad.2015.2399438  0.646
2014 Zhang Z, Kavousianos X, Chakrabarty K, Tsiatouhas Y. Static power reduction using variation-tolerant and reconfigurable multi-mode power switches Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 22: 13-26. DOI: 10.1109/Tvlsi.2012.2233505  0.458
2014 Wang R, Zhang Z, Kavousianos X, Tsiatouhas Y, Chakrabarty K. Built-in self-test, diagnosis, and repair of multimode power switches Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 33: 1231-1244. DOI: 10.1109/Tcad.2014.2314303  0.524
2014 Ye F, Zhang Z, Chakrabarty K, Gu X. Board-level functional fault diagnosis using multikernel support vector machines and incremental learning Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 33: 279-290. DOI: 10.1109/Tcad.2013.2287184  0.639
2014 Ye F, Chakrabarty K, Zhang Z, Gu X. Information-theoretic framework for evaluating and guiding board-level functional-fault diagnosis Ieee Design and Test. 31: 65-75. DOI: 10.1109/Mdat.2014.2313080  0.624
2013 Ye F, Zhang Z, Chakrabarty K, Gu X. Board-level functional fault diagnosis using artificial neural networks, support-vector machines, and weighted-majority voting Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 32: 723-736. DOI: 10.1109/Tcad.2012.2234827  0.641
2012 Zhang Z, Wang Z, Gu X, Chakrabarty K. Physical-Defect Modeling and Optimization for Fault-Insertion Test Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 20: 723-736. DOI: 10.1109/Tvlsi.2011.2114681  0.601
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