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Richard F. Reidy - Publications

Affiliations: 
University of North Texas, Denton, TX, United States 
Area:
Materials Science Engineering
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25 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2018 Barclay JD, Okobiah O, Deng L, Sengphanlaya T, Du J, Reidy RF. High temperature water as a clean and etch of low-k and SiO2 films Microelectronic Engineering. 196: 54-58. DOI: 10.1016/J.Mee.2018.04.016  0.358
2015 Ballard JB, Dick DD, McDonnell SJ, Bischof M, Fu J, Owen JH, Owen WR, Alexander JD, Jaeger DL, Namboodiri P, Fuchs E, Chabal YJ, Wallace RM, Reidy R, Silver RM, et al. Atomically Traceable Nanostructure Fabrication. Journal of Visualized Experiments : Jove. PMID 26274555 DOI: 10.3791/52900  0.325
2014 Sondhi A, Okobiah O, Chattopadhyay S, Shibata T, Scharf TW, Reidy RF. X-ray absorption spectroscopy studies on the carbothermal reduction reaction products of 3 mol% yttria-stabilized zirconia Journal of Applied Crystallography. 47: 1512-1519. DOI: 10.1107/S1600576714014642  0.31
2014 Smith TS, Lynch KM, Cooper CM, Okobiah O, Osei-Yiadom E, Bischof M, Kouloumpis A, Baikousi M, Dimos K, Reidy RF. Wetting behavior of plasma treated low-k films in dHF cleans solutions Microelectronic Engineering. 128: 79-84. DOI: 10.1016/J.Mee.2014.05.006  0.339
2013 Polley CM, Clarke WR, Miwa JA, Scappucci G, Wells JW, Jaeger DL, Bischof MR, Reidy RF, Gorman BP, Simmons M. Exploring the limits of N-type ultra-shallow junction formation. Acs Nano. 7: 5499-505. PMID 23721101 DOI: 10.1021/Nn4016407  0.311
2013 Sondhi A, Morandi C, Reidy RF, Scharf TW. Theoretical and Experimental Investigations on the Mechanism of Carbothermal Reduction of Zirconia (Preprint) Ceramics International. 39: 4489-4497. DOI: 10.1016/J.Ceramint.2012.11.043  0.319
2012 Schmucker SW, Kumar N, Abelson JR, Daly SR, Girolami GS, Bischof MR, Jaeger DL, Reidy RF, Gorman BP, Alexander J, Ballard JB, Randall JN, Lyding JW. Field-directed sputter sharpening for tailored probe materials and atomic-scale lithography. Nature Communications. 3: 935. PMID 22760634 DOI: 10.1038/Ncomms1907  0.314
2009 Vinogradova E, Osei-Yiadom E, Smith CE, Mueller DW, Reidy RF. Effects of plasmas on porous low dielectric constant CVD SiOCH films Microelectronic Engineering. 86: 176-180. DOI: 10.1016/J.Mee.2008.10.018  0.348
2008 Vinogradova E, Smith CE, Mueller D, McKerrow AJ, Reidy R. Moisture Adsorption in Plasma-Damaged Porous Low-k Dielectrics Mrs Proceedings. 1079. DOI: 10.1557/Proc-1079-N02-09  0.347
2008 Vinogradova E, Smith CE, Mueller DW, Reidy RF. Application of deuterium exchange to analyze moisture uptake characteristics of porous low-dielectric-constant SiOCH films Electrochemical and Solid-State Letters. 11: H255-H257. DOI: 10.1149/1.2947786  0.369
2007 Dong H, Zhang Z, Lee M, Mueller DW, Reidy RF. Sol-gel polycondensation of methyltrimethoxysilane in ethanol studied by 29 Si NMR spectroscopy using a two-step acid/base procedure Journal of Sol-Gel Science and Technology. 41: 11-17. DOI: 10.1007/S10971-006-0115-8  0.693
2005 Dong H, Reidy RF, Brennan JD. Shrinkage and springback behavior of methylsilsesquioxanes prepared by an acid/base two-step processing procedure Chemistry of Materials. 17: 6012-6017. DOI: 10.1021/Cm051369W  0.715
2005 Orozco-Teran R, Gorman B, Mueller D, Baklanov M, Reidy R. Effect of silylation on triethoxyfluorosilane xerogel films by means of atmospheric pressure drying Thin Solid Films. 471: 145-153. DOI: 10.1016/J.Tsf.2004.05.005  0.342
2004 Gorman BP, Orozco-Teran RA, Zhang Z, Matz PD, Mueller DW, Reidy RF. Rapid repair of plasma ash damage in low-k dielectrics using supercritical CO 2 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 22: 1210-1212. DOI: 10.1116/1.1755220  0.338
2004 Dong H, Gorman B, Zhang Z, Orozco-Teran R, Roepsch J, Mueller D, Kim M, Reidy R. Reinforcement mechanism for mechanically enhanced xerogel films Journal of Non-Crystalline Solids. 350: 345-350. DOI: 10.1016/J.Jnoncrysol.2004.08.231  0.689
2004 Zhang Z, Dong H, Gorman BP, Mueller DW, Reidy RF. Behavior of copper ions in silica xerogels Journal of Non-Crystalline Solids. 341: 157-161. DOI: 10.1016/J.Jnoncrysol.2004.04.026  0.677
2004 Roepsch JA, Gorman BP, Mueller DW, Reidy RF. Dielectric behavior of triethoxyfluorosilane aerogels Journal of Non-Crystalline Solids. 336: 53-58. DOI: 10.1016/J.Jnoncrysol.2003.12.043  0.369
2003 Gorman BP, Mueller DW, Reidy RF. Drying and Functionalization of Triethoxyfluorosilane-Based Low-k Dielectrics in CO2 Electrochemical and Solid-State Letters. 6. DOI: 10.1149/1.1615353  0.335
2003 Zhang Z, Gorman BP, Dong H, Orozco-Teran RA, Mueller DW, Reidy RF. Investigation of polymerization and cyclization of dimethyldiethoxysilane by 29Si NMR and FTIR Journal of Sol-Gel Science and Technology. 28: 159-165. DOI: 10.1023/A:1026098729993  0.69
2003 Dong H, Lee M, Thomas RD, Zhang Z, Reidy RF, Mueller DW. Methyltrimethoxysilane Sol-Gel Polymerization in Acidic Ethanol Solutions Studied by 29Si NMR Spectroscopy Journal of Sol-Gel Science and Technology. 28: 5-14. DOI: 10.1023/A:1025690300105  0.696
2002 Coutinho D, Orozio-Tevan RA, Reidy RF, Balkus KJ. Further studies of DAM-1 mesoporous silica preparations Microporous and Mesoporous Materials. 54: 229-248. DOI: 10.1016/S1387-1811(02)00382-7  0.318
2001 Gorman BP, Orozco-Teran RA, Roepsch JA, Mueller DW, Reidy RF. Low Dielectric Constant Functionalized Silica Gels Mrs Proceedings. 714. DOI: 10.1557/Proc-714-L7.17.1  0.444
2001 Gorman BP, Orozco-Teran RA, Roepsch JA, Dong H, Reidy RF, Mueller DW. High strength, low dielectric constant fluorinated silica xerogel films Applied Physics Letters. 79: 4010-4012. DOI: 10.1063/1.1418267  0.712
2001 Reidy RF, Allen AJ, Krueger S. Small angle neutron scattering characterization of colloidal and fractal aerogels Journal of Non-Crystalline Solids. 285: 181-186. DOI: 10.1016/S0022-3093(01)00451-3  0.314
2000 Reidy RF, Quevedo-Lopez MA, Howard RL, Orozco-Teran RA, Hernadez-Luna A, Upadhyay R, Mendoza-Gonzalez O, Dong H. The Effect of Nanostructure on the Thermal Behavior of Aerogels Advances in Cryogenic Engineering. 46: 345-352. DOI: 10.1007/978-1-4615-4293-3_44  0.673
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