Zhichao Lu, Ph.D. - Publications

Affiliations: 
2010 University of Florida, Gainesville, Gainesville, FL, United States 
Area:
Electronics and Electrical Engineering

8 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2012 Wu Q, Chen J, Lu Z, Zhou Z, Luo J, Chai Z, Yu T, Qiu C, Li L, Pang A, Wang X, Fossum JG. Experimental Demonstration of the High-Performance Floating-Body/Gate DRAM Cell for Embedded Memories Ieee Electron Device Letters. 33: 743-745. DOI: 10.1109/Led.2012.2190031  0.753
2011 Lu Z, Fossum JG, Zhou Z. A Floating-Body/Gate DRAM Cell Upgraded for Long Retention Time Ieee Electron Device Letters. 32: 731-733. DOI: 10.1109/Led.2011.2134065  0.755
2010 Aoulaiche M, Collaert N, Degraeve R, Lu Z, Wachter BD, Groeseneken G, Jurczak M, Altimime L. BJT-Mode Endurance on a 1T-RAM Bulk FinFET Device Ieee Electron Device Letters. 31: 1380-1382. DOI: 10.1109/Led.2010.2079313  0.371
2009 Zhou Z, Fossum JG, Lu Z. Physical Insights on BJT-Based 1T DRAM Cells Ieee Electron Device Letters. 30: 565-567. DOI: 10.1109/Led.2009.2017285  0.744
2009 Lu Z, Fossum JG, Yang J, Harris HR, Trivedi VP, Chu M, Thompson SE. A Simplified Superior Floating-Body/Gate DRAM Cell Ieee Electron Device Letters. 30: 282-284. DOI: 10.1109/Led.2008.2012006  0.691
2008 Lu Z, Fossum JG, Zhang W, Trivedi VP, Mathew L, Sadd M. A Novel Two-Transistor Floating-Body/Gate Cell for Low-Power Nanoscale Embedded DRAM Ieee Transactions On Electron Devices. 55: 1511-1518. DOI: 10.1109/Ted.2008.922796  0.752
2007 Fossum JG, Lu Z, Trivedi VP. New Insights on “Capacitorless” Floating-Body DRAM Cells Ieee Electron Device Letters. 28: 513-516. DOI: 10.1109/Led.2007.896883  0.746
2007 Lu Z, Fossum JG. Short-Channel Effects in Independent-Gate FinFETs Ieee Electron Device Letters. 28: 145-147. DOI: 10.1109/Led.2006.889236  0.619
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